Electromagnetic Lens. Pole Pieces of iron Concentrate lines of Magnetic force

Size: px
Start display at page:

Download "Electromagnetic Lens. Pole Pieces of iron Concentrate lines of Magnetic force"

Transcription

1 Electromagnetic Lens Pole Pieces of iron Concentrate lines of Magnetic force

2

3

4 Lens Defects Since the focal length f of a lens is dependent on the strength of the lens, if follows that different wavelengths will be focused to different positions. Chromatic aberration of a lens is seen as fringes around the image due to a zone of focus.

5 Lens Defects In light optics chromatic aberration can be corrected by combining a converging lens with a diverging lens. This is known as a doublet lens

6 The simplest way to correct for chromatic aberration is to use illumination of a single wavelength! This is accomplished in an EM by having a very stable acceleration voltage. If the e velocity is stable the illumination source is monochromatic

7 Lens Defects The fact that wavelengths enter and leave the lens field at different angles results in a defect known as spherical aberration. The result is similar to that of chromatic aberration in that wavelengths are brought to different focal points

8 Spherical aberrations are worst at the periphery of a lens so again a small opening aperture that cuts off the most offensive part of the lens is the best way to reduce the effects of spherical aberration

9 Diffraction Diffraction occurs when a wavefront encounters an edge of an object. This results in the establishment of new wavefronts

10 Diffraction When this occurs at the edges of an aperture the diffracted waves tend to spread out the focus rather than concentrate them. This results in a decrease in resolution, the effect becoming more pronounced with ever smaller apertures.

11 Apertures Advantages Increase contrast by blocking scattered electrons Decrease effects of chromatic and spherical aberration by cutting off edges of a lens Disadvantages Decrease resolution due to effects of diffraction Decrease resolution by reducing half angle of illumination Decrease illumination by blocking scattered electrons

12 If a lens is not completely symmetrical objects will be focussed to different focal planes resulting in an astigmatic image

13 The result is a distorted image. This can best be prevented by having as near to perfect a lens as possible but other defects such as dirt on an aperture etc. can cause an astigmatism

14 Astigmatism in light optics is corrected by making a lens with a corresponding defect to correct for the defect in another lens In EM it is corrected using a stigmator Which is a ring of electromagnets positioned around the beam to push and pull the beam to make it more perfectly circular

15 Interazioni tra elettroni e materia

16

17 Electron-specimen Interactions Primary electrons X-rays Secondary (. s.e ) Electrons Cathode Luminescence Specimen E Backscattered (. b.s.e ) Electrons Auger-electrons Absorbed Electrons Transmitted electrons

18 Two Types of Electron Microscopes Scanning Electron Microscope ( SEM ) Secondary Electrons Back-scattered Electrons ( X-rays ) Transmission Electron Microscope ( TEM ) Transmitted Electrons ( X-rays ) Primary electrons X-rays Cathode Luminescence Secondary Electrons (. s.e ) Backscattered Electrons (. b.s.e ) Auger-electrons Specimen E Absorbed Electrons Transmitted electrons

19 The size and shape of the region of primary excitation can be estimated by carrying out simulations that use Monte Carlo calculations and take into account the composition of the specimen

20 An interaction volume can also be used to predict the types of signals that will be produced and the depth from which they can escape. Monte Carlo simulations of electron trajectories are based on 1) the energy of the primary beam electron, 2) the likelihood of an interaction, 3) the change in direction and energy of the electron, 4) the mean free path of the electron and 5) a random factor for any given interaction.

21 Effects of Accelerating Voltage Z = Atomic Weight E = Energy of primary beam

22

23

24

25 The angle at which the beam strikes the specimen and the distance from the surface are important factors in how much of signal escapes from the specimen.

26

27 The probability of an elastic vs. an inelastic collision is based primarily on the atomic weight of the specimen.

28 Interactions of electrons with atoms Elastic scattering No energy is deposited, wavelength electron unaffected Inelastic scattering Energy is deposited, inducing damage in the sample, wavelength electron increases

29 Comparison of elastic and inelastic interactions with carbon of X-rays, neutrons and electrons Atomic cross-section for carbon in biological specimens (barns = cm 2 ) Electrons interact far stronger with matter than other elementary particles, therefore electrons can image very thin objects better than other particles Electrons deposit far less energy in a biological sample, compared to X-rays, therefore electrons are less damaging Wavelength (Å)

30 Comparing scattering of electrons & X-rays Inelastic / elastic scattering events Energy deposited per inelastic event Energy deposited relative to electrons per elastic event Scattered photons per scattered electron Electrons (200 kev) 3 10 X-rays (1.5 Å) 20 ev 8 kev Current resolution 6-8 Å < 1 Å From Henderson (1995) Quart. Rev. Biophys. 28, 171

31 Optics of diffraction and imaging detector lens object diffraction object diffraction focus image Diffraction pattern

32 Apertures Advantages Increase contrast by blocking scattered electrons Decrease effects of chromatic and spherical aberration by cutting off edges of a lens Disadvantages Decrease resolution due to effects of diffraction Decrease resolution by reducing half angle of illumination Decrease illumination by blocking scattered electrons

33 Phase contrast in the TEM Contrast can arise from constructive and destructive interference of electron waves.

34 Phase contrast in the TEM

35 Contrast in electron microscopy: bright field detector Strong scatterer lens Defining apenture

36

View of ΣIGMA TM (Ref. 1)

View of ΣIGMA TM (Ref. 1) Overview of the FESEM system 1. Electron optical column 2. Specimen chamber 3. EDS detector [Electron Dispersive Spectroscopy] 4. Monitors 5. BSD (Back scatter detector) 6. Personal Computer 7. ON/STANDBY/OFF

More information

Lenses and Apertures of A TEM

Lenses and Apertures of A TEM Instructor: Dr. C.Wang EMA 6518 Course Presentation Lenses and Apertures of A TEM Group Member: Anup Kr. Keshri Srikanth Korla Sushma Amruthaluri Venkata Pasumarthi Xudong Chen Outline Electron Optics

More information

Preface Light Microscopy X-ray Diffraction Methods

Preface Light Microscopy X-ray Diffraction Methods Preface xi 1 Light Microscopy 1 1.1 Optical Principles 1 1.1.1 Image Formation 1 1.1.2 Resolution 3 1.1.3 Depth of Field 5 1.1.4 Aberrations 6 1.2 Instrumentation 8 1.2.1 Illumination System 9 1.2.2 Objective

More information

The Basics of Scanning Electron Microscopy

The Basics of Scanning Electron Microscopy The Basics of Scanning Electron Microscopy The small scanning electron microscope is easy to use because almost every variable is pre-set: the acceleration voltage is always 15kV, it has only a single

More information

Electron Microscopy 3. SEM. Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts

Electron Microscopy 3. SEM. Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts Electron Microscopy 3. SEM Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts 3-1 SEM is easy! Just focus and shoot "Photo"!!! Please comment this picture... Any

More information

Scanning Electron Microscopy Primer

Scanning Electron Microscopy Primer Scanning Electron Microscopy Primer Bob Hafner This primer is intended as background for the Introductory Scanning Electron Microscopy training offered by the University of Minnesota s Characterization

More information

Physics 10. Lecture 29A. "There are two ways of spreading light: to be the candle or the mirror that reflects it." --Edith Wharton

Physics 10. Lecture 29A. There are two ways of spreading light: to be the candle or the mirror that reflects it. --Edith Wharton Physics 10 Lecture 29A "There are two ways of spreading light: to be the candle or the mirror that reflects it." --Edith Wharton Converging Lenses What if we wanted to use refraction to converge parallel

More information

Electron Microscopy SEM and TEM

Electron Microscopy SEM and TEM Electron Microscopy SEM and TEM Content 1. Introduction: Motivation for electron microscopy 2. Interaction with matter 3. SEM: Scanning Electron Microscopy 3.1 Functional Principle 3.2 Examples 3.3 EDX

More information

Scanning Electron Microscopy: an overview on application and perspective

Scanning Electron Microscopy: an overview on application and perspective Scanning Electron Microscopy: an overview on application and perspective Elvio Carlino Center for Electron Microscopy - IOM-CNR Laboratorio Nazionale TASC - Trieste, Italy Location of the Center for Electron

More information

CSCI 4974 / 6974 Hardware Reverse Engineering. Lecture 8: Microscopy and Imaging

CSCI 4974 / 6974 Hardware Reverse Engineering. Lecture 8: Microscopy and Imaging CSCI 4974 / 6974 Hardware Reverse Engineering Lecture 8: Microscopy and Imaging Data Acquisition for RE Microscopy Imaging Registration and stitching Microscopy Optical Electron Scanning Transmission Scanning

More information

DOING PHYSICS WITH MATLAB COMPUTATIONAL OPTICS RAYLEIGH-SOMMERFELD DIFFRACTION INTEGRAL OF THE FIRST KIND

DOING PHYSICS WITH MATLAB COMPUTATIONAL OPTICS RAYLEIGH-SOMMERFELD DIFFRACTION INTEGRAL OF THE FIRST KIND DOING PHYSICS WITH MATLAB COMPUTATIONAL OPTICS RAYLEIGH-SOMMERFELD DIFFRACTION INTEGRAL OF THE FIRST KIND THE THREE-DIMENSIONAL DISTRIBUTION OF THE RADIANT FLUX DENSITY AT THE FOCUS OF A CONVERGENCE BEAM

More information

Understanding astigmatism Spring 2003

Understanding astigmatism Spring 2003 MAS450/854 Understanding astigmatism Spring 2003 March 9th 2003 Introduction Spherical lens with no astigmatism Crossed cylindrical lenses with astigmatism Horizontal focus Vertical focus Plane of sharpest

More information

Revision problem. Chapter 18 problem 37 page 612. Suppose you point a pinhole camera at a 15m tall tree that is 75m away.

Revision problem. Chapter 18 problem 37 page 612. Suppose you point a pinhole camera at a 15m tall tree that is 75m away. Revision problem Chapter 18 problem 37 page 612 Suppose you point a pinhole camera at a 15m tall tree that is 75m away. 1 Optical Instruments Thin lens equation Refractive power Cameras The human eye Combining

More information

How To Understand Light And Color

How To Understand Light And Color PRACTICE EXAM IV P202 SPRING 2004 1. In two separate double slit experiments, an interference pattern is observed on a screen. In the first experiment, violet light (λ = 754 nm) is used and a second-order

More information

Diffraction of a Circular Aperture

Diffraction of a Circular Aperture Diffraction of a Circular Aperture Diffraction can be understood by considering the wave nature of light. Huygen's principle, illustrated in the image below, states that each point on a propagating wavefront

More information

Interference. Physics 102 Workshop #3. General Instructions

Interference. Physics 102 Workshop #3. General Instructions Interference Physics 102 Workshop #3 Name: Lab Partner(s): Instructor: Time of Workshop: General Instructions Workshop exercises are to be carried out in groups of three. One report per group is due by

More information

AP Physics B Ch. 23 and Ch. 24 Geometric Optics and Wave Nature of Light

AP Physics B Ch. 23 and Ch. 24 Geometric Optics and Wave Nature of Light AP Physics B Ch. 23 and Ch. 24 Geometric Optics and Wave Nature of Light Name: Period: Date: MULTIPLE CHOICE. Choose the one alternative that best completes the statement or answers the question. 1) Reflection,

More information

Vacuum Evaporation Recap

Vacuum Evaporation Recap Sputtering Vacuum Evaporation Recap Use high temperatures at high vacuum to evaporate (eject) atoms or molecules off a material surface. Use ballistic flow to transport them to a substrate and deposit.

More information

Name: Due: September 21 st 2012. Physics 7230 Laboratory 3: High Resolution SEM Imaging

Name: Due: September 21 st 2012. Physics 7230 Laboratory 3: High Resolution SEM Imaging Name: Due: September 21 st 2012 Physics 7230 Laboratory 3: High Resolution SEM Imaging 1. What is meant by the term resolution? How does this differ from other image variables, such as signal to noise

More information

Image Formation in the Electron Microscope

Image Formation in the Electron Microscope T H E U N I V E R S I T Y of T E X A S S C H O O L O F H E A L T H I N F O R M A T I O N S C I E N C E S A T H O U S T O N Image Formation in the Electron Microscope For students of HI 6001-125 Computational

More information

Fundamentals of Scanning Electron Microscopy

Fundamentals of Scanning Electron Microscopy 1 Fundamentals of Scanning Electron Microscopy Weilie Zhou, Robert P. Apkarian, Zhong Lin Wang, and David Joy 1. Introduction The scanning electron microscope (SEM) is one of the most versatile instruments

More information

- the. or may. scales on. Butterfly wing. magnified about 75 times.

- the. or may. scales on. Butterfly wing. magnified about 75 times. Lecture Notes (Applications of Diffraction) Intro: - the iridescent colors seen in many beetles is due to diffraction of light rays hitting the small groovess of its exoskeleton - these ridges are only

More information

Looking through the fish-eye the Electron Ronchigram. Duncan T.L. Alexander CIME seminar May 24, 2012

Looking through the fish-eye the Electron Ronchigram. Duncan T.L. Alexander CIME seminar May 24, 2012 Looking through the fish-eye the Electron Ronchigram Duncan T.L. Alexander CIME seminar May 24, 2012 Introduction Aim of the seminar: open a discussion on the Electron Ronchigram How is it formed? What

More information

Scanning He + Ion Beam Microscopy and Metrology. David C Joy University of Tennessee, and Oak Ridge National Laboratory

Scanning He + Ion Beam Microscopy and Metrology. David C Joy University of Tennessee, and Oak Ridge National Laboratory Scanning He + Ion Beam Microscopy and Metrology David C Joy University of Tennessee, and Oak Ridge National Laboratory The CD-SEM For thirty years the CD-SEM has been the tool for metrology But now, as

More information

Chapter 4. Microscopy, Staining, and Classification. Lecture prepared by Mindy Miller-Kittrell North Carolina State University

Chapter 4. Microscopy, Staining, and Classification. Lecture prepared by Mindy Miller-Kittrell North Carolina State University Chapter 4 Microscopy, Staining, and Classification 2012 Pearson Education Inc. Lecture prepared by Mindy Miller-Kittrell North Carolina State University Microscopy and Staining 2012 Pearson Education Inc.

More information

Physics 30 Worksheet # 14: Michelson Experiment

Physics 30 Worksheet # 14: Michelson Experiment Physics 30 Worksheet # 14: Michelson Experiment 1. The speed of light found by a Michelson experiment was found to be 2.90 x 10 8 m/s. If the two hills were 20.0 km apart, what was the frequency of the

More information

Nanometer-scale imaging and metrology, nano-fabrication with the Orion Helium Ion Microscope

Nanometer-scale imaging and metrology, nano-fabrication with the Orion Helium Ion Microscope andras@nist.gov Nanometer-scale imaging and metrology, nano-fabrication with the Orion Helium Ion Microscope Bin Ming, András E. Vladár and Michael T. Postek National Institute of Standards and Technology

More information

Near-field scanning optical microscopy (SNOM)

Near-field scanning optical microscopy (SNOM) Adviser: dr. Maja Remškar Institut Jožef Stefan January 2010 1 2 3 4 5 6 Fluorescence Raman and surface enhanced Raman 7 Conventional optical microscopy-limited resolution Two broad classes of techniques

More information

Forensic Science: The Basics. Microscopy

Forensic Science: The Basics. Microscopy Forensic Science: The Basics Microscopy Chapter 6 Jay A. Siegel,Ph.D. Power point presentation by Greg Galardi, Peru State College, Peru Nebraska Presentation by Greg Galardi, Peru State College CRC Press,

More information

Physical Science Study Guide Unit 7 Wave properties and behaviors, electromagnetic spectrum, Doppler Effect

Physical Science Study Guide Unit 7 Wave properties and behaviors, electromagnetic spectrum, Doppler Effect Objectives: PS-7.1 Physical Science Study Guide Unit 7 Wave properties and behaviors, electromagnetic spectrum, Doppler Effect Illustrate ways that the energy of waves is transferred by interaction with

More information

Study Guide for Exam on Light

Study Guide for Exam on Light Name: Class: Date: Study Guide for Exam on Light Multiple Choice Identify the choice that best completes the statement or answers the question. 1. Which portion of the electromagnetic spectrum is used

More information

Physics 25 Exam 3 November 3, 2009

Physics 25 Exam 3 November 3, 2009 1. A long, straight wire carries a current I. If the magnetic field at a distance d from the wire has magnitude B, what would be the the magnitude of the magnetic field at a distance d/3 from the wire,

More information

Measuring the Point Spread Function of a Fluorescence Microscope

Measuring the Point Spread Function of a Fluorescence Microscope Frederick National Laboratory Measuring the Point Spread Function of a Fluorescence Microscope Stephen J Lockett, PhD Principal Scientist, Optical Microscopy and Analysis Laboratory Frederick National

More information

UNIVERSITY OF SASKATCHEWAN Department of Physics and Engineering Physics

UNIVERSITY OF SASKATCHEWAN Department of Physics and Engineering Physics UNIVERSITY OF SASKATCHEWAN Department of Physics and Engineering Physics Physics 111.6 MIDTERM TEST #4 March 15, 2007 Time: 90 minutes NAME: (Last) Please Print (Given) STUDENT NO.: LECTURE SECTION (please

More information

Introduction to Optics

Introduction to Optics Second Edition Introduction to Optics FRANK L. PEDROTTI, S.J. Marquette University Milwaukee, Wisconsin Vatican Radio, Rome LENO S. PEDROTTI Center for Occupational Research and Development Waco, Texas

More information

EDS system. CRF Oxford Instruments INCA CRF EDAX Genesis EVEX- NanoAnalysis Table top system

EDS system. CRF Oxford Instruments INCA CRF EDAX Genesis EVEX- NanoAnalysis Table top system EDS system Most common X-Ray measurement system in the SEM lab. Major elements (10 wt% or greater) identified in ~10 secs. Minor elements identifiable in ~100 secs. Rapid qualitative and accurate quantitative

More information

Properties of Electrons, their Interactions with Matter and Applications in Electron Microscopy

Properties of Electrons, their Interactions with Matter and Applications in Electron Microscopy Properties of Electrons, their Interactions with Matter and Applications in Electron Microscopy By Frank Krumeich Laboratory of Inorganic Chemistry, ETH Zurich, Vladimir-Prelog-Weg 1, 8093 Zurich, Switzerland

More information

Electron Microscopy 3. SEM. Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts

Electron Microscopy 3. SEM. Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts Electron Microscopy 3. SEM Image formation, detection, resolution, signal to noise ratio, interaction volume, contrasts SEM is easy! Just focus and shoot "Photo"!!! Please comment this picture... Any idea

More information

C) D) As object AB is moved from its present position toward the left, the size of the image produced A) decreases B) increases C) remains the same

C) D) As object AB is moved from its present position toward the left, the size of the image produced A) decreases B) increases C) remains the same 1. For a plane mirror, compared to the object distance, the image distance is always A) less B) greater C) the same 2. Which graph best represents the relationship between image distance (di) and object

More information

Production of X-rays. Radiation Safety Training for Analytical X-Ray Devices Module 9

Production of X-rays. Radiation Safety Training for Analytical X-Ray Devices Module 9 Module 9 This module presents information on what X-rays are and how they are produced. Introduction Module 9, Page 2 X-rays are a type of electromagnetic radiation. Other types of electromagnetic radiation

More information

Acoustic GHz-Microscopy: Potential, Challenges and Applications

Acoustic GHz-Microscopy: Potential, Challenges and Applications Acoustic GHz-Microscopy: Potential, Challenges and Applications A Joint Development of PVA TePLa Analytical Systems GmbH and Fraunhofer IWM-Halle Dr. Sebastian Brand (Ph.D.) Fraunhofer CAM Fraunhofer Institute

More information

Detailed Alignment Procedure for the JEOL 2010F Transmission Electron Microscope

Detailed Alignment Procedure for the JEOL 2010F Transmission Electron Microscope Detailed Alignment Procedure for the JEOL 2010F Transmission Electron Microscope by Wendy Sarney ARL-MR-603 December 2004 Approved for public release; distribution unlimited. NOTICES Disclaimers The findings

More information

PHOTOELECTRIC EFFECT AND DUAL NATURE OF MATTER AND RADIATIONS

PHOTOELECTRIC EFFECT AND DUAL NATURE OF MATTER AND RADIATIONS PHOTOELECTRIC EFFECT AND DUAL NATURE OF MATTER AND RADIATIONS 1. Photons 2. Photoelectric Effect 3. Experimental Set-up to study Photoelectric Effect 4. Effect of Intensity, Frequency, Potential on P.E.

More information

PHYS 222 Spring 2012 Final Exam. Closed books, notes, etc. No electronic device except a calculator.

PHYS 222 Spring 2012 Final Exam. Closed books, notes, etc. No electronic device except a calculator. PHYS 222 Spring 2012 Final Exam Closed books, notes, etc. No electronic device except a calculator. NAME: (all questions with equal weight) 1. If the distance between two point charges is tripled, the

More information

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture Nanoelectronics 09 Atsufumi Hirohata Department of Electronics 12:00 Wednesday, 4/February/2015 (P/L 006) Quick Review over the Last Lecture ( Field effect transistor (FET) ): ( Drain ) current increases

More information

AS COMPETITION PAPER 2008

AS COMPETITION PAPER 2008 AS COMPETITION PAPER 28 Name School Town & County Total Mark/5 Time Allowed: One hour Attempt as many questions as you can. Write your answers on this question paper. Marks allocated for each question

More information

CALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY

CALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY 243 CALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY B. Chyba, M. Mantler, H. Ebel, R. Svagera Technische Universit Vienna, Austria ABSTRACT The accurate characterization of the spectral distribution

More information

Measurement of Charge-to-Mass (e/m) Ratio for the Electron

Measurement of Charge-to-Mass (e/m) Ratio for the Electron Measurement of Charge-to-Mass (e/m) Ratio for the Electron Experiment objectives: measure the ratio of the electron charge-to-mass ratio e/m by studying the electron trajectories in a uniform magnetic

More information

7. advanced SEM. Latest generation of SEM SEM

7. advanced SEM. Latest generation of SEM SEM 7. advanced SEM SEM Low voltage SE imaging Condition of the surface, coatings, plasma cleaning Low voltage BSE imaging Polishing for BSE, EDX and EBSD, effect of ion beam etching/polishing 1 Latest generation

More information

Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications

Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications Scanning Near Field Optical Microscopy: Principle, Instrumentation and Applications Saulius Marcinkevičius Optics, ICT, KTH 1 Outline Optical near field. Principle of scanning near field optical microscope

More information

Chapter 22: Electric motors and electromagnetic induction

Chapter 22: Electric motors and electromagnetic induction Chapter 22: Electric motors and electromagnetic induction The motor effect movement from electricity When a current is passed through a wire placed in a magnetic field a force is produced which acts on

More information

Diffraction of Laser Light

Diffraction of Laser Light Diffraction of Laser Light No Prelab Introduction The laser is a unique light source because its light is coherent and monochromatic. Coherent light is made up of waves, which are all in phase. Monochromatic

More information

Diffraction and Young s Single Slit Experiment

Diffraction and Young s Single Slit Experiment Diffraction and Young s Single Slit Experiment Developers AB Overby Objectives Preparation Background The objectives of this experiment are to observe Fraunhofer, or far-field, diffraction through a single

More information

Polarization Dependence in X-ray Spectroscopy and Scattering. S P Collins et al Diamond Light Source UK

Polarization Dependence in X-ray Spectroscopy and Scattering. S P Collins et al Diamond Light Source UK Polarization Dependence in X-ray Spectroscopy and Scattering S P Collins et al Diamond Light Source UK Overview of talk 1. Experimental techniques at Diamond: why we care about x-ray polarization 2. How

More information

Ultrasonic Wave Propagation Review

Ultrasonic Wave Propagation Review Ultrasonic Wave Propagation Review Presented by: Sami El-Ali 1 1. Introduction Ultrasonic refers to any study or application of sound waves that are higher frequency than the human audible range. Ultrasonic

More information

Experiment: Crystal Structure Analysis in Engineering Materials

Experiment: Crystal Structure Analysis in Engineering Materials Experiment: Crystal Structure Analysis in Engineering Materials Objective The purpose of this experiment is to introduce students to the use of X-ray diffraction techniques for investigating various types

More information

Ion Beam Sputtering: Practical Applications to Electron Microscopy

Ion Beam Sputtering: Practical Applications to Electron Microscopy Ion Beam Sputtering: Practical Applications to Electron Microscopy Applications Laboratory Report Introduction Electron microscope specimens, both scanning (SEM) and transmission (TEM), often require a

More information

Microscopy. MICROSCOPY Light Electron Tunnelling Atomic Force RESOLVE: => INCREASE CONTRAST BIODIVERSITY I BIOL1051 MAJOR FUNCTIONS OF MICROSCOPES

Microscopy. MICROSCOPY Light Electron Tunnelling Atomic Force RESOLVE: => INCREASE CONTRAST BIODIVERSITY I BIOL1051 MAJOR FUNCTIONS OF MICROSCOPES BIODIVERSITY I BIOL1051 Microscopy Professor Marc C. Lavoie marc.lavoie@cavehill.uwi.edu MAJOR FUNCTIONS OF MICROSCOPES MAGNIFY RESOLVE: => INCREASE CONTRAST Microscopy 1. Eyepieces 2. Diopter adjustment

More information

First let us consider microscopes. Human eyes are sensitive to radiation having wavelengths between

First let us consider microscopes. Human eyes are sensitive to radiation having wavelengths between Optical Differences Between Telescopes and Microscopes Robert R. Pavlis, Girard, Kansas USA icroscopes and telescopes are optical instruments that are designed to permit observation of objects and details

More information

Modern Classical Optics

Modern Classical Optics Modern Classical Optics GEOFFREY BROOKER Department of Physics University of Oxford OXPORD UNIVERSITY PRESS Contents 1 Electromagnetism and basic optics 1 1.1 Introduction 1 1.2 The Maxwell equations 1

More information

Optical Design Tools for Backlight Displays

Optical Design Tools for Backlight Displays Optical Design Tools for Backlight Displays Introduction Backlights are used for compact, portable, electronic devices with flat panel Liquid Crystal Displays (LCDs) that require illumination from behind.

More information

1. You stand two feet away from a plane mirror. How far is it from you to your image? a. 2.0 ft c. 4.0 ft b. 3.0 ft d. 5.0 ft

1. You stand two feet away from a plane mirror. How far is it from you to your image? a. 2.0 ft c. 4.0 ft b. 3.0 ft d. 5.0 ft Lenses and Mirrors 1. You stand two feet away from a plane mirror. How far is it from you to your image? a. 2.0 ft c. 4.0 ft b. 3.0 ft d. 5.0 ft 2. Which of the following best describes the image from

More information

waves rays Consider rays of light from an object being reflected by a plane mirror (the rays are diverging): mirror object

waves rays Consider rays of light from an object being reflected by a plane mirror (the rays are diverging): mirror object PHYS1000 Optics 1 Optics Light and its interaction with lenses and mirrors. We assume that we can ignore the wave properties of light. waves rays We represent the light as rays, and ignore diffraction.

More information

Physics 441/2: Transmission Electron Microscope

Physics 441/2: Transmission Electron Microscope Physics 441/2: Transmission Electron Microscope Introduction In this experiment we will explore the use of transmission electron microscopy (TEM) to take us into the world of ultrasmall structures. This

More information

Optical Standards. John Nichol BSc MSc

Optical Standards. John Nichol BSc MSc Optical Standards John Nichol BSc MSc The following notes are presented to explain: Spherical Aberration The Airy Disk Peak to Valley, RMS and Strehl Ratio Standards of Optics produced by Nichol Optical

More information

Today. next two weeks

Today. next two weeks Today Temporal and spatial coherence Spatially incoherent imaging The incoherent PSF The Optical Transfer Function (OTF) and Modulation Transfer Function (MTF) MTF and contrast comparison of spatially

More information

CREOL, College of Optics & Photonics, University of Central Florida

CREOL, College of Optics & Photonics, University of Central Florida OSE6650 - Optical Properties of Nanostructured Materials Optical Properties of Nanostructured Materials Fall 2013 Class 3 slide 1 Challenge: excite and detect the near field Thus far: Nanostructured materials

More information

Introduction to microstructure

Introduction to microstructure Introduction to microstructure 1.1 What is microstructure? When describing the structure of a material, we make a clear distinction between its crystal structure and its microstructure. The term crystal

More information

Laue lens for Nuclear Medicine

Laue lens for Nuclear Medicine Laue lens for Nuclear Medicine PhD in Physics Gianfranco Paternò Ferrara, 6-11-013 Supervisor: prof. Vincenzo Guidi Sensors and Semiconductors Lab, Department of Physics and Earth Science, University of

More information

How to make a Galileian Telescope

How to make a Galileian Telescope How to make a Galileian Telescope I. THE BASICS THE PRINCIPLES OF OPTICS A Galileian telescope uses just two lenses. The objective lens is convergent (plano-convex), the ocular lens is divergent (plano-concave).

More information

Chapter 6 Telescopes: Portals of Discovery. How does your eye form an image? Refraction. Example: Refraction at Sunset.

Chapter 6 Telescopes: Portals of Discovery. How does your eye form an image? Refraction. Example: Refraction at Sunset. Chapter 6 Telescopes: Portals of Discovery 6.1 Eyes and Cameras: Everyday Light Sensors Our goals for learning:! How does your eye form an image?! How do we record images? How does your eye form an image?

More information

Does Quantum Mechanics Make Sense? Size

Does Quantum Mechanics Make Sense? Size Does Quantum Mechanics Make Sense? Some relatively simple concepts show why the answer is yes. Size Classical Mechanics Quantum Mechanics Relative Absolute What does relative vs. absolute size mean? Why

More information

Crystal Optics of Visible Light

Crystal Optics of Visible Light Crystal Optics of Visible Light This can be a very helpful aspect of minerals in understanding the petrographic history of a rock. The manner by which light is transferred through a mineral is a means

More information

Chapter 14 High Resolution TEM

Chapter 14 High Resolution TEM Chapter 14 High Resolution TEM K. Ishizuka (1980) Contrast Transfer of Crystal Images in TEM, Ultramicroscopy 5,pages 55-65. L. Reimer (1993) Transmission Electron Microscopy, Springer Verlag, Berlin.

More information

WAVELENGTH OF LIGHT - DIFFRACTION GRATING

WAVELENGTH OF LIGHT - DIFFRACTION GRATING PURPOSE In this experiment we will use the diffraction grating and the spectrometer to measure wavelengths in the mercury spectrum. THEORY A diffraction grating is essentially a series of parallel equidistant

More information

6) How wide must a narrow slit be if the first diffraction minimum occurs at ±12 with laser light of 633 nm?

6) How wide must a narrow slit be if the first diffraction minimum occurs at ±12 with laser light of 633 nm? Test IV Name 1) In a single slit diffraction experiment, the width of the slit is 3.1 10-5 m and the distance from the slit to the screen is 2.2 m. If the beam of light of wavelength 600 nm passes through

More information

Code number given on the right hand side of the question paper should be written on the title page of the answerbook by the candidate.

Code number given on the right hand side of the question paper should be written on the title page of the answerbook by the candidate. Series ONS SET-1 Roll No. Candiates must write code on the title page of the answer book Please check that this question paper contains 16 printed pages. Code number given on the right hand side of the

More information

2) A convex lens is known as a diverging lens and a concave lens is known as a converging lens. Answer: FALSE Diff: 1 Var: 1 Page Ref: Sec.

2) A convex lens is known as a diverging lens and a concave lens is known as a converging lens. Answer: FALSE Diff: 1 Var: 1 Page Ref: Sec. Physics for Scientists and Engineers, 4e (Giancoli) Chapter 33 Lenses and Optical Instruments 33.1 Conceptual Questions 1) State how to draw the three rays for finding the image position due to a thin

More information

Advancements in High Frequency, High Resolution Acoustic Micro Imaging for Thin Silicon Applications

Advancements in High Frequency, High Resolution Acoustic Micro Imaging for Thin Silicon Applications Advancements in High Frequency, High Resolution Acoustic Micro Imaging for Thin Silicon Applications Janet E. Semmens Sonoscan, Inc. 2149 E. Pratt Boulevard Elk Grove Village, IL 60007 USA Phone: (847)

More information

Imaging techniques with refractive beam shaping optics

Imaging techniques with refractive beam shaping optics Imaging techniques with refractive beam shaping optics Alexander Laskin, Vadim Laskin AdlOptica GmbH, Rudower Chaussee 29, 12489 Berlin, Germany ABSTRACT Applying of the refractive beam shapers in real

More information

Coating Technology: Evaporation Vs Sputtering

Coating Technology: Evaporation Vs Sputtering Satisloh Italy S.r.l. Coating Technology: Evaporation Vs Sputtering Gianni Monaco, PhD R&D project manager, Satisloh Italy 04.04.2016 V1 The aim of this document is to provide basic technical information

More information

X-Rays and Magnetism From Fundamentals to Nanoscale Dynamics

X-Rays and Magnetism From Fundamentals to Nanoscale Dynamics X-Rays and Magnetism From Fundamentals to Nanoscale Dynamics Joachim Stöhr Stanford Synchrotron Radiation Laboratory X-rays have come a long way 1895 1993 10 cm 10 µm 100 nm Collaborators: SSRL Stanford:

More information

Chapter 13 Confocal Laser Scanning Microscopy C. Robert Bagnell, Jr., Ph.D., 2012

Chapter 13 Confocal Laser Scanning Microscopy C. Robert Bagnell, Jr., Ph.D., 2012 Chapter 13 Confocal Laser Scanning Microscopy C. Robert Bagnell, Jr., Ph.D., 2012 You are sitting at your microscope working at high magnification trying to sort out the three-dimensional compartmentalization

More information

v = fλ PROGRESSIVE WAVES 1 Candidates should be able to :

v = fλ PROGRESSIVE WAVES 1 Candidates should be able to : PROGRESSIVE WAVES 1 Candidates should be able to : Describe and distinguish between progressive longitudinal and transverse waves. With the exception of electromagnetic waves, which do not need a material

More information

A-level PHYSICS (7408/1)

A-level PHYSICS (7408/1) SPECIMEN MATERIAL A-level PHYSICS (7408/1) Paper 1 Specimen 2014 Morning Time allowed: 2 hours Materials For this paper you must have: a pencil a ruler a calculator a data and formulae booklet. Instructions

More information

TOF FUNDAMENTALS TUTORIAL

TOF FUNDAMENTALS TUTORIAL TOF FUNDAMENTALS TUTORIAL Presented By: JORDAN TOF PRODUCTS, INC. 990 Golden Gate Terrace Grass Valley, CA 95945 530-272-4580 / 530-272-2955 [fax] www.rmjordan.com [web] info@rmjordan.com [e-mail] This

More information

ME 472 Engineering Metrology

ME 472 Engineering Metrology ME 472 Engineering Metrology and Quality Control Chp 6 - Advanced Measurement Systems Mechanical Engineering University of Gaziantep Dr. A. Tolga Bozdana Assistant Professor Coordinate Measuring Machines

More information

Radiographic Grid. Principles of Imaging Science II (RAD 120) Image-Forming X-Rays. Radiographic Grids

Radiographic Grid. Principles of Imaging Science II (RAD 120) Image-Forming X-Rays. Radiographic Grids Principles of Imaging Science II (RAD 120) Radiographic Grids 1 Image-Forming X-Rays Four X-ray paths a. X-rays interact with patient and scatter away from the receptor b. X-rays interact and are absorbed

More information

Chapter NP-5. Nuclear Physics. Nuclear Reactions TABLE OF CONTENTS INTRODUCTION OBJECTIVES 1.0 NUCLEAR REACTIONS 2.0 NEUTRON INTERACTIONS

Chapter NP-5. Nuclear Physics. Nuclear Reactions TABLE OF CONTENTS INTRODUCTION OBJECTIVES 1.0 NUCLEAR REACTIONS 2.0 NEUTRON INTERACTIONS Chapter NP-5 Nuclear Physics Nuclear Reactions TABLE OF CONTENTS INTRODUCTION OBJECTIVES 1.0 2.0 NEUTRON INTERACTIONS 2.1 ELASTIC SCATTERING 2.2 INELASTIC SCATTERING 2.3 RADIATIVE CAPTURE 2.4 PARTICLE

More information

CASINO V2.42 A Fast and Easy-to-use Modeling Tool for Scanning Electron Microscopy and Microanalysis Users

CASINO V2.42 A Fast and Easy-to-use Modeling Tool for Scanning Electron Microscopy and Microanalysis Users SCANNING VOL. 29, 92 11 (27) Wiley Periodicals, Inc. CASINO V2.42 A Fast and Easy-to-use Modeling Tool for Scanning Electron Microscopy and Microanalysis Users DOMINIQUE DROUIN 1,ALEXANDRE RÉAL COUTURE

More information

The Wide Field Cassegrain: Exploring Solution Space

The Wide Field Cassegrain: Exploring Solution Space The Wide Field Cassegrain: Exploring Solution Space Peter Ceravolo Ceravolo Optical Systems www.ceravolo.com peter@ceravolo.com Abstract This article illustrates the use of an internal aperture stop in

More information

Chapter 2 ELECTRON OPTICS. 2.1 Properties of an Ideal Image

Chapter 2 ELECTRON OPTICS. 2.1 Properties of an Ideal Image Chapter 2 ELECTRON OPTICS Chapter 1 contained an overview of various forms of microscopy, carried out using light, electrons, and mechanical probes. In each case, the microscope forms an enlarged image

More information

Introduction to the Scanning Electron Microscope

Introduction to the Scanning Electron Microscope Introduction to the Scanning Electron Microscope Theory, Practice, & Procedures Prepared by Michael Dunlap & Dr. J. E. Adaskaveg Presented by the FACILITY FOR ADVANCED INSTRUMENTATION, U. C. Davis 1997

More information

Experimental and modeling studies of imaging with curvilinear electronic eye cameras

Experimental and modeling studies of imaging with curvilinear electronic eye cameras Experimental and modeling studies of imaging with curvilinear electronic eye cameras Viktor Malyarchuk, 1 Inhwa Jung, 1 John A. Rogers, 1,* Gunchul Shin, 2 and Jeong Sook Ha 2 1 Department of Materials

More information

Information about the T9 beam line and experimental facilities

Information about the T9 beam line and experimental facilities Information about the T9 beam line and experimental facilities The incoming proton beam from the PS accelerator impinges on the North target and thus produces the particles for the T9 beam line. The collisions

More information

The promise of ultrasonic phased arrays and the role of modeling in specifying systems

The promise of ultrasonic phased arrays and the role of modeling in specifying systems 1 modeling in specifying systems ABSTRACT Guillaume Neau and Deborah Hopkins This article illustrates the advantages of phased-array systems and the value of modeling through several examples taken from

More information

British Journal of Science 43 September 2012, Vol. 6 (2) Study of the Objective Focal Properties for Asymmetrical Double Polepiece Magnetic Lens

British Journal of Science 43 September 2012, Vol. 6 (2) Study of the Objective Focal Properties for Asymmetrical Double Polepiece Magnetic Lens British Journal of Science 43 Study of the Objective Focal Properties for Asymmetrical Double Polepiece Magnetic Lens Talib M. Abbass 1 and Ban A. Nasser 2 1 Department of Physics, College of Education

More information

Confocal Microscopy and Atomic Force Microscopy (AFM) A very brief primer...

Confocal Microscopy and Atomic Force Microscopy (AFM) A very brief primer... Confocal Microscopy and Atomic Force Microscopy (AFM) of biofilms A very brief primer... Fundamentals of Confocal Microscopy Based on a conventional fluorescence microscope Fluorescent Microscope Confocal

More information

Bio 321 Lightmicroscopy Electronmicrosopy Image Processing

Bio 321 Lightmicroscopy Electronmicrosopy Image Processing Bio 321 Lightmicroscopy Electronmicrosopy Image Processing Urs Ziegler Center for Microscopy and Image Analysis Light microscopy (Confocal Laser Scanning Microscopy) Light microscopy (Confocal Laser Scanning

More information

ATOMIC SPECTRA. Apparatus: Optical spectrometer, spectral tubes, power supply, incandescent lamp, bottles of dyed water, elevating jack or block.

ATOMIC SPECTRA. Apparatus: Optical spectrometer, spectral tubes, power supply, incandescent lamp, bottles of dyed water, elevating jack or block. 1 ATOMIC SPECTRA Objective: To measure the wavelengths of visible light emitted by atomic hydrogen and verify the measured wavelengths against those predicted by quantum theory. To identify an unknown

More information