# Basic Logic Circuits

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1 Basic Logic Circuits Required knowledge Measurement of static characteristics of nonlinear circuits. Measurement of current consumption. Measurement of dynamic properties of electrical circuits. Definitions related to logic circuits. Aim of the measurement Measurement of typical properties and features of Logic circuits using TTL and CMOS inverters: Measurement of static properties like voltage transfer characteristic, load dependence of output voltage levels etc. Dynamic characteristic like delays, rise time, fall time etc. Comparison of measurement data against data sheet data. Measurements of Flip-flop properties (truth table, setup and hold time). Keywords basic logic circuits, TTL, CMOS, voltage transfer characteristic, voltage levels, delays, rise time, fall time, setup time, hold time. Introduction Basic logic functions like AND, OR, XOR can be realized in many ways. In the first electronic devices relays and vacuum tubes were used for this purposes. In 1947 the transistor was invented at Bell Laboratories. This resulted in solid state switching, that is much faster and more reliable than relays. Therefore enabled the creation of complex logic functions in small chips. In 1958 the first integrated circuits were invented. One of the simplest integrated ICs are the basic logic circuits. Many logic gate types are produced as individual components, each of them are containing one or more related basic logical functions, which could be used as building-blocks to create systems or to interconnect complex integrated circuits. There are many types of logic circuits families depended on their properties and technologies (RTL, DCTL, TTL, CMOS, ECL etc.). 1

2 Laboratory exercises 1. The aim of this laboratory is to introduce the typical properties and features of two widespread logic families the TTL (Transistor-Transistor Logic), and the CMOS (Complementary Metal Oxide Semiconductor logic). Although the use of the TTL family is reduced in the past years, but the fundamental terms like rise-time, transfer characteristics, and their dependencies on environmental conditions can be learned easily by measuring these devices. The Logic gate ICs used in the measurements are non ideal ones, which can cause problems in real systems, the measurements will show examples of these non ideal features of logic gates. The terms learned here can also be used in the applications of complex devices like microcontrollers and FPGAs (Field Programmable Gate Array). Fundamental terms The data sheet of an integrated circuit contains many information, for example: operating conditions (timing, worst case values, static electrical characteristics etc.) absolute maximum ratings (over these limits the ICs is subject to damage) Packaging and mechanical information (pin outs, and packet dimensions) The properties above are vital for using the ICs appropriately, therefore we have to understand the meaning of the most important terms. Logic voltage levels In digital circuits, the binary logic levels of 0 (Low) and 1 (High) are represented by the voltage difference range between the signal and ground. The range of voltage levels that represents the binary level of 0 or 1 depends on the logic family being used. The range tolerances of voltage levels are depend on whether they are representing an input or an output. The tolerances are stricter for output voltage levels comparing to the input levels (Figure 9-1.), due to the noises that can effect the signal on the rute between the outputs and the inputs. The data sheets usually contains the worst case situations of logic voltage levels like U Hmin and U Lmax. For example the traditional TTL logic family has the following voltage levels U Hmin = 2.0 V, U Lmax = 0.8 V for the inputs, and U Hmin = 2.4 V, U Lmax = 0.4 V for the outputs. The 5 V CMOS logic families usually has the following logic voltage levels: U Hmin = 3.85 V, U Lmax = 1.35 V for inputs, and U Hmin = 4.9 V, U Lmax = 0.1 V for outputs. 2 Figure 9 1.: Logic voltage levels

3 Basic logic circuits Transfer characteristic Voltage transfer characteristic represents how the output voltage changes depending on the input voltage. If there are more than one inputs in the system, then the voltage transfer characteristic can be specified and measured for every inputs individually. In this case the inputs not used for the measurement should be held in a static Low or High state. Rise time, Fall time, delays Rise time: the time interval for an output waveform to rise from 10% to 90% of its total amplitude (Figure 9 2.). Fall time: time interval for an output waveform to fall from 90% to 10% of its total amplitude (Figure 9 2.). Switching point: The point on the characteristic where the input voltage equals to the output voltage is called switching point. The logic gates interpret the voltage levels below the switching point as logic Low or 0, above the switching point as logic High or 1. Delay, gate delay: The time interval from the change of the input signal to the change of the output signal. The gate delay is ideally measured between the switching point of the input and the output. This point for the SN74, SN74S, SN74F family of ICs is 1.5 V, for the SN74LS, SN74 AS, SN74ALS family of ICs the switching point is 1.3 V. The switching points of the CMOS ICs are usually hard to specify therefore U Hmin or U Lmax is used instead. In practice the gate delay measurement is made between the 50% level of the input waveform to the 50% level of the output waveform. There are differences between the High to Low and Low to High gate delay times, therefore both of them should be measured (Figure 9 3). Figure 9 2.: Fall and Rise time 3

4 Laboratory exercises 1. Figure 9 3.: Gate delay Load driving ability (FAN OUT) Load driving ability of a digital output is the highest current, where the output is able to work in the guaranteed voltage level ranges. For logic gates the load driving ability is usually specified as fan-outs. The maximum fan-out of an output is the greatest number of inputs of gates of the same type to which the output can be safely connected. Setup time, hold time, propagation delay for Flip-Flops Setup time: is the minimum amount of time the synchronous data signal line should be held steady before the clock event. The setup time is used to ensure the reliable sampling of the data. Hold time: is the minimum amount of time the synchronous data signal should be held steady after the clock event. The hold time is used to ensure the reliable sampling of the data. Propagation delay: is the time a flip-flop needs to change its output after the sampling clock edge. There are differences between the High to Low and Low to High propagation delays. Temperature dependency Logical circuit s operation parameters are temperature depended. In the case of TTL ICs the base to emitter voltage of transistors are depend on temperature, therefore the output high level and the switching point are also temperature dependent (in a few mv/ ºC range). The temperature dependency of the propagation time in not too significant, maximum 10% in the normal operation range. In the case of CMOS ICs the switching point is not really temperature dependent, but their propagation delay has about a 0.3%/ºC temperature dependency, therefore at high temperatures the propagation time of a CMOS IC can be 20% to 30% higher than at room temperature. 4

6 Laboratory exercises 1. Figure 9 4.: TTL NAND gate Figure 9 5. presents the transfer characteristic of the TTL NAND gate where both of the inputs change from Logic low to logic High. U out [V] U in [V] ábra: A TTL alapkapu transzfer karakterisztikája.

7 Basic logic circuits In the I. phase both T2 and T3 is at off state, T4 is at on state. The output voltage at this time is about 3.6V due to T4 and D3. At phase II. T2 is switch to on, but T3 is still at off state, therefore the output voltage start to drop. At phase III. T3 also switch on and performs like an push-pull amplifier and drops the output voltage much faster. The phase III. occurs at the switching point, which is about 1.4V at a normal TTL gate. At phase IV. T3, T2 is at on state and saturating and T4 is at off state at this point the output voltage is about 0.2V. CMOS family The first series of CMOS devices the CD4000A is entered the market in The CMOS series has a very low power consumption but are also very slow ones. The next CS4000B series has a delay about 100ns. Due to the improvement of technology a faster CMOS series the 74HC (High-speed CMOS) is come out with a delay about 10ns. The logic voltage levels of the CMOS ICs are significantly different to the TTL series. For example the output minimal high voltage of the CMOS series is the 70% of the Vcc, which is 3.5V with high load in a 5V system, and this is lower than the TTL gates minimum input high voltage what is 3.6V. Therefore the CMOS and TTL series cannot be mixed in one system. To solve this problem the TTL compatible CMOS series the 74HCT had been developed. In the 74HCT series the switching point is lowered to 1.4V from 2.5V to be compatible with the TTL standard. At the later period higher speed CMOS lines were introduced the 74AC (Advanced highspeed CMOS) and the 74ACT (Advanced high-speed, TTL compatible) series. Typical design and implementation problems Power consumption and latch-up The power consumption of the TTL and CMOS series are very different. The CMOS series at a static state has a nearly zero power consumption, but during switching (output voltage level change high to low, or low to high) this increase significantly. The TTL series has a relatively high static current, and it also has a significant current peak at the low to high output transition, which can emit noise to the low voltage power line. Therefore the power input should be filtered with a 100nF capacitor (also recommended for CMOS series ICs). CMOS series ICs has a vulnerability called latch-up (any CMOS series ICs not just logic gates). If a voltage level higher than the power supply plus a diode voltage or lower to the reference ground minus a diode voltage is connected to an input, or a very fast transient is happened on an input line, there is a chance for damaging the CMOS IC due to triggering its parasitic structure. Delays, hazards In a complex system signals can be delayed due to many causes, there are long tracks, logic ICs and other sources of delays. In case of multiple signals the delay of the lines most likely won t be the same, which can cause problems called hazards. Hazards are manifestations of a problem in which changes in the input variables do not change the output correctly which results in an ill performing functionality. 7

8 Laboratory exercises 1. A static hazard is the situation, when one input variable changes, while the output should stay in the previous state, but it also change for a short duration. The situation where the change of an input cause multiple transitions at the output for a short duration before stabilization is called a dynamic hazard. Functional hazards are non-solvable hazards which occur when more than one input variables change at the same time (actually the source of the problem is that this change cannot be done exactly at the same time). This hazard cannot be logically eliminated because the problem is in the specification of the circuit. The only real way to avoid this problem is to limit the number of changing input variables to one at any given time. Web links Basics%20of%20Digital%20Logic.pdf Measurement instruments Digital multimeter (3½ digit) Power supply Oscilloscope Function generator METEX ME-22T Agilent E3630 Agilent 54622A Agilent A Test board Evaluation board (Figure 9 6) provided for this laboratory consist of the following main parts: The bottom, bottom left part of the evaluation board is used for inverter circuits measurements (Figure 9 7); Centre part of the board is used for the D flip-flop measurement (Figure 9 8); An embedded pulse generator is used in flip-flop measurements as stimulus. The control knobs and signal outputs of this block is on the left part of the panel; The evaluation board also contains some capacitive loads, and a standard 10 gate loads (labeled as 10 kapu terhelés ). All of the input and output signals are accessible using standard banana plugs. Note that, high frequency signal measurement should be done using oscilloscope probe with 10:1 or 1:100 attenuation. Therefore standard banana cables should not be used for oscilloscope connections. 8

9 Basic logic circuits The laboratory includes the measurement of several IC types. These ICs can be replaced (inverters, and flip-flops too). IC replacements are done by using the arm on the left top corner of the so called TexTool sockets. By turning the arm, ICs can be unlocked or locked. Note that the pin number 1 of inverter and flip-flop circuits always should be the pin next to the socket control arm. Figure 9 6.: VIK-07 Evaluation board Figure 9 7.: Schematic of the bottom part of the evaluation board, used for inverter measurements 9

10 Laboratory exercises 1. Figure 9 8.: Schematic of the center part of the evaluation board, used for flip-flop measurements Laboratory exercises 1. Measurement of voltage transfer characteristic for several inverter IC types 1.1. Make the evaluation board ready for the measurement: connect a 5V power (to Vcc) and GND (to GND) to the Evaluation board using the Agilent E3630 power supply (Measure the supply voltage before connecting it!!!) Place a TTL inverter to the inverter socket (bottom left). Use the Agilent function generator to create a 0V to 5V triangle wave at the frequency of 350 Hz. Measure the generated signal before connecting it, because the improper selection of function generator s load could cause problems!!! Connect the stimulus to the input of the inverter chain. Measure the voltage transfer characteristic of the first inverter using the XY mode of the oscilloscope (Figure 9.9). Do not connect load to the inverters output Connect a 10 gate load ( 10 kapu terhelés ) to the output of the first inverter. Measure the effect of this modification! 1.4. Perform the following measurements for at least 2 TTL and 2 CMOS circuits! Measure the logic High and Low voltage levels, measure the High-to-Low, and Low-to-High switching points. Make conclusions on differences. 10 Figure 9 9.: Measurement setup of exercise 1.

11 Basic logic circuits 2. Measure the power consumption of several inverters. Repeat this measurement for different input signal frequencies Use the Agilent function generator to create a 0V to 5V square wave at the frequency of 100 Hz. Measure the generated signal before connecting it! Connect a multimeter in current measurement mode between the power supply and the evaluation board. Measure the static power consumption of the evaluation board (unlock and remove the inverter IC). Place the inverter circuit back, and make the power consumption measurement. Repeat the measurement at 1kHz, 10KHz, 100Khz, 1MHz Make conclusions on the power consumption change of TTL inverters! 2.3. Make conclusions on the power consumption change of CMOS inverters! Figure 9 10.: Measurement setup of exercise Measurement of delays 3.1. The measurement setup is the same as the previous exercise, except connect a 10 gate load to the last (6 th ) inverter. Use the Agilent function generator to create a 0V to 5V square wave at the frequency of 100 Hz. Measure the generated signal before connecting it! Measure the delay at the 6 th inverter, and calculate the average delay of one inverter Connect a capacitive load to the first inverter and perform the above measurement for several IC type. What are the effects of the capacitive load on the first inverter? 4. Measurements on Flip-flops (SN7474) 4.1. Insert a flip-flop IC to the flip-flop socket on the middle of the evaluation board. Identify the pins of the flip-flop by using the pin setup diagram at the back of this paper! 4.2. Design and implement measurement setups for setup time, hold time, and propagation time measurements by using the embedded pulse generator block of the evaluation board! 11

12 Laboratory exercises 1. Auxiliary measurement exercises 5. Measure the load and supply voltage dependence of the power consumption of logic circuits. (Auxiliary for exercise two) 5.1. Connect a capacitive load to the first inverter and perform the power consumption measurement described at exercise Measure the power supply voltage dependence of CMOS logic circuits. Use the measurement setup described at exercise 2, with the input signal frequency of 1MHz. Reduce the power supply voltage from 5V to 4.5V, 4V, 3.5V and measure the power consumption of the logic circuit. Do not forget the measure the base power consumption of the Evaluation board each time before calculating the inverter circuit power consumption! Do not raise the power supply voltage above 5V! Test questions0. 1. What are the differences between the TTL 54 and the 74 series? 2. What are the meaning of labels L, H, LS, AS, ALS, C, HC, HCT in the names of TTL series logic circuits.? 3. Draw the internal transistor level schematic of a TTL NAND gate! 4. What is the definition of voltage transfer characteristic? 5. Draw the voltage transfer characteristic of a TTL inverter or NAND gate! 6. Which typical properties of logic gates are described in datasheets? 7. What are the voltage levels of logical HIGH and LOW levels in case of TTL and CMOS circuits. 8. What is the definition of FAN OUT? 9. What is the definition of Rise time and Fall time? 10. What is the switching point voltage of a TTL circuit? 11. What is the definition of Setup time, Hold time and Propagation delay? 12. What are the power supply range of TTL and CMOS circuits? 12

13 Basic logic circuits Pin setup of typical inverter and D flip-flop ICs 13

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