Testing 10 Gb/s SONET/SDH equipment and components

Transcription

1 Testing 10 Gb/s SONET/SDH equipment and components 71612C 12.5 Gb/s error performance anayzer Product Note

2 Contents Introduction... 3 The seria BERT in the synchronous era... 3 Typica appications... 4 Creation and rea-time editing of custom patterns... 5 Pattern stores... 6 Setting and editing an STS-192 SONET-compatibe pattern... 7 Testing 10 Gb/s SONET/SDH equipment and components Pseudo-dynamic testing with aternating patterns SONET/SDH system test with user-programmabe patterns Error ocation anaysis

3 Introduction This document describes key features of the 71612C 12.5 Gb/s error performance anayzer that are particuary beneficia in the deveopment and production testing of components and sub-systems for SONET/SDH transmission equipment. The creation and rea-time editing of custom patterns up to 8 Mbits in ength using the 71612C anayzer s pattern editor are described. The exampes shown are SONET patterns, however the techniques and measurements described are equay appicabe to SDH systems. Potentia appications for the 71612C anayzer in SONET/SDH component and system test are identified. An error ocation anaysis option is avaiabe on the 71612C anayzer; this document shows how this may be used to measure the bit error ratio (BER) of a seected bock of bits and any specific bit in the pattern being generated. Then, it describes how the 71612C anayzer can assist in the identification of systematic errors by indicating the position of each errored bit in turn and automaticay measuring the BER of each errored bit. A demonstration disk, suppied with the 71612C anayzer, contains some of the patterns described in this document together with other usefu patterns. The seria BERT in the synchronous era Athough teecommunications has moved into the SONET/SDH era with its ayered or structured signa architecture, the bit error ratio test set (BERT) consisting of a seria pattern generator and error anayzer remains an essentia too in the R&D of communication systems, high-speed integrated circuits (ICs) and photonic components. A fundamenta reason for this is the requirement to compare the theoretica and reative performance of systems and components using a pseudo-random binary sequence (PRBS). The PRBS is a suitabe repetitive test signa that resembes a random signa, occurs in a mathematicay predictabe sequence and is easiy generated by a shift register. This aows comparison of bits transmitted from the BERT pattern generator with those received by the error anayzer at the output of the device under test. In addition to a range of industry standard PRBS patterns up to bits in ength, the 71612C anayzer has over 8 Mbits (2 23 ) of user-programmabe pattern memory that aow the creation of compex custom test patterns for testing SONET/SDH systems and components. A pattern containing up to six identica or different STS-192/STM-64 frames may be constructed, thus aowing functiona (pseudo-dynamic) and aarm testing to be carried out. The user-programmabe memory aso aows framed and unframed patterns to be constructed that stress timing recovery circuits, ightwave transmitters and receivers or, for exampe, induce baseine wander for margin testing. 3

4 Typica appications Athough the emphasis of this document is on the construction of compex custom patterns compatibe with SONET/SDH operationa equipment, the ist beow shows some of the tests routiney carried out on the constituent components of such equipment. Pattern dependency testing (eg, ITU-T CID test). Mean aunch power (PRBS). Eye diagram and mask anaysis (PRBS). Receiver sensitivity, eye contour measurements (PRBS). Dynamic baseine wander testing (aternate programmabe word). Cock recovery circuit stress test (PRBS, variabe mark and transition density). Regenerator test (PRBS). IC tests (PRBS and word). SONET/SDH signas contain regions within the data stream where the possibiity of bit errors occurring is greater because of the sequence of data in these regions. This may be caused by eye cosure resuting from dc wander; ac couping causing the mean eve of the signa within the equipment to vary with pattern density; or faiure of the timing recovery circuit to bridge regions of data that contain itte timing information in the form of transitions. The ITU-T have defined a test pattern to verify the adequacy of timing recovery and ow frequency performance of STM-n equipment. This consists of a userprogrammabe pattern comprising consecutive bocks of data as foows: The first row of section overhead bytes for the STM-n system under test, a ones (zero timing content, high average signa ampitude), pseudo-random data with 50% mark-density ratio, and then a repeat of the overhead bytes, a zeros (zero timing content, ow average signa ampitude) and the PRBS. For fu detais see ITU-T Recommendation G.958. The pattern is referred to as a consecutive identica digit (CID) test pattern and is simpy constructed with the 71612C anayzer s pattern editor. Aternating ong patterns that induce a known amount of baseine wander for noise margin testing of decision circuits and regenerators may aso be programmed and generated with the 71612C anayzer. In the aternate pattern mode of operation it is possibe to switch synchronousy between two different programmabe patterns each of which may be up to 4 Mbits in ength. Many SONET/SDH sub-systems and components are tested with PRBS patterns, however, to fuy test a cock recovery IC requires the construction of variabe transition ratio patterns with strong sub-harmonic content (for exampe, a repeating pattern has a 25% transition density). 4

5 Creation and rea-time editing of custom patterns Editor User pattern memory Save Pattern 1 Pattern 2 Pattern 3 Pattern 4 (RAM) Output Pattern stores Pattern 5 Pattern 6 Pattern 7 Pattern 8 Disk Patterns Pattern 9 Pattern 10 Pattern 11 Pattern 12 Load Figure C anayzer s pattern editor Figure 1 shows the reationship between the three main functiona bocks of the pattern editor: the editor, pattern stores and user pattern memory from which the instrument outputs a user pattern. The editor aways edits the contents of the user pattern memory. To edit one of the tweve patterns from the pattern stores, the contents of the pattern store must first be oaded into the user pattern memory. It may then be edited and re-saved back to the pattern store. The pattern editor supports the foowing operations: The contents of one of tweve pattern stores can be oaded into pattern memory, edited, saved and transmitted. Loading and editing of mutipe copies of one of four fixed PRBSbased patterns in standard, zero substitution, or variabe mark density options (2 7, 2 10, 2 11 and 2 13 ). Copying of mutipe copies of a pattern from one pattern store into a pattern at a precise point in the user pattern memory. Edit and dispay patterns in hexadecima or binary notation. Saving of a marked bock of bits within the user pattern memory to an interna or disk pattern store; the deetion of a marked bock of bits. 5

6 Pattern stores Figure 2. Contents of pattern stores There are tweve pattern stores as foows: Pattern stores 1 to 4 can hod patterns up to 8 kbits in size (nonvoatie RAM). Pattern stores 5 to 12 are hed on the MS-DOS compatibe foppy disk and can accommodate patterns of up to 8 Mbits in ength in separate fies on the disk. The pattern currenty stored in user pattern memory is accessed with the <CURRENT PATTERN> softkey. This is the pattern that is generated when the user seects a user pattern as the active output pattern. When a user wishes to seect a pattern store, a dispay simiar to that shown in figure 2 is shown on the screen. The information shown for patterns 5 to 12 detais the patterns stored on the currenty accessibe disk which in the exampe shown incudes patterns described in the next section. Any one of the tweve user patterns may be recaed and edited either whie a pattern other than a user pattern is being output, or when the pattern to be edited is the active pattern currenty being output. In the atter case, rea-time editing is possibe. 6

7 Setting up and editing an STS-192 SONET-compatibe pattern The user creates a pattern by editing the contents of one of the pattern stores. As an exampe et us construct a 1,244,160 bit pattern for STS-192 appications with vaid A1, A2 framing bytes, C1 bytes, and B1 and B2 section and ine error monitoring bytes. The B1 and B2 bytes provide error monitoring by means of a bit-intereaved parity 8 code (BIP-8). It is convenient to create this pattern on a bank high capacity disk that has been formatted in the 71612C anayzer s disk drive. Figure PRBS in pattern store 5 The payoad in the STS-192 frame wi consist of the recommended scrambing sequence that starts with the sequence. To oad mutipe copies of this pattern into the STS-192 frame, the sequence must be stored in one of the pattern stores. The architecture of the pattern generator memory determines the ength of the PRBS-based patterns that can be oaded into a user pattern by means of the <LOAD BLOCK> feature. This incudes a 2 7 pattern but not the required pattern. This is ony a minor inconvenience; we seect (for exampe) disk pattern store 5 for editing, set the pattern ength to 128 and <LOAD BLOCK> of 2 7. The pattern on screen wi be FE02 0C28 F22C EA7D 0E24DADE C A (figure 3). 7

8 Figure PRBS in pattern store 6 We change to binary dispay, deete bit 8, and set the pattern ength to 127 bits. The sequence on screen is the correct SONET scrambing sequence FE E459 D4FA 1C49 B5BD 8D2E E654. We save this to (for exampe) pattern store 6 for future use (figure 4). Figure 5. STS-192 header (A1, A2 and C1 bytes) We now set the pattern ength to 4608 to programme three of the section overhead bytes for each STS-1 in the STS-192 frame. We go to bit 0, enter (A1 byte), and save this byte with the <SAVE BLOCK> function to one of the interna pattern stores. We move the cursor back to bit 0 and use the <LOAD BLOCK> function to oad 192 copies of the A1 byte into the pattern being edited. We then perform a simiar exercise to oad 192 copies of the A2 byte ( ) from bit number This competes the entry of the framing bytes for STS-192. The 192 C1 bytes are entered in hexadecima starting with 01 and finishing with C0. 8

9 Figure 5 shows part of the A1 framing bytes (F6), the A2 framing bytes (28), and the start of the incrementing C1 bytes. The C1 byte is set to a binary number corresponding to its order of appearance in the byte-intereaved STS-n frame; it is provides in a STS-1s within a STS-n frame and the first STS-1 is aocated the number 1 ( ) before scrambing. Figure 6. STS-192 basic framed pattern To compete the construction of the pattern, the ength is changed to 1,244,160 bits and the cursor is set to bit The <LOAD BLOCK> feature is used to copy 9761 repetitions of the PRBS from pattern store 6. This is equivaent to scrambing the a zeros pattern with the SONET scrambing PRBS. The pattern is saved to disk in, for exampe, pattern store 8 and is shown in figure 6 with the cursor at the start of the scrambing sequence at bit This usefu pattern may be edited and used to test SONET/SDH faiure states and to simuate maintenance signas etc. To ensure compatibiity with operationa equipment there shoud be no parity errors detected by the termina or equipment under test. SONET/ SDH performance monitoring at each eve in the hierarchy is based on bit-intereaved-parity (BIP) checks cacuated on a frame-by-frame basis. For exampe, the B1 byte provides section error monitoring, and in a STS-n the section BIP-8 is cacuated over a bytes of the previous STS-n frame after scrambing and the computed vaue is paced in the B1 byte of STS-1 number 1 before scrambing. 9

10 This pattern may be simpy edited to run error free with SONET/SDH systems and subsystems as foows: Leave the B1 and B2 bytes in the frame a zeros before scrambing. Compute the BIP-8 parity checksum for a the bytes in the frame. Choose a convenient byte in the frame, for exampe byte number which corresponds to the E1 byte of STS-1 number 2. EXOR the checksum byte with the current vaue in the chosen byte (17282). Overwrite the resut of the EXOR cacuation into the chosen byte by seecting the pattern editor <REPLACE> mode. The parity checksum shoud now be zero, and as this corresponds to the B1 byte vaue, the pattern wi run with no parity errors on STS-192 equipment. Note that the B2 byte remains zero because the H pointer bytes, the rest of the ine overhead and the payoad of the STS-1s are a zero before scrambing. Figure 7. STS-192 frame with no parity errors Figure 7 shows part of the STS-192 pattern described above with the cursor highighting byte (bit 138,248) which has been overwritten with hexadecima

11 Testing 10 Gb/s SONET/SDH equipment and components Pseudo-dynamic testing with aternating patterns The 71612C anayzer can switch error free (hitessy or synchronousy) between two different user-programmabe ong patterns; these may be up to 4 Mbits ong, but must be of identica ength. Pattern seection is under the contro of a front pane key, HP-IB or the auxiiary input port; changeover is synchronous with the end of a word. The ength of the aternating patterns shoud be a mutipe of 256 bits. The instrument wi output one of two patterns (A or B) at the end of either pattern. The auxiiary input contros which pattern is output in one of two modes: Oneshot a rising edge on the auxiiary input inserts a singe version of pattern B into repetitions of pattern A. Aternate the ogic state of the signa at the auxiiary input determines which pattern is output. A ogic 0 wi output pattern A. Note: The error detector is not affected by the pattern switching and is set to pattern A when aternate pattern is seected. In aternate pattern mode, a pattern trigger puse output is provided; this occurs at bit 0 of the seected pattern. The aternate pattern feature offers great potentia for pseudodynamic testing of framing agorithms, faiure states and aarms. SONET/SDH systems test with user-programmabe patterns The framed pattern with no parity errors is suitabe for jitter toerance testing (with a suitabe cock source) when the buit-in parity error aarm of the LTE/STE is used to fag the onset of errors. The pattern has many additiona uses as a basic framed STS-192 pattern. Rea-time editing of this pattern may be used to confirm the operation of equipment parity error aarms. The aternate pattern mode of pattern generation faciitates the construction of patterns that test faiure states and agorithms. Jitter testing with framed zero parity error pattern Faiure states and maintenance signas parity errors oss of signa (LOS) framing agorithm (LOF)(OOF) aarm indicator signas (AIS) oss of pointer (LOP) Bock BER measurement overhead bytes BER payoad BER 11

12 Loss of signa (LOS) aarm may be tested by increasing the run of zeros in one pattern unti the LOS state is entered; this shoud correspond to 100 ms or more of zeros (> 1,045,095 bits at STS-192). The LOS state shoud be exited after two vaid frames are received. The LOS agorithm may be examined by aternating between a vaid pattern and the pattern containing the run of zeros. In SONET systems the out of frame (OOF) state is entered when four consecutive frames are received with errored framing patterns, and exited after two vaid frames are received. The equipment oss of frame (LOF) signa is required to be activated by an STS-192 signa that is in the OOF state for 24 frames or more. The LOF aarm shoud therefore be activated after 28 or more consecutive frames have been received with errored framing patterns, and the equipment shoud frame-up after two vaid frames are received. The operation of the aarms may be tested by using aternating patterns containing errored and vaid framing bytes. A singe pattern to stress test the frame aignment system may aso be constructed consisting of five STS-192 frames; two vaid frames foowed by three errored frames. The equipment shoud not enter an out-of-frame state when receiving this pattern. The oss of pointer (LOP) faiure state may be tested by switching between a framed pattern containing vaid pointer bytes and one containing non-vaid pointer bytes. In SONET systems, major aarm conditions such as LOS, LOP, LOF cause the aarm indication signa (AIS) to be transmitted downstream. This signa may be simuated with a pattern consisting of vaid section overhead bytes and a scrambed a ones pattern in the rest of the frame. This may be simpy constructed on a PC, saved on a foppy disk and downoaded into the 71612C anayzer. The faiure state agorithms may be fuy tested by seecting the patterns generated in aternate pattern mode by means of an externa controer connected to the generator auxiiary input. The controer aso counts the puses received from the pattern generator trigger output. In this way it is possibe to contro the number of repetitions of each of the aternate patterns, and hence to seect the number of frames transmitted. For exampe, this woud aow the LOF faiure mode to be fuy tested with a sequence of 28 or more errored frames foowed by the required number (8 to 24) of repetitions of vaid framing patterns. 12

13 Error ocation anaysis In the past, bit error ratio test sets performed quantitative BER measurements that simpy informed the user that his device under test had a certain error ratio. The resuts gave no indication of the possibe cause of the errors. The next step was the introduction of simpe diagnostics such as errored and error free interva measurement. In recent years the faciity to independenty measure the BER of errored ones and zeros has been added. This suite of features provided the user with some indication of the cause of errors. The 71612C anayzer now introduces the next generation of error diagnostics, error ocation anaysis (ELA). ELA heps the user to identify systematic errors. Error ocation anaysis functions ony with RAM-based patterns. These incude user-programmabe patterns, and the PRBS-based patterns such as variabe mark density and zero substitution that are generated from RAM in the 71612C anayzer. Error ocation anaysis consists of a suite of three measurements: Bit BER aows a user to specify any bit in a pattern and to perform BER measurements on that bit aone. Bock BER aows BER measurements to be performed on a seected range of bits within a user-defined pattern. The range of bits must be a mutipe of 32 with the bock specified by a start ocation and bock ength. This feature is essentia when trying to ocate the cause of systematic errors which can affect a section of bits in a pattern for exampe pattern-dependent errors in the section overhead bytes of an STS-192 frame. Error ocation capture aows the user to capture the actua position of errored bits in a user-defined pattern. After initiation of the measurement, the error detector ocates the first (or next) errored bit in the pattern, dispays the errored bit, and the sequence of bits either side of the errored bit. The error detector automaticay measures the BER of the errored bit. If this BER remains significant over a period of time, it indicates the presence of a systematic or pattern-dependent error. This feature heps the user to differentiate between random and systematic errors, thus heping to identify the source of errors. 13

14 Figure 8 shows a bock BER measurement being performed on the first 4608 bits of a 1,244,160 bits STS-192 pattern (bock start address = 0, bock ength = 4608) The bock error ratio is 7.056e -5. The bock seected from the STS-192 pattern consists of the A1, A2 and C1 bytes from the section overhead. Figure 8. Exampe of STS-192 bock BER measurement Figure 9 shows the capture of bit 3,322 from a pattern of 1,244,160 bits. The 28 bits preceding the errored bit are dispayed in the data window. The bit BER is 8.348e -7. The pattern trigger output on the 71612C anayzer may be used to trigger an oscioscope to automaticay dispay the errored bits and adjacent parts of the pattern as they are captured. Figure 9. Exampe of error capture and bit BER 14

15 71612C 12.5 Gb/s error performance anayzer Use the 71612C anayzer to measure bit error ratio (BER) and to verify thoroughy the performance and quaity of your components and system hardware. For more information on the 71612C 12.5 Gb/s error performance anayzer, contact your oca Agient saes office Reated iterature Reach tomorrow s marked today accuratey characterize your Gbit components fast Brochure EN Frequency agie jitter Appication Note EN measurement system (AN-1267) Locating errors in Gigabit Product Note EN transmission systems and components Agient Technoogies manufactures the 71612C error performance anayzer under a quaity system approved to the internationa standard ISO 9001 pus TickIT (BSI Registration Certificate No FM 10987). 15

16 Agient Technoogies Test and Measurement Support, Services, and Assistance Agient Technoogies aims to maximize the vaue you receive, whie minimizing your risk and probems. We strive to ensure that you get the test and measurement capabiities you paid for and obtain the support you need. Our extensive support resources and services can hep you choose the right Agient products for your appications and appy them successfuy. Every instrument and system we se has a goba warranty. Support is avaiabe for at east five years beyond the production ife of the product. Two concepts underie Agient s overa support poicy: Our Promise and Your Advantage. Our Promise Our Promise means your Agient test and measurement equipment wi meet its advertised performance and functionaity. When you are choosing new equipment, we wi hep you with product information, incuding reaistic performance specifications and practica recommendations from experienced test engineers. When you use Agient equipment, we can verify that it works propery, hep with product operation, and provide basic measurement assistance for the use of specified capabiities, at no extra cost upon request. Many sef-hep toos are avaiabe. Your Advantage Your Advantage means that Agient offers a wide range of additiona expert test and measurement services, which you can purchase according to your unique technica and business needs. Sove probems efficienty and gain a competitive edge by contracting with us for caibration, extra-cost upgrades, out-of-warranty repairs, and on-site education and training, as we as design, system integration, project management, and other professiona engineering services. Experienced Agient engineers and technicians wordwide can hep you maximize your productivity, optimize the return on investment of your Agient instruments and systems, and obtain dependabe measurement accuracy for the ife of those products. By internet, phone, or fax, get assistance with a your test & measurement needs Onine assistance: Phone or Fax United States: (te) Canada: (te) (fax) (905) Europe: (te) (31 20) (fax) (31 20) Japan: (te) (81) (fax) (81) Latin America: (te) (305) (fax) (305) Austraia: (te) (fax) (61 3) New Zeaand: (te) (fax) Asia Pacific: (te) (852) (fax) (852) Product specifications and descriptions in this document subject to change without notice. Agient Technoogies, 2001 Printed in UK 18 Juy, EN