Report No.:SZEE Page 1 of 36 EMC TEST REPORT

Transcription

1 Report No.:SZEE Page 1 of 36 Standards EMC TEST REPORT Product Name : LED STREET LIGHT Trade Name : Model Name : JRA1-160, JRA1-120, JRA1-90 JRA1-60, JRA1-30, JRX-Y90, JRX-Y120 Serial Number : N/A Technical Data : Input Voltage: AC V 50/60Hz Report Number : SZEE Date : Jul. 29, 2009 Regulations : See below EN 55015: 2006+A1:2007 EN : 2006 EN : 2008 EN 61547:1995+A1:2000 IEC : 2008 IEC : 2006+A1:2007 IEC : 2004 IEC : 2005 IEC : 2008 IEC : 2004 Results PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS Prepared for: ZHEJIANG JINGRI LIGHTING TECHNOLOGY CO., LTD. #2008 XISHAN ROAD, EASTERN NEW AREA, HUZHOU, ZHEJIANG TEL: FAX: Prepared by: CENTRE TESTING INTERNATIONAL CORPORATION Building C, Hongwei Industrial Zone, Baoan 70 District, Shenzhen, Guangdong, China TEL: FAX: This report shall not be reproduced, except in full, without the written approval of CENTRE TESTING INTERNATIONAL CORPORATION Building C, Hongwei Industrial Zone, Baoan 70 District, Shenzhen

2 Report No.:SZEE Page 2 of 36 TABLE OF CONTENTS 1. GENERAL INFORMATION TEST SUMMARY MEASUREMENT UNCERTAINTY PRODUCT INFORMATION AND TEST SETUP PRODUCT INFORMATION TEST SETUP CONFIGURATION SUPPORT EQUIPMENT FACILITIES AND ACCREDITATIONS TEST FACILITY TEST EQUIPMENT LIST LABORATORY ACCREDITATIONS AND LISTINGS DISTURBANCE VOLTAGES AT MAINS TERMINALS (CE) LIMITS BLOCK DIAGRAM OF TEST SETUP TEST PROCEDURE TEST RESULTS RADIATED DISTURBANCE (9KHz-30MHz) LIMITS OF RADIATED DISTURBANCE (9KHZ-30MHZ) TEST SETUP TEST PROCEDURE TEST RESULTS RADIATED DISTURBANCE (30MHz -300MHz) LIMITS OF RADIATED DISTURBANCE (30MHz -300MHz) TEST SETUP TEST PROCEDURE TEST RESULTS HARMONIC CURRENT EMISSION (HARMONIC) LIMITS OF HARMONIC CURRENT EMISSION MEASUREMENT TEST SETUP TEST PROCEDURE TEST RESULTS VOLTAGE FLUCTUATIONS & FLICKER TEST(FLICKER) LIMITS OF VOLTAGE FLUCTUATIONS & FLICKER TEST SETUP TEST PROCEDURE TEST RESULTS...21

3 Report No.:SZEE Page 3 of IMMUNITY TEST GENERAL PERFORMANCE CRITERIA DESCRIPTION ELECTROSTATIC DISCHARGE IMMUNITY TEST (ESD) TEST SPECIFICATION TEST SETUP TEST PROCEDURE RESULT & PERFORMANCE RADIATED, RADIO-FREQUENCY, ELECTROMAGNETIC FIELD IMMUNITY TEST (RS) TEST SPECIFICATION TEST SETUP TEST PROCEDURE RESULT & PERFORMANCE ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST (EFT) TEST SPECIFICATION TEST SETUP TEST PROCEDURE RESULT & PERFORMANCE SURGE IMMUNITY TEST (SURGE) TEST SPECIFICATION TEST SETUP TEST PROCEDURE RESULT & PERFORMANCE IMMUNITY TO CONDUCTED DISTURBANCES INDUCED BY RF FIELDS (CS) TEST SPECIFICATION TEST SETUP TEST PROCEDURE RESULT & PERFORMANCE VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TEST TEST SPECIFICATION TEST SETUP TEST PROCEDURE RESULT & PERFORMANCE...30 APPENDIX 1 PHOTOGRAPHS OF TEST SETUP...31 APPENDIX 2 PHOTOGRAPHS OF EUT...36 (Note: N/A means not applicable)

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5 Report No.:SZEE Page 5 of TEST SUMMARY The EUT has been tested according to the following specifications: EMISSION Standard Test Item Test EN Insertion loss N/A EN Disturbance voltages at mains terminals PASS EN Disturbance voltages at load terminals N/A EN Disturbance voltages at control terminals N/A EN Radiated disturbance in frequency range 9KHz to 30MHz PASS EN Radiated disturbance in frequency range 30MHz to 300MHz PASS EN Harmonic current emission PASS EN Voltage fluctuations & flicker PASS IMMUNITY (EN 61547) Standard Test Item Test IEC Electrostatic discharge immunity PASS IEC Radiated, radio frequency, electromagnetic field immunity PASS IEC Electrical fast transient / burst immunity PASS IEC Surge immunity PASS IEC Immunity to conducted disturbances, induced by radio-frequency fields PASS IEC Voltage dips, short interruptions and voltage variations immunity PASS 3. MEASUREMENT UNCERTAINTY Where relevant, the following measurement uncertainty levels have been estimated for tests performed on the EUT as specified in CISPR This uncertainty represents an expanded uncertainty expressed at approximately the 95% confidence level using a coverage factor of k=2. Test item Value CE RE 3.6 db 4.6 db

6 Report No.:SZEE Page 6 of PRODUCT INFORMATION AND TEST SETUP 4.1 PRODUCT INFORMATION Technical Data: Input Voltage: AC V 50/60Hz The model numbers of EUT are JRA1-160, JRA1-120, JRA1-90, JRA1-60, JRA1-30, JRX-Y90, JRX-Y120. All the models are the same except the power and the appearance. The power of JRA1-160 is 160W. The power of JRA1-120 is 120W. The power of JRA1-90 is 90W. The power of JRA1-60 is 60W. The power of JRA1-30 is 30W. The power of JRX-Y90 is 90W. The power of JRX-Y120 is 120W. The model number of test sample is JRA1-160, and the test results are applicable to the others. 4.2 TEST SETUP CONFIGURATION 1. Test photographs attached in Appendix 1 for the actual connections between EUT and support equipment. 2. Make sure the EUT work normally during the test. 4.3 SUPPORT EQUIPMENT No. Device Type Brand Model Series No. Data Cable Power Cord Notes: 1. All the equipment/cables were placed in the worst-case configuration to maximize the emission during the test. 2. Grounding was established in accordance with the manufacturer s requirements and conditions for the intended use. 5. FACILITIES AND ACCREDITATIONS 5.1 TEST FACILITY All measurement facilities used to collect the measurement data are located at Building C, Hongwei Industrial Zone, Baoan 70 District, Shenzhen, Guangdong, China. The site and apparatus are constructed in conformance with the requirements of ANSI C63.4 and CISPR other equivalent standards. 5.2 TEST EQUIPMENT LIST Instrumentation: The following list contains equipments used at CTI for testing. The calibrations of the measuring instruments, including any accessories that may effect such calibration, are checked frequently to assure their accuracy. Adjustments are made and correction factors applied in accordance with instructions contained in the manual for the measuring instrument. Equipment used during the tests: Shielding Room No. 1 - CE Test Equipment Manufacturer Model Serial No. Due Date Receiver R&S ESCI /29/2010 LISN R&S ENV /13/2010 Shielding Room No. 1 - ME Test Equipment Manufacturer Model Serial No. Due Date Receiver R&S ESCI /29/ Loop Antenna LAPLACE RF300 E011 06/13/2010

7 Report No.:SZEE Page 7 of 36 3M Semi-anechoic Chamber - RE Test Equipment Manufacturer Model Serial No. Due Date 3M Chamber & Accessory Equipment ETS-LINDGREN FACT /29/2010 Spectrum Analyzer Agilent E4443A MY /29/2010 Multi device Controller ETS-LINGREN /29/2010 Shielding Room No. 2 - Harmonic / Flicker Test (EN ) (EN ) Equipment Manufacturer Model Serial No. Due Date 5KVA AC POWER California 500LIX /29/2010 SOURCE instruments California Flicker & Harmonic Tester 413 OPITION /29/2010 instruments Shielding Room No. 3 - ESD Test (IEC ) Equipment Manufacturer Model Serial No. Due Date ESD Simulator SCHAFFNER NSG /17/2009 3M Full-anechoic Chamber - RS Test (IEC ) Equipment Manufacturer Model Serial No. Due Date ESG Vector signal generators Agilent E4438C MY /17/2009 Power Amplifier AR 150W /29/2010 Shielding Room No. 3 - EFT / Surges Test (IEC ) (IEC ) Equipment Manufacturer Model Serial No. Due Date Compact Generator EM-Test UCS500M/6B V /07/2009 Shielding Room No. 2 - CS Test (IEC ) Equipment Manufacturer Model Serial No. Due Date Signal Generator IFR 2023B /439 11/19/2009 Power Amplifier AR 75A250A /07/2010 CDN EM-Test CDN M2/M /07/2010 Shielding Room No. 2 - Dips Test (IEC ) Equipment Manufacturer Model Serial No. Due Date 5KVA AC POWER California 500LIX /29/2010 SOURCE instruments California Electronic output switch EOS /29/2010 instruments 5.3 LABORATORY ACCREDITATIONS AND LISTINGS The measuring equipment utilized to perform the tests documented in this report has been calibrated once a year or in accordance with the manufacturer's recommendations, and is traceable under the ISO/IEC/EN to international or national standards. Equipment has been calibrated by accredited calibration laboratories.

8 Report No.:SZEE Page 8 of DISTURBANCE VOLTAGES AT MAINS TERMINALS (CE) 6.1 LIMITS Frequency range Limits (dbμv) (MHz) Quasi-peak Average 0,009 to 0, to to ,15 to 0,50 66 to to 46 0,50 to to NOTE: 1. The lower limit shall apply at the transition frequencies. 2. The limit decreases linearly with the logarithm of the frequency in the range 0.05 to 0.50 MHz. 3. For electrodeless lamps and luminaires, the limit in the frequency range of 2.51MHz to 3MHz is 73 db(μv) quasi-peak and 63 db(μv) average. 6.2 BLOCK DIAGRAM OF TEST SETUP 6.3 TEST PROCEDURE a. The EUT was placed on a non-conductive table 0.8 m above the horizontal ground reference plane, and 0.4 m from the vertical ground reference plane, and connected to the main through Line Impedance Stability Network (L.I.S.N). b. The RBW of the receiver was set at 200Hz in 9 khz -150 khz and 9 khz in 150 khz - 30MHz with Peak and AVG detector in Max Hold mode. Run the receiver s pre-scan to record the maximum disturbance generated from EUT in all power lines in the full band. c. For each frequency whose maximum record was higher or close to limit, measure its QP and AVG values and record.

9 Report No.:SZEE Page 9 of TEST RESULTS EUT : LED STREET LIGHT M/N : JRA1-160 Power : AC 230V/50Hz Temperature : 24 Mode : Normal Humidity : 53% Frequency (MHz) Reading Level (dbuv) Correct Factor CE Test Result Measurement (dbuv) Limit (dbuv) Margin (db) Result (P/F) Peak Q.P. Avg. (db) Peak Q.P. Avg. Q.P. Avg. Q.P. Avg P L P L P L P L Remarks (L/N) P N P N P N P N Frequency = Emission frequency in MHz Reading level = Uncorrected receiver reading Correct Factor = Cable loss + LISN inserting loss Measurement = Reading level + Factor Limit (dbuv) = Limit stated in standard Margin(dB) = Reading in reference to limit -- = The emission level complied with the Average limits, with at least 2 db margin, so no further recheck.

10 Report No.:SZEE Page 10 of 36 Graphs of Conduction Emission: L: N:

11 Report No.:SZEE Page 11 of RADIATED DISTURBANCE (9KHz-30MHz) 7.1 LIMITS OF RADIATED DISTURBANCE (9KHZ-30MHZ) Frequency Limits for Loop Diameter (dbμa) 2m 9KHz ~ 70KHz 88 70KHz ~ 150KHz 88 ~ 58* 150KHz ~ 3.0MHz 58 ~ 22* 3.0MHz ~ 30MHz 22 NOTE: (1) At the transition frequency the lower limit applies. (2) * means decreasing linearly with logarithm of the frequency. For electrodeless lamps And luminaires,the limit in the frequency range of2.2mhz to 3.0MHz is 58 db(μa) for 2m,51 db(μa) for 3m and 45dB(μA) for 4m loop diameter. 7.2 TEST SETUP 7.3 TEST PROCEDURE a. The EUT was placed on a wooden table in the center of a loop antenna. b. The induced current in the loop antenna was measured by means of a current probe and the test receiver. Three field components were checked by means of a coaxial switch. c. The frequency range from 9 KHz to 30MHz is investigated. The receiver is measured with the quasi-peak detector. For frequency band 9 KHz to 150 KHz, the bandwidth of the field strength meter (R & S test receiver ESCI is set at 200Hz. For frequency band 150 KHz to 30MHz, the bandwidth is set at 9 KHz.

12 Report No.:SZEE Page 12 of TEST RESULTS Frequency (MHz) EUT : LED STREET LIGHT M/N : JRA1-160 Power : AC 230V/50Hz Temperature : 24 Mode : Normal Humidity : 53% Reading Level (dbua) Correct Factor Measurement (dbua) Limit (dbua) Margin (db) Result (P/F) Peak Q.P. Avg. (db) Peak Q.P. Avg. Q.P. Avg. Q.P. Avg < P X < P X Remarks (X/Y/Z) < P Y < P Y < P Y < P Y < P Z < P Z < P Z Frequency Reading level Correct Factor Measurement Limit (dbua) Margin (db) PK QP = Emission frequency in MHz = Uncorrected frequency analyzer reading = Correction factors of antenna factor and cable loss = Reading level + Correct factor = Limit stated in standard = Reading in reference to limit = Peak = Quasi-peak

13 Report No.:SZEE Page 13 of 36 Graphs of Radiated disturbance (9KHZ-30MHZ): X: Y:

14 Report No.:SZEE Page 14 of 36 Z:

15 Report No.:SZEE Page 15 of RADIATED DISTURBANCE (30MHz -300MHz) 8.1 LIMITS OF RADIATED DISTURBANCE (30MHz -300MHz) Limits for radiated disturbance at a measuring distance of 3 m Frequency (MHz) Quasi-peak limit at 3m (dbuv/m) NOTE: (1) The lower limit shall apply at the transition frequencies. (2) Emission level (dbuv/m) = 20 log Emission level (uv/m). 8.2 TEST SETUP For the actual test configuration, please refer to the related item Photographs of the Test Configuration. 8.3 TEST PROCEDURE a. The EUT was placed on the top of a rotating table 0.8 meters above the ground at a 3-meter open field site. The table was rotated 360 degrees to determine the position of the highest radiation. b. The EUT was set 3 meters away from the interference-receiving antenna, which was mounted on the top of a variable-height antenna tower. c. The antenna is a broadband antenna, and its height is varied from one meter to four meters above the ground to determine the maximum value of the field strength. Both horizontal and vertical of the antenna were set to make the measurement. d. For each suspected emission, the EUT was arranged to its worst case and then the antenna was tuned to heights from 1 meter to 4 meters and the turn table was turned from 0 degrees to 360 degrees to find the maximum reading. e. The test frequency analyzer system was set to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode.

16 Report No.:SZEE Page 16 of TEST RESULTS Frequency (MHz) EUT : LED STREET LIGHT M/N : JRA1-160 Power : AC 230V/50Hz Temperature : 24 Mode : Normal Humidity : 53% Reading Level (dbuv/m) Radiated Emission Test Result Correct Factor Measurement (dbuv/m) Limit (dbuv/m) Margin (db) Result (P/F) Remarks (H/V) Peak Q.P. Avg. (db) Peak Q.P. Avg. Q.P. Avg. Q.P. Avg P H <-3 -- P H P H P V P V Frequency Reading level Correct Factor Measurement Limit (dbuv/m) Margin (db) PK QP = Emission frequency in MHz = Uncorrected frequency analyzer reading = Correction factors of antenna factor and cable loss = Reading level + Correct factor = Limit stated in standard = Reading in reference to limit = Peak = Quasi-peak

17 Report No.:SZEE Page 17 of 36 Graphs of Radiated disturbance (30MHZ -300MHZ): H: V:

18 Report No.:SZEE Page 18 of HARMONIC CURRENT EMISSION (HARMONIC) 9.1 LIMITS OF HARMONIC CURRENT EMISSION MEASUREMENT Please refer to EN :2006 Clause TEST SETUP For the actual test configuration, please refer to the related item Photographs of the Test Configuration. 9.3 TEST PROCEDURE a. The EUT was placed on the top of a wooden table 0.8 meters above the ground and operated to produce the maximum harmonic components under normal operating conditions for each successive harmonic component in turn. b. The correspondent test program of test instrument to measure the current harmonics emanated from EUT is chosen. The measure time shall be not less than the time necessary for the EUT to be exercised. 9.4 TEST RESULTS Pass.

19 Report No.:SZEE Page 19 of 36 Harmonics Class-C per Ed. 3.0 ( ) Test Result: Pass Source qualification: Normal Current & voltage waveforms Current (Amps) Voltage (Volts) Harmonics and Class C limit line European Limits Current RMS(Amps) Test result: Pass Harmonic # Worst harmonic was #2 with 61.84% of the limit.

20 Report No.:SZEE Page 20 of 36 Current Test Result Summary Test Result: Pass Source qualification: Normal THC(A): 0.02 I-THD(%): 3.19 POHC(A): POHC Limit(A): Highest parameter values during test: V_RMS (Volts): Frequency(Hz): I_Peak (Amps): I_RMS (Amps): I_Fund (Amps): Crest Factor: Power (Watts): Power Factor: Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Note: Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio.

21 Report No.:SZEE Page 21 of VOLTAGE FLUCTUATIONS & FLICKER TEST (FLICKER) 10.1 LIMITS OF VOLTAGE FLUCTUATIONS & FLICKER Please refer to EN : 2008 Clause TEST SETUP For the actual test configuration, please refer to the related item Photographs of the Test Configuration TEST PROCEDURE a. The EUT was placed on the top of a wooden table 0.8 meters above the ground and operated to produce the most unfavorable sequence of voltage changes under normal operating conditions. b. During the flicker measurement, the measure time shall include that part of whole operation cycle in which the EUT produce the most unfavorable sequence of voltage changes. The observation period for short-term flicker indicator is 10 minutes and the observation period for long-term flicker indicator is 2 hours TEST RESULTS Pass.

22 Report No.:SZEE Page 22 of 36 Flicker Test Summary per EN/IEC Test Result: Pass Status: Test Completed Pst i and limit line European Limits Parameter values recorded during the test: Vrms at the end of test (Volt): Highest dt (%): 0.27 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass

23 Report No.:SZEE Page 23 of IMMUNITY TEST 11.1 GENERAL PERFORMANCE CRITERIA DESCRIPTION The general compliance criteria according to EN 61547:1995+A1:2000 are defined as follows: Product Standard CRITERION A CRITERION B CRITERION C EN 61547:1995+A1:2000 During the test no change of the luminous intensity shall be observed and the regulating control, if any, shall operate during the test as intended. During the test the luminous intensity may change to any value. After the test the luminous intensity shall be restored to its initial value within 1 min. Regulating controls need not function during the test, but after the test the mode of the control shall be the same as before the test provided that during the test no mode changing commands were given. During and after the test any change of the luminous intensity is allowed and the lamp(s) may be extinguished. After the test, within 30 min, all functions shall return to normal if necessary by temporary interruption of the mains supply and/or operating the regulating control. Additional requirement for lighting equipment incorporating a starting device: After the test the lighting equipment is switched off. After half an hour it is switched on again. The lighting equipment shall start and operate as intended.

24 Report No.:SZEE Page 24 of ELECTROSTATIC DISCHARGE IMMUNITY TEST (ESD) TEST SPECIFICATION Basic Standard : EN & IEC Discharge Impedance : 330 ohm / 150 pf Discharge Voltage : Indirect: HCP&VCP 4kV Direct : Air Discharge 8 kv Contact Discharge 4kV Polarity : Positive / Negative Discharge Mode : Single Discharge Discharge Period : 1 second minimum Temperature /Humidity : 23 /56% TEST SETUP Block Diagram For the actual test configuration, please refer to the related item - Photographs of the Test Configuration TEST PROCEDURE The basic test procedure was in accordance with EN and IEC : a. Electrostatic discharges were applied only to those points and surfaces of the EUT that are accessible to users during normal operation. b. The test was performed with at least ten single discharges on the pre-selected points in the most sensitive polarity. c. The time interval between two successive single discharges was at least 1 second. d. The ESD generator was held perpendicularly to the surface to which the discharge was applied and the return cable was at least 0.2 meters from the EUT. e. Contact discharges were applied to the non-insulating coating, with the pointed tip of the generator penetrating the coating and contacting the conducting substrate. f. Air discharges were applied with the round discharge tip of the discharge electrode approaching the EUT as fast as possible (without causing mechanical damage) to touch the

25 Report No.:SZEE Page 25 of 36 EUT. After each discharge, the ESD generator was removed from the EUT and re-triggered for a new single discharge. The test was repeated until all discharges were complete. g. At least ten single discharges (in the most sensitive polarity) were applied to the Horizontal Coupling Plane at points on each side of the EUT. The ESD generator was positioned vertically at a distance of 0.1 meters from the EUT with the discharge electrode touching the HCP. h. At least ten single discharges (in the most sensitive polarity) were applied to the center of one vertical edge of the Vertical Coupling Plane in sufficiently different positions that the four faces of the EUT were completely illuminated. The VCP (dimensions 0.5m x 0.5m) was placed vertically to and 0.1 meters from the EUT RESULT & PERFORMANCE The electrostatic discharges were applied as follows: Amount of Performance Voltage Coupling Required Level Discharges Criterion Mini 10 /Point ± 8 kv Air Discharge B A Mini 10 /Point ± 4 kv Contact Discharge B A Mini 10 /Point ± 4 kv Indirect Discharge HCP B A Mini 10 /Point ± 4 kv Indirect Discharge VCP B A

26 Report No.:SZEE Page 26 of RADIATED, RADIO-FREQUENCY, ELECTROMAGNETIC FIELD IMMUNITY TEST (RS) TEST SPECIFICATION Basic Standard : EN & IEC Frequency Range : 80MHz -1000MHz Dwell Time : 1 second Temperature /Humidity : 23 /57% TEST SETUP For the actual test configuration, please refer to the related item - Photographs of the Test Configuration TEST PROCEDURE a. The testing was performed in a fully-anechoic chamber. The transmit antenna was located at a distance of 3 meters from the EUT. b. The frequency range is swept from 80MHz to 1000MHz, with the signal 80% amplitude modulated with a 1 khz sine wave. The rate of sweep did not exceed 1.5x 10-3 decade/s. Where the frequency range is swept incrementally, the step size was 1% of fundamental. c. The dwell time at each frequency shall be not less than the time necessary for the EUT to be able to respond. d. The test was performed with the EUT exposed to both vertically and horizontally polarized fields on each of the four sides RESULT & PERFORMANCE Frequency Polarity Position Field Strength (V/m) H&V Front 3 80MHz to H&V Right MHz H&V Back 3 H&V Left 3 Required Level A Performance Criterion A

27 Report No.:SZEE Page 27 of ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST (EFT) TEST SPECIFICATION Basic Standard : EN & IEC Polarity : Positive/Negative Impulse Frequency : 5 khz Impulse Wave-shape : 5/50 ns Burst Duration : 15 ms Burst Period : 300 ms Test Duration : 2 min Temperature /Humidity : 24 /57% TEST SETUP For the actual test configuration, please refer to the related item - Photographs of the Test Configuration TEST PROCEDURE a. The EUT and support units were located on a wooden table 0.8 m away from ground reference plane. b. A 0.5 meter long power cord was attached to EUT during the test. c. Injected test voltage to the EUT ports from minimum to standard request RESULT & PERFORMANCE Voltage Performance Coupling Polarity Required Level (kv) Criterion PE + L + N 1 ± B A

28 Report No.:SZEE Page 28 of SURGE IMMUNITY TEST (SURGE) TEST SPECIFICATION Basic Standard : EN & IEC Wave-Shape : 1.2/50 us Open Circuit Voltage 8 /20 us Short Circuit Current Polarity : Positive/Negative Phase Angle : 0 o / 90 o / 180 o / 270 o Pulse Repetition Rate : 1 time / min. (maximum) Number of Tests : 5 positive and 5 negative at selected points Temperature /Humidity : 24 /58% TEST SETUP For the actual test configuration, please refer to the related item - Photographs of the Test Configuration TEST PROCEDURE a. The surge is to be applied to the EUT power supply terminals via the capacitive coupling network. Decoupling networks are required in order to avoid possible adverse effects on equipment not under test that may be powered by the same lines, and to provide sufficient decoupling impedance to the surge wave. b. The power cord between the EUT and the coupling/decoupling networks shall be 2 meters in length (or shorter). Interconnection line between the EUT and the coupling/decoupling networks shall be 2 meters in length (or shorter) RESULT & PERFORMANCE Coupling Line Voltage Performance Polarity Required Level (kv) Criterion L PE 2 ± C A N PE 2 ± C A L N 1 ± C A

29 Report No.:SZEE Page 29 of IMMUNITY TO CONDUCTED DISTURBANCES INDUCED BY RF FIELDS (CS) TEST SPECIFICATION Basic Standard : EN & IEC Frequency Range : 0.15 MHz - 80 MHz Dwell Time : 1 second Temperature /Humidity : 24 /58% TEST SETUP For the actual test configuration, please refer to the related item - Photographs of the Test Configuration TEST PROCEDURE a. The EUT and support units were located at a ground reference plane with the interposition of a 0.1 m thickness insulating support and the CDN was located on GRP directly. b. The frequency range is swept from 150 khz to 80MHz, with the signal 80% amplitude modulated with a 1 khz sine wave. The rate of sweep did not exceed 1.5x 10-3 decade/s. Where the frequency range is swept incrementally, the step size was 1% of fundamental. c. The dwell time at each frequency shall be not less than the time necessary for the EUT to be able to respond RESULT & PERFORMANCE Voltage Level Required Performance Inject Line Frequency (Vr.m.s.) Level Criterion Power terminal 0.15MHz 80MHz 3 A A

30 Report No.:SZEE Page 30 of VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TEST TEST SPECIFICATION Basic Standard : EN & IEC Port : AC power port Requirement : Phase angle 0, 45, 90, 135, 180, 225, 270, 315 degrees Temperature /Humidity : 23 /60% TEST SETUP For the actual test configuration, please refer to the related item Photographs of the Test Configuration TEST PROCEDURE a. The EUT and support units were located on a wooden table, 0.8 m away from ground floor. b. Setting the parameter of tests and then perform the test software of test simulator. c. Conditions changes to occur at 0 degree crossover point of the voltage waveform RESULT & PERFORMANCE Voltage Dips: Test Reduction Duration Level (%) ( ms) % UT Observation Required Level Performance criteria Normal C A Voltage Interruptions: Test Reduction Duration Required Level Observation (%) ( ms) Level % UT Performance criteria Normal B A

31 Report No.:SZEE Page 31 of 36 APPENDIX 1 PHOTOGRAPHS OF TEST SETUP CONDUCTED EMISSION TEST SETUP RADIATED DISTURBANCES (9KHZ-30MHZ) TEST SETUP

32 Report No.:SZEE Page 32 of 36 RADIATED DISTURBANCES (30MHZ -300MHZ) TEST SETUP HARMONICS, FLICKER AND DIPS TEST SETUP

33 Report No.:SZEE Page 33 of 36 ESD TEST SETUP RS TEST SETUP

34 Report No.:SZEE Page 34 of 36 EFT TEST SETUP SURGE TEST SETUP

35 Report No.:SZEE Page 35 of 36 CS TEST SETUP

36 Report No.:SZEE Page 36 of 36 APPENDIX 2 PHOTOGRAPHS OF EUT View of EUT-1 View of EUT End of the report----