Packaging. Presented By Siddhartha Sen, IIT Kharagpur Under the Guidance of : Prof. A. Dasgupta

Transcription

1 Packaging Presented By Siddhartha Sen, IIT Kharagpur Under the Guidance of : Prof. A. Dasgupta

2 Topics Functions of the Package Different Kinds of Packages Rent s Rule VLSI Assembly Technology System on Chip versus System in Package 3 D Packaging Chip on Chip (CoC) Electrical Performance Thermal Management Common Failure Mechanisms and Reliability Future Trends Packaging

3 Functions of the Package - I Packages shut out damaging external influences like Moisture, Dust, Vibration, Shock, Lightning, Magnets, etc and serve to protect silicon chips. Lead frame allows electrical signals to be sent and received to and from semiconductor devices. Packaging - 1

4 Functions of the Package -II Packages effectively release the heat generated by the chip during its operation. Packages allow for enlargement of terminals size that makes the chips much easier to handle. Packaging - 2

5 Types of Packages Though a wide variety of packages can be used for VLSI devices, they can be broadly divided into two basic types: Hermetic Ceramic Packages: The chip resides in an environment decoupled from the external environment by a vacuum tight enclosure. The packages are usually designed for high performance applications that allow some cost penalties Plastic Packages: The chip is not completely decoupled from the external environment because it is encapsulated with resin materials, typically epoxy based resins. They are extremely cost competitive and their popularity persists because of rapid advances in plastic technology Packaging - 3

6 Types of Packages (Hermetic Packages) The chip resides in a Chip cavity of the package. Seal Ring Package base material is ceramic usually Al203 or AlN. The chip and the package are connected by fine Al wire. Hermetic sealing is Leads completed by a cap, Traces usually ceramic or metal, lidded to the A Typical Hermetic Package package. Packaging - 4

7 Types of Packages (Plastic Packages) The chip is attached to the package of the lead frame. The frame is made of etched or stamped thin metal( usually Fe-Ni or Cu alloys). Interconnections are made by fine gold wire. Encapsulation is carried out by Transfer-molding using epoxy resin. Spot Plate Molding Material Chip Support Paddle Bond Wires Packaging - 5

8 Types of Packages (PWB level) Packaging - 6

9 Rent s Rule Rent s Rule is an empirical relationship between the gate count and the I/O (Terminal) Count in a Chip. Number (I/O Count ) = α (Number of gates) β Typically: α = 4.5 β = 0.5 Prediction Microprocessors Logic Array DRAM Memory : 1 Kbits 1024 Kbits Microprocessors : 4 32 bits Gate Arrays : 50 16K gates Packaging - 7

10 VLSI Assembly Technologies Wafer Solder Preform Polymer Adhesive Al wire / Au wire Conformal Coating Wafer Preparation Die Bonding Die Interconnection Molding Wafer Backgrinding Die Preparation Adhesive Die Bonding Eutectic Die Bonding Wire Bonding, TAB, Flip Chip Transfer molding Metal Preform Polymer Seal Molding Compound Package Seal Marking DTFS Packaging - 8 Ink Marking Laser Marking Deflash-Trim-Form- Singulate

11 Wafer Backgrinding Wafer Backgrind is the process of grinding the backside of the wafer to the correct wafer thickness prior to assembly. Wafers normally undergo a cleaning and surface lamination process prior to the actual backgrinding process. The grinding wheel parameters are: speed, spindle coolant water temperature and flow rate, initial and final wafer thickness, and feed speeds. Continuous washing of the wafer is also done during the backgrinding process to remove debris. Packaging - 9

12 Die Preparation Wafer Mounting: frame loading, wafer loading, application of tape to the wafer and wafer frame, cutting of the excess tape and unloading of the mounted wafer Wafer Saw: alignment, cutting by resin-bonded diamond wheel, cleaning Wafer mounted on wafer frames Wafer Films Packaging - 10 Wafer Saw Blades

13 Die Bonding Die Bonding is the process of attaching the silicon chip to the die pad or die cavity of the support structure. Adhesive Die Attach: Uses adhesives such as polyimide, epoxy and silver-filled glass as die attach material Eutectic Die Attach: Uses a eutectic alloy to attach the die to the cavity. The Au-Si eutectic alloy is the most commonly used Packaging - 11 D/A adhesive as the grainy material between the die and die pad Normal Eutectic Die Attach and with Balling

14 Die Interconnection: Wire Bonding The wire is generally made up of one of the following: Gold Aluminum Copper There are two main classes of wire bonding: Ball bonding Wedge bonding Packaging - 12 Wire Bonds

15 Wire Bonding (Ball-Bonding) A gold ball is first formed by melting the end of the wire. The free-air ball brought into contact with the bond pad, adequate amounts of pressure, heat, and ultrasonic forces are then applied. The wire is then run to the corresponding finger of the leadframe, forming a gradual arc or "loop" between the bond pad and the leadfinger. Packaging - 13 The 1 st Bond The 2 nd Bond Gold wire ball-bonded to a gold contact pad

16 Wire Bonding (Wedge Bonding) A clamped wire is brought in contact with the bond pad. Ultrasonic energy and pressure are applied. The wire is then run to the corresponding lead finger, and again pressed. The second bond is again formed by applying ultrasonic energy to the wire. Packaging st Wedge Bond Aluminum wires wedge-bonded

17 Die Interconnection: Flip Chip The term Flip-chip refers to an electronic component or semiconductor device that can be mounted directly onto a substrate, board, or carrier in a face-down manner. Electrical connection is achieved through conductive bumps built on the surface of the chips, which is why the mounting process is facedown in nature. Flip Chip Bumps Packaging - 15

18 Flip Chip - Advantages Smallest Size reduces the required board area by up to 95% requires far less height Highest Performance reduces the delaying inductance and capacitance of the connection by a factor of 10 highest speed electrical performance of any assembly method Most Rugged Lowest Cost Packaging - 16

19 Tape Automated Bonding (TAB) A process that places bare chips onto a printed circuit board (PCB) by attaching them to a polyimide film. The film is moved to the target location, and the leads are cut and soldered to the board. The bare chip is then encapsulated ("glob topped") with epoxy or plastic. Packaging - 17

20 Molding Molding is the process of encapsulating the device in plastic material. Transfer molding is one of the most widely used molding processes in the semiconductor industry. The cavities are filled up in a 'Christmas tree' fashion - The highest filling velocity is experienced by the first cavity. Subsequent cavities are filled with increasing velocities until the last cavity, which ends up with the second highest filling velocity. Wiresweeping and die paddle Mold Chases Examples of Molds Packaging - 18

21 Package Sealing Sealing is the process of encapsulating a hermetic package, usually by capping or putting a lid over the base or body of the package. The method of sealing is generally dependent on the type of package. Ceramic DIPs, or cerdips, are sealed by topping the base of the package with a cap using seal glass. Seal glass, like any glass, is a supercooled liquid which exhibits tremendous viscosity when cooled below its glass transition temperature. A seal glass may be classified as vitreous or Devitrifying. Packaging - 19

22 Marking Marking is the process of putting identification, traceability, and distinguishing marks on the package of an IC. The most common Ink marking process for semiconductor products is Pad printing. Pad printing consists of transferring an ink pattern from the plate, which is a flat block with pattern depressions that are filled with ink, to the package, using a silicone rubber stamp pad. Laser marking refers to the process of engraving marks on the marking surface using a laser beam. There are many types of lasers, but the ones used or in use in the semiconductor industry include the CO2 laser, the YAG laser, and diode lasers. Packaging - 20

23 Deflash/Trim/Form/Singulation (DTFS) 1. Deflash - removal of flashes from the package of the newly molded parts. Flashes are the excess plastic material sticking out of the package edges right after molding. 2. Trim - cutting of the dambars that short the leads together. 3. Form - forming of the leads into the correct shape and position. 4. Singulation - cutting of the tie bars that attach the individual units to the leadframe, resulting in the individual separation of each unit from the leadframe. Packaging - 21

24 System on Chip ( SoC ) versus System in Package (SiP) SoC is a technology that allows a system to be built on one silicon chip (bare chip). SiP is a package technology that combines a multiple number of readymade chips (such as logic and memory) and encases them in one package as one system. Packaging - 22

25 SiP Categories Packaging - 23

26 3D Packaging: Introduction The driving forces are the significant size and weight reductions, higher performance, small delay, higher reliability and reduced power. 3 D Packages score over conventional packages in: Size and Weight Silicon Efficiency Interconnect Usability and Accessibility Delay Noise Power Consumption Speed Packaging - 24 Four-die stack including two spacers

27 3D Packaging Types of 3D Packages Stacked Die Packages: Consists of bare die stacked and interconnected using wire bond and flip-chip connections in one standard CSP Stacked-Packages: consist of stacked, pre-tested packages or a mix of KGD and packages. These are interconnected using wire bond, flip chip or solder balls on one CSP They can be: Package-in-Package (PiP) Package-on-Package (PoP) PiP structure with 4 stacks PoP structure with 4 stacks Packaging - 25

28 3 D Packaging: Advantages - I The shift from conventional single chip packages to 3D technology, leads to substantial size and weight reductions: Volume ( in cm 3 / Gbit ) Type Capacity Discrete Planar 3D Discrete/3D Planar/3D SRAM 1 Mbit DRAM 1 Mbit Mass ( in grams / Gbit ) Type Capacity Discrete Planar 3D Discrete/3D Planar/3D SRAM 1 Mbit DRAM 1 Mbit Packaging - 26

29 3 D Packaging: Advantages - II Increase in Silicon Efficiency. Interconnect Usability and Accessibility. Packaging - 27

30 3 D Packaging: Advantages - III Delay Reduction Noise Reduction Power Reduction Speed Increase Packaging - 28

31 3 D Packaging: Limitations There are trade-offs which need to be taken into account when using 3D technology in system design: Thermal Management Design complexity Cost Time to Delivery Design Software Packaging - 29

32 Electrical Considerations: Introduction The choice of a package for an integrated circuit depends on the electrical and thermal conditions under which the chip is expected to operate. In other words, the package must satisfy a set of electrical and thermal requirements formulated for the application at hand. The electrical operating conditions of an integrated circuit can be viewed as consisting of two distinct environments: one for Signals and another for Power. The requirements for these environments are substantially different. Packaging - 30

33 Electrical Considerations: The Signal Environment The signal's electrical environment is the arrangement of conductors and dielectrics. Electrically, each segment of this path represents a transmission line with certain characteristic impedance and time delay. Also involved are the inductances of the bond wires and package pins. Usually, the leads are not of controlled impedance and each possesses substantial inductance and capacitance. Relatively strong inductive and capacitive coupling (M and C) exist between the leads. The major issues in the signal environment are Signal Delay, Signal Reflection and Noise Reduction. Packaging - 31

34 Electrical Considerations: The Signal Environment Signal Delay High speed operation requires lower interconnect delays. The maximum achievable operating frequency is obviously the inverse of the critical delay path. In package construction, a short signal line (bonding wire length plus lead length) in small dielectric material, typically polyimide resin, is preferable. An excessively small dielectric constant of the surrounding material, however induces signal reflections that degrade operating speed. Packaging - 32

35 Electrical Considerations: The Signal Environment Signal Reflection: Mismatched impedances cause signal reflections when a signal is transmitted via a transmission line. The transmission line character cannot be ignored when the signal lines are long l < v c 0 εr Stripline conductor Multilayered packages like stripline structures and microstrip structures provide better impedance matching Microstrip conductor Packaging - 33

36 Electrical Considerations: The Signal Environment Noise: The two kinds of noise of importance are Cross-Talk noise and Simultaneous switching noise: Cross Talk Noise: Line is undesirably affected by another line due to electromagnetic coupling Simultaneous Switching Noise: Occurs when many output buffers switch simultaneously Cross Talk on Adjacent Lines Tx Line Simultaneous Switching Noise Packaging - 34

37 Electrical Considerations: The Power Environment Inductances in the power circuit cause instability of the potentials at the power and ground terminals of the chip: Power Supply Droop Ground Bounce Packaging - 35

38 Electrical Considerations The Desirable Electrical Characteristics: Low ground resistance (minimum power supply voltage drop) Minimum Self Inductance of signal leads (short signal leads) Minimum power supply spiking due to simultaneous switching of signal lines. Minimum Mutual Inductance and Cross Talk (short paralleled signal runs) Minimum Capacitive loading (short signal runs near a ground plane) Maximum use of Matched Impedances (avoid signal reflection) Packaging - 36

39 Thermal Management Efficient and cost-effective removal of dissipated thermal energy from the device to assure its reliable performance over the long term. Effects of Increasing Temperatures: Device physics is strongly influenced by the junction temperature Corrosion and interfacial diffusion mechanisms Approximately a 10 C increase in temperature reduces the mean time to failure by a factor of two Packaging - 37

40 Thermal Management (Thermal Resistance) The internal temperature (called junction temperature) is equal to the ambient temperature plus an offset proportional to the internal power dissipation P. It is given by: T junction = T ambient + θ JA.P The constant of proportionality θ JA is called the thermal resistance Current Trends: The total power is going up due to improper scaling, higher packing density, and lower chip size Maximum ambient being as high as 60 C Maximum junction temperatures from 105 C to 65 C The total thermal resistance of the package must decrease: θ JA = θ JC + θ CA Packaging - 38

41 Thermal Management A Simplified Heat transfer model: Heat is transferred from the chip to the surface of the package by conduction and from the package to the ambient by convection and radiation: T c T a Thermal Convection & Radiation Conduction T j θ JA = θ JC + θ CA = ((T j -T c ) + (T c -T a ))/P θ JC is mainly a function of package materials and geometry θ CA depends on package geometry, the package orientation and conditions of ambient. Packaging - 39 Chip PWB Simplified Heat Transfer Model of a packaged chip

42 Thermal Considerations Conduction dominates heat transfer from chip to package surface. One Dimensional Fourier s equation gives: In the actual package: Thus we have: Q = (T 1 T 2 )*κ*(s/l) P = (T j T c )*κ*(s/l) θ JC = (T j T c )/P = L/(κ*S) VLSI packages have a high packing density (small S) so high thermal conductivity components such as Cu alloys lead frames, AlN substrates and thermo-conductive molding compounds are particularly important as they increase overall package κ value. Thinner packages (low L) are also important. Packaging - 40

43 Thermal Considerations Convection: Heat transfer from the package surface to the ambient results mostly from convection, given by Newton s Cooling Law: Q = h*a*(t c T a ) Therefore: θ CA = (T c T a )/P = 1/(h*A) θ CA is reduced through increased conduction and larger package surface area. The application system constructions are forced air convections, liquid coolants in place of air coolings and additional heat sinks attached to the package surface. Packaging - 41

44 Thermal Considerations Radiation helps transfer some heat from the package surface to the ambient, but usually the contribution is small. According to Stefan-Boltzmann Law: E b = ε*σ*t 4 The heat radiated is: Q = σ*f*a*(t 1 4 T 24 ) Where f is given by: f = 1/((1/ε 1 )+(1/ε 2 )-1) When T 1 -T 2 <<T 1 & T 1 -T 2 <<T 2, then with T m =(T 1 +T 2 )/2, we can obtain: Q = 4*σ*f*T m3 *A*(T 1 -T 2 ) = h*r*a*(t 1 -T 2 ) Therefore: θ rad = (T 1 -T 2 )/Q = 1/(h*r*A) In actual applications black dyed packages and external heat sinks are preferred since they increase hr values Packaging - 42

45 Thermal Management: Thermal Profiles In the thermal design and characterization of device packages, it is often necessary to know the temperature profiles for known power dissipation and boundary conditions. Further, this information may be needed for steady state and transient conditions. Computer-based software are most extensively used in this area. Experimental methods are also used. Packaging - 43

46 Common Failure Mechanisms and Reliability Tests 1. Chip Crack: Occurrence of fracture anywhere in the die Major Causes: TCE mismatch of components Operation to note: Chip Bonding Test Type: Temperature Cycling Typical Conditions: - 65 C C Packaging - 44

47 Common Failure Mechanisms and Reliability Tests 2. Wire Liftoff: Includes Ball Bond Lifting and Wedge Bond Lifting Major Causes: poor bonding, Bonding pad contamination Operation to Note: Wire Bond Test Type: High Temperature Storage Test Conditions: 150 C C Packaging - 45 Ball Bond Lifting Contaminated Bond Pads Cratered Bond Pad

48 Common Failure Mechanisms and Reliability Tests 3. Wire Break: Breakage along the span of the wire Major Causes: Poor Bonding, Stress from molding resin Operation to note: Wire Bonding Test Type: Temperature Cycling, Vibration Typical Conditions: - 65 C 150 C Packaging - 46

49 Common Failure Mechanisms and Reliability Tests 4. Malfunction: Non-conformance to electrical specifications due to component degradation caused by stresses on the die surface Major Causes: TCE mismatch of components Operation to note: Chip Bonding Encapsulation Test Type: PCT with bias, Operating Life Typical Conditions: 130 C, 85%, 7V; 125 C, 7V Packaging - 47

50 Future Trends Package Pin Count will undoubtedly continue to increase with IC complexity. Alumina Ceramic Packages will continue to dominate high performance VLSI packaging technologies until their high dielectric constant,modest thermal conductivity or cost force a change. Plastic Packages, specially posttransfer-mold plastic packages will continue to dominate low cost VLSI packaging. Higher Packaging density on the PWB level will drive towards smaller lead pitches, to approximately 0.3 mm spacings. Wire Bonding will be seriously challenged and will be replaced by TAB and Flip Chip. System design will increasingly depend on systematically optimizing the entire interconnection scheme to achieve the potential benefits of improved silicon capability. The approach for MultiChip Modules verifies this trend. Packaging - 48

51 Packaging - 49