Interferometric diagnostics of ablation craters formed by femtosecond laser pulses

Size: px
Start display at page:

Download "Interferometric diagnostics of ablation craters formed by femtosecond laser pulses"

Transcription

1 Interferometric diagnostics of ablation craters formed by femtosecond laser pulses A. S. Zakharov, M. V. Volkov, and I. P. Gurov St. Petersburg State Institute of Precision Mechanics and Optics (Technical University), St. Petersburg V. V. Temnov Institute for Laser and Plasma Physics at the University of Essen, Essen, Germany; Institute of Applied Physics of the Russian Academy of Sciences, Nizhni Novgorod K. Sokolovski-Tinten and D. von der Linde Institute for Laser and Plasma Physics at the University of Essen, Essen, Germany Submitted January 24, 2002 Opticheski Zhurnal 69, July 2002 It is proposed to use methods of interferometry for quantitative analysis of the removal of material from the surface of a solid under the action of femtosecond laser pulses laser ablation craters. The characteristics of the two-dimensional discrete nonlinear Kalman filter for noise-resistant recovery of the deconvolved phase of the pattern of interference fringes characterizing the ablation craters. We present the results of a processing of the two-dimensional interferograms obtained in reflection of light from gallium arsenide and zinc surfaces before and after a high-power femtosecond laser pulse acted on them. The experiment results confirm the high noise resistance of the proposed method of recovering the phase of the two-dimensional interference fringes Optical Society of America INTRODUCTION The removal of material from a solid surface under the action of ultrashort laser pulses laser ablation is of particular interest from the standpoint of investigating little-studied fundamental mechanisms of interaction of high-power laser radiation with matter. 1,2 The technology of surface modification by femtosecond laser pulses is widely used to process various materials and for microstructuring of surfaces, and also in medicine, in the restoration of art objects, and other areas. The interferometric diagnostic technique presented in this paper, which uses the illumination of an interferometer by femtosecond laser pulses, permits a quantitative characterization of the relief of the ablation craters, which have a typical depth of several tens of nanometers. A special role in this is played by the computer algorithms needed for processing and reconstruction of the two-dimensional phase function of the interference fringes. The widely used methods of phase-shearing interferometry 3 are unsuitable for dynamic measurements, since they require recording, with a time separation, several fringe patterns with a specified phase shift. The methods based on the Fourier Hilbert transform 4,5 in many cases does not provide the necessary noise resistance in the processing and deconvolution of the two-dimensional phase function of the real distorted patterns of interference fringes. Noise resistance of the processing of the fringe patterns is made possible by the use of parametric models for the signals that determine the interference fringes, in particular, models of stochastic processes in the form stochastic difference equations. 6,7 On this basis it is possible to construct recursive algorithms with a high resolving power, ensuring noise-resistant recovery of the deconvolution total phase of the interference fringes. 7 9 An example of a recursive algorithm of this type is discrete linear Kalman filtering. 10 However, the linear filter does not permit optimal estimates of parameters on which the fringe signal depends nonlinearly, in particular, the value of the phase of the fringes. In this paper we consider the possibility of using the method of nonlinear discrete Kalman filtering for processing the pattern of interference fringes with recovery of the variations of the deconvolved two-dimensional phase function of the fringes characterizing the relief of the craters form in various materials during femtosecond laser ablation. PROCESSING OF TWO-DIMENSIONAL PATTERNS OF INTERFERENCE FRINGES BY THE METHOD OF NONLINEAR KALMAN FILTERING A nonlinear Kalman filter is intended for obtaining dynamic estimates of parameters that are nonlinearly related to the signal values. Such a filter is specified 9,10 by the observation equation s k h k n k 1 and the equation of the system k 1 k f k x w k. 2 In Eqs. 1 and 2 s(k) is the observed signal vector, (k) is the parameter vector, h( ) and f( ) are known nonlinear vector functions, x is the discretization step, n(k) is the noise of the observations, and w(k) is the forming noise. The filtering algorithm has a recursive character and is based on prediction of the values of the parameter vector pr (k) at the next discretization step from the observation data. If one is able to find an estimate of the parameter vector pr (k), then for determination of the error of this estimate cr (k) (k) 478 J. Opt. Technol. 69 (7), July /2002/ $ The Optical Society of America 478

2 pr (k) one can use the well-known method of onedimensional discrete linear Kalman filtering. 6,10 Recovery of the phase of two-dimensional interference fringe patterns requires a two-dimensional nonlinear Kalman filter. Let us first discuss the procedure for nonlinear Kalman filtering of a one-dimensional discrete signal. According to the observation equation 1, the error of prediction of the signal values is given as s er k h pr k er k h pr k n k. 3 Here the equation of the system 2 is transformed to er k 1 er k f pr k er k f pr k x w k. 4 The functions h( ) and f( ) in 1 and 2 can be expanded in a Taylor series in the form h pr k er k h pr k h pr k er k, 5 f pr k er k f pr k f pr k er k. From Eqs. 3 6 we obtain s er k h pr k er k n k, er k 1 er k f pr k pr k x w k. 8 Taking into account that (k) pr (k) er (k), we obtain dynamic estimates of the unknown parameter vector (k) from Eq. 8. Expressions 7 and 8 can be used to synthesize a onedimensional quasi-optimal discrete nonlinear Kalman filter that can be used for row-by-row processing of twodimensional patterns of interference fringes. The features of the row-by-row dynamic filtering of fringe patterns are discussed in detail in Ref. 9. The recorded fringe pattern is a two-dimensional matrix of discrete readings. Independent filtering of the data sequences along individual rows can lead to distortion of the overall fringe pattern, since at two adjacent points of a column of data the errors of estimation of the phase can be significantly different from each other if the filtering of the individual rows is done independently, and significant errors in the determination of the spatial frequency in the vertical direction can arise. A quasi-two-dimensional processing alternately along rows and columns does not solve this problem, since then one cannot completely eliminate large phase jumps. Twodimensional processing of the interference pattern is necessary, with the predictions based not only on the parameter values at the previous point of the row but also on those at the previous point of the column of data containing the values of the intensity of the light in the pattern of interference fringes. For two-dimensional processes of the interference fringes by means of a discrete nonlinear Kalman filter it is necessary to estimate a parameter vector of the form (s 0,s m,,u H,u V ) T, where s 0 is the background component of the interference pattern, s m is the amplitude of the fringes, is the deconvolved phase of the fringes, u H is the spatial frequency in the horizontal direction, and u V is the spatial frequency in the vertical direction. In our version of 6 7 the two-dimensional nonlinear Kalman filter the signal parameters at a point with discrete coordinates (i, j) were predicted according to the simple rules s 0 i, j s 0 i 1,j s 0 i, j 1 /2, 9 s m i, j s m i 1,j s m i, j 1 /2, i, j i 1,j 2 u V i 1,j y i, j 1 2 u H i, j 1 x /2, u H i, j u H i 1,j u H i, j 1 /2, u V i, j u V i 1,j u V i, j 1 /2. 13 In Eq. 11 and below, x and y denote the discretization steps in the horizontal and vertical directions, respectively. As the observation vector at the point (i, j) we used a vector of the form s(i, j),s(i, j 1),s(i 1,j),s(i 1,j 1) T. For prediction of the vector at each point we have used the formulas s i, j s 0 i, j s m i, j cos i, j, 14 s i, j 1 s 0 i, j s m i, j cos i, j 2 u H i, j x, s i 1,j s 0 i, j s m i, j cos i, j 2 u V i, j y, s i 1,j 1 s 0 i, j s m i, j cos i, j u H i, j x 2 u V i, j y. 17 The initial conditions for the calculations using formulas 9 17 were determined by starting from preliminary rough estimates of the parameter vector. In particular, the estimate of the background component of the fringe pattern was determined by the average value of the intensity, the estimate of the fringe amplitude by the variance of the variable component, the spatial frequencies were calculated according to the average number of fringes in the pattern, and the value of the phase at the initial point was assumed equal to zero. Because of the locally adaptive character of the algorithm for two-dimensional recursive filtering, the accuracy of these preliminary estimates was sufficient for subsequent stable deconvolution of the two-dimensional phase function of the fringe pattern. EXPERIMENTAL APPARATUS FOR THE FORMATION AND INTERFEROMETRIC DIAGNOSTICS OF ABLATION CRATERS In the experimental apparatus Fig. 1, a detailed description of which is given in Ref. 2, a high-power femtosecond pump pulse is used for excitation of the sample. After a fixed delay time another weak femtosecond pulse probe pulse is fed into a Linnik microinterferometer, and a portion of the radiation that has passed through a microobjective is used to illuminate the excited part of the surface, which is a plane object. A CCD recording camera is placed in the image plane, and at the exit from the objective the reflected probe pulse interferes with the reference pulse, which has passed 479 J. Opt. Technol. 69 (7), July 2002 Zakharov et al. 479

3 terferograms is to extract information about the dynamic excitation and the final modification of the surface by comparison of the two-dimensional deconvolved phase functions, the initial and dynamic, and also of the initial and final interferograms. The difference of the two-dimensional phase functions of the fringes, which is recovered in the processing of the interferograms, yields quantitative information about the ablation crates. The reconstruction of the final relief of the craters as a result of the action of a femtosecond laser pulse on a substance is an important problem. In the present study it was solved by using the nonlinear Kalman filtering method discussed above. Recovery of the deconvolved two-dimensional phase functions of the initial and final interferograms was achieved, with a reconstruction of the final relief of the craters formed on gallium arsenide and zinc surfaces. FIG. 1. Diagram of experimental layout: 1 pump pulse, 2 probe pulse, 3 sample under study, M mirror. through an identical reference arm of the Linnik microinterferometer. Recorded as a result of each measurement, according to the technique of Ref. 2, are an initial interferogram of the unexcited surface, a dynamic interferogram of the excited surface after a fixed time delay following the action of the pump pulse with a typical time delay of up to several nanoseconds, and an interferogram of the final modification of the surface, obtained several seconds after the laser excitation. The main problem of processing the in- RESULTS OF EXPERIMENTS ON THE INTERFEROMETRIC DIAGNOSTICS OF ABLATION CRATERS MADE BY FEMTOSECOND LASER PULSES Figure 2 shows interferograms of a gallium arsenide surface before Fig. 2a and after Fig. 2b it was acted on by a high-power femtosecond laser pulse with an energy of several times the ablation threshold. 1 Figure 2c shows a halftone picture of the calculated difference of the deconvolved two-dimensional phase functions obtained with nonlinear Kalman filtering of the fringe patterns of Figs. 2a and 2b. Figure 2d shows the profile of the phase difference in the median horizontal cross section of the two-dimensional func- FIG. 2. Experimental interferograms obtained for gallium arsenide a,b, the difference of the deconvolved phase functions c, and the change in the phase difference in the median horizontal cross section d, characterizing the relief of the crater. 480 J. Opt. Technol. 69 (7), July 2002 Zakharov et al. 480

4 FIG. 3. Experimental interferograms for a zinc sample a,b, the reconstructed fringe pattern c, and the deviations of the phases of the fringe patterns d. tion in Fig. 2c; this profile gives a quantitative characterization of the profile of the crater right-hand scale in Fig. 2d. The crater depth is directly proportional to the measured phase difference, with a coefficient of proportionality /4, where 400 nm is the wavelength of the probe pulse radiation. The obtained crater depth of around 50 nm agrees with the results of direct measurements of the crater profiles with the aid of an atomic force microscope. The experimental interferograms obtained for an irregular zinc surface Figs. 3a and 3b that had been subjected to etching is more complicated to process. The characteristics of the interferograms are determined by the properties of the material and the conditions of light reflection. Some of the fringes have breaks and other local defects. The visibility of the interference fringes varies significantly over the field of the interferogram, especially for the interferogram obtained after formation of the crater Fig. 3b. These features do not permit stable recovery of the phase, to say nothing of its deconvolution by conventional methods including that based on the Fourier transform. For processing of the interferograms of Figs. 3a and 3b we used the method of preliminary amelioration of the fringe patterns, which is based on a modification of the local halftone histograms and has been successfully implemented in the processing of fringe patterns in moiré and holographic interferometry. 11,12 The features of the method used for amelioration of the interferograms is discussed in detail in Ref. 12. The ameliorated interferograms were subjected to twodimensional nonlinear Kalman filtering according to the algorithm described above for obtaining two-dimensional deconvolved phase functions of the fringes. Figure 3c shows a fringe pattern reconstructed from the values of the total phase of the interferogram of Fig. 3b after filtering by a nonlinear two-dimensional Kalman filter. A comparison of Fig. 3b and 3c clearly demonstrates the high efficiency of the interferogram processing methods developed here. Figure 3d shows a half-tone picture of the differences of the deconvolved phases of the interferogram of Figs. 3a and 3b. The profile of the phase differences in the median horizontal cross section of Fig. 3d is shown in Fig. 4. This represents the profile of an ablation crater whose depth is approximately 60 nm. It must be emphasized that the depth of the crater is substantially smaller than the characteristic amplitude of the initial surface roughness, confirming the high noise resistance of the interferogram processing methods used. It is important to note that the processing of the fringe patterns by the method of Kalman filtering does not introduce appreciable distortions at the boundaries of the fringe pattern and ensures stable filtering of the deconvolved phase under conditions when noise and distortions are present in the fringe pattern. CONCLUSION As a result of the processing of the experimental interferograms by a discrete nonlinear two-dimensional Kalman filter we obtained quantitative information about the structure of ablation craters formed on the gallium arsenide and zinc surfaces by the action of high-power single-shot femtosecond laser pulses with an energy several time greater than the ablation threshold. 1 For the results obtained one can conclude that a nonlinear Kalman filter may be used for processing the interference fringes with locally varying parameters under conditions where noise is present. An important advantage of a filter of this kind is the possibility of analyzing the interference field to obtain the optimal dynamic estimates of the deconvolved phase of the fringes at local points. In the case of twodimensional nonlinear filtering one achieves significantly lower rms and maximum errors of estimation of the parameters than for a row-by-row processing of the image. FIG. 4. Variation of the phase difference of Fig. 3d in the median horizontal cross section, characterizing the relief of the crater. 481 J. Opt. Technol. 69 (7), July 2002 Zakharov et al. 481

5 An advantage of the Kalman filter is the recovery of the two-dimensional total phase of the fringes, whereas the Fourier transform can yield only the reduced phase in the interval, and requires solving an additional problem of deconvolution of the phase. The Kalman filter, unlike the fast Fourier transform, does not require a specified format of the initial data dimensions of the matrix of readings. This property makes it possible to rapidly process fringe patterns obtained with professional cameras for scientific studies with any image format. 1 K. Sokolowski-Tinten, J. Bialkowski, A. Cavalleri, D. von der Linde, A. Oparin, J. Mayerter-Vehn, and S. I. Anisimov, Transient states of matter during short pulse laser ablation, Phys. Rev. Lett. 81, V. V. Temnov, K. Sokolowski-Tinten, and D. von der Linde, Ultrafast time- and space-resolved Michelson interferometry, J. Opt. Soc. Am. B 2002 to be published. 3 K. Creath, Phase measurement interferometry techniques, Progr. Opt. 26, M. Takeda, H. Ina, and S. Kobayashi, Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry, J. Opt. Soc. Am. A 72, C. Roddier and F. Roddier, Interferogram analysis using Fourier transform techniques, Appl. Opt. 26, V. N. Vasil ev and I. P. Gurov, Computer Processing of Signals in Application to Interferometric Systems in Russian, BKhV-Sankt-Peterburg, St. Petersburg I. Gurov and D. Sheynihovich, Interferometric data analysis based on Markov nonlinear filtering methodology, J. Opt. Soc. Am. A 17, I. P. Gurov, Analysis of interference fringes based on the recurrence nonlinear filtering methodology, Opt. Zh. No. 7, J. Opt. Technol. 67, I. Gurov and A. Zakharov, Dynamic nonlinear analysis of stochastic interference fields, International Conference on Coherent and Nonlinear Optics ICONO 01, Minsk, 2001; to be publ. in Proc. SPIE E. Lloyd and U. M. Liderman eds., Handbook of Applied Statistics, Vol. 2 Finansy i Statistika, Moscow, S. De Nicola, P. Ferraro, I. Gurov, R. Koviazin, and M. Volkov, Fringe analysis for moiree interferometry by modification of the local intensity histogram and use of a two-dimensional Fourier transform, Meas. Sci. Technol. No. 9, I. Gurov and M. Volkov, Distorted noisy interferograms enhancement and evaluation by the nonlinear 2D data-dependent fringe processing, in Optical Measurement Systems for Industrial Inspection. II: Application in Industrial Design, edited by O. W. Jueptner W.P.O. and M. Kujawinska, Proc. SPIE 4398, J. Opt. Technol. 69 (7), July 2002 Zakharov et al. 482

Holography 1 HOLOGRAPHY

Holography 1 HOLOGRAPHY Holography 1 HOLOGRAPHY Introduction and Background The aesthetic appeal and commercial usefulness of holography are both related to the ability of a hologram to store a three-dimensional image. Unlike

More information

DETECTION OF SUBSURFACE DAMAGE IN OPTICAL TRANSPARENT MATERIALSS USING SHORT COHERENCE TOMOGRAPHY. Rainer Boerret, Dominik Wiedemann, Andreas Kelm

DETECTION OF SUBSURFACE DAMAGE IN OPTICAL TRANSPARENT MATERIALSS USING SHORT COHERENCE TOMOGRAPHY. Rainer Boerret, Dominik Wiedemann, Andreas Kelm URN (Paper): urn:nbn:de:gbv:ilm1-2014iwk-199:0 58 th ILMENAU SCIENTIFIC COLLOQUIUM Technische Universität Ilmenau, 08 12 September 2014 URN: urn:nbn:de:gbv:ilm1-2014iwk:3 DETECTION OF SUBSURFACE DAMAGE

More information

Optical Metrology. Third Edition. Kjell J. Gasvik Spectra Vision AS, Trondheim, Norway JOHN WILEY & SONS, LTD

Optical Metrology. Third Edition. Kjell J. Gasvik Spectra Vision AS, Trondheim, Norway JOHN WILEY & SONS, LTD 2008 AGI-Information Management Consultants May be used for personal purporses only or by libraries associated to dandelon.com network. Optical Metrology Third Edition Kjell J. Gasvik Spectra Vision AS,

More information

Application Report: Running µshape TM on a VF-20 Interferometer

Application Report: Running µshape TM on a VF-20 Interferometer : Running µshape TM on a VF-20 Interferometer General This report describes how a fiber interferometer from Arden Photonics Ltd was used together with the µshape TM Generic software package. The VF-20

More information

How To Fix Out Of Focus And Blur Images With A Dynamic Template Matching Algorithm

How To Fix Out Of Focus And Blur Images With A Dynamic Template Matching Algorithm IJSTE - International Journal of Science Technology & Engineering Volume 1 Issue 10 April 2015 ISSN (online): 2349-784X Image Estimation Algorithm for Out of Focus and Blur Images to Retrieve the Barcode

More information

Color holographic 3D display unit with aperture field division

Color holographic 3D display unit with aperture field division Color holographic 3D display unit with aperture field division Weronika Zaperty, Tomasz Kozacki, Malgorzata Kujawinska, Grzegorz Finke Photonics Engineering Division, Faculty of Mechatronics Warsaw University

More information

Optical thickness measurement of substrates using a transmitted wavefront test at two wavelengths to average out multiple reflection errors

Optical thickness measurement of substrates using a transmitted wavefront test at two wavelengths to average out multiple reflection errors Copyright 2002 Society of Photo-Optical Instrumentation Engineers. This paper was published in Proceedings of SPIE and is made available as an electronic reprint with permission of SPIE. One print or electronic

More information

Module 13 : Measurements on Fiber Optic Systems

Module 13 : Measurements on Fiber Optic Systems Module 13 : Measurements on Fiber Optic Systems Lecture : Measurements on Fiber Optic Systems Objectives In this lecture you will learn the following Measurements on Fiber Optic Systems Attenuation (Loss)

More information

1 Example of Time Series Analysis by SSA 1

1 Example of Time Series Analysis by SSA 1 1 Example of Time Series Analysis by SSA 1 Let us illustrate the 'Caterpillar'-SSA technique [1] by the example of time series analysis. Consider the time series FORT (monthly volumes of fortied wine sales

More information

FTIR Instrumentation

FTIR Instrumentation FTIR Instrumentation Adopted from the FTIR lab instruction by H.-N. Hsieh, New Jersey Institute of Technology: http://www-ec.njit.edu/~hsieh/ene669/ftir.html 1. IR Instrumentation Two types of instrumentation

More information

Characterization of hidden defects of an original XVI Century painting on wood by Electronic Speckle Pattern Interferometry

Characterization of hidden defects of an original XVI Century painting on wood by Electronic Speckle Pattern Interferometry Characterization of hidden defects of an original XVI Century painting on wood by Electronic Speckle Pattern Interferometry Giovanni Arena, Pasquale Memmolo, Melania Paturzo, Pietro Ferraro CNR Istituto

More information

Spatial location in 360 of reference points over an object by using stereo vision

Spatial location in 360 of reference points over an object by using stereo vision EDUCATION Revista Mexicana de Física E 59 (2013) 23 27 JANUARY JUNE 2013 Spatial location in 360 of reference points over an object by using stereo vision V. H. Flores a, A. Martínez a, J. A. Rayas a,

More information

Lecture 14. Point Spread Function (PSF)

Lecture 14. Point Spread Function (PSF) Lecture 14 Point Spread Function (PSF), Modulation Transfer Function (MTF), Signal-to-noise Ratio (SNR), Contrast-to-noise Ratio (CNR), and Receiver Operating Curves (ROC) Point Spread Function (PSF) Recollect

More information

Metrology of silicon photovoltaic cells using coherence correlation interferometry

Metrology of silicon photovoltaic cells using coherence correlation interferometry Loughborough University Institutional Repository Metrology of silicon photovoltaic cells using coherence correlation interferometry This item was submitted to Loughborough University's Institutional Repository

More information

Development of Optical Wave Microphone Measuring Sound Waves with No Diaphragm

Development of Optical Wave Microphone Measuring Sound Waves with No Diaphragm Progress In Electromagnetics Research Symposium Proceedings, Taipei, March 5 8, 3 359 Development of Optical Wave Microphone Measuring Sound Waves with No Diaphragm Yoshito Sonoda, Takashi Samatsu, and

More information

Static Environment Recognition Using Omni-camera from a Moving Vehicle

Static Environment Recognition Using Omni-camera from a Moving Vehicle Static Environment Recognition Using Omni-camera from a Moving Vehicle Teruko Yata, Chuck Thorpe Frank Dellaert The Robotics Institute Carnegie Mellon University Pittsburgh, PA 15213 USA College of Computing

More information

Pump-probe experiments with ultra-short temporal resolution

Pump-probe experiments with ultra-short temporal resolution Pump-probe experiments with ultra-short temporal resolution PhD candidate: Ferrante Carino Advisor:Tullio Scopigno Università di Roma ƒla Sapienza 22 February 2012 1 Pump-probe experiments: generalities

More information

Signal to Noise Instrumental Excel Assignment

Signal to Noise Instrumental Excel Assignment Signal to Noise Instrumental Excel Assignment Instrumental methods, as all techniques involved in physical measurements, are limited by both the precision and accuracy. The precision and accuracy of a

More information

Introduction to Fourier Transform Infrared Spectrometry

Introduction to Fourier Transform Infrared Spectrometry Introduction to Fourier Transform Infrared Spectrometry What is FT-IR? I N T R O D U C T I O N FT-IR stands for Fourier Transform InfraRed, the preferred method of infrared spectroscopy. In infrared spectroscopy,

More information

Broadband THz Generation from Photoconductive Antenna

Broadband THz Generation from Photoconductive Antenna Progress In Electromagnetics Research Symposium 2005, Hangzhou, China, August 22-26 331 Broadband THz Generation from Photoconductive Antenna Qing Chang 1, Dongxiao Yang 1,2, and Liang Wang 1 1 Zhejiang

More information

Ferromagnetic resonance imaging of Co films using magnetic resonance force microscopy

Ferromagnetic resonance imaging of Co films using magnetic resonance force microscopy Ferromagnetic resonance imaging of Co films using magnetic resonance force microscopy B. J. Suh, P. C. Hammel, a) and Z. Zhang Condensed Matter and Thermal Physics, Los Alamos National Laboratory, Los

More information

Measuring large areas by white light interferometry at the nanopositioning and nanomeasuring machine (NPMM)

Measuring large areas by white light interferometry at the nanopositioning and nanomeasuring machine (NPMM) Image Processing, Image Analysis and Computer Vision Measuring large areas by white light interferometry at the nanopositioning and nanomeasuring machine (NPMM) Authors: Daniel Kapusi 1 Torsten Machleidt

More information

It has long been a goal to achieve higher spatial resolution in optical imaging and

It has long been a goal to achieve higher spatial resolution in optical imaging and Nano-optical Imaging using Scattering Scanning Near-field Optical Microscopy Fehmi Yasin, Advisor: Dr. Markus Raschke, Post-doc: Dr. Gregory Andreev, Graduate Student: Benjamin Pollard Department of Physics,

More information

LIST OF CONTENTS CHAPTER CONTENT PAGE DECLARATION DEDICATION ACKNOWLEDGEMENTS ABSTRACT ABSTRAK

LIST OF CONTENTS CHAPTER CONTENT PAGE DECLARATION DEDICATION ACKNOWLEDGEMENTS ABSTRACT ABSTRAK vii LIST OF CONTENTS CHAPTER CONTENT PAGE DECLARATION DEDICATION ACKNOWLEDGEMENTS ABSTRACT ABSTRAK LIST OF CONTENTS LIST OF TABLES LIST OF FIGURES LIST OF NOTATIONS LIST OF ABBREVIATIONS LIST OF APPENDICES

More information

Achromatic three-wave (or more) lateral shearing interferometer

Achromatic three-wave (or more) lateral shearing interferometer J. Primot and L. Sogno Vol. 12, No. 12/December 1995/J. Opt. Soc. Am. A 2679 Achromatic three-wave (or more) lateral shearing interferometer J. Primot and L. Sogno Office National d Etudes et de Recherches

More information

Interferometers. OBJECTIVES To examine the operation of several kinds of interferometers. d sin = n (1)

Interferometers. OBJECTIVES To examine the operation of several kinds of interferometers. d sin = n (1) Interferometers The true worth of an experimenter consists in his pursuing not only what he seeks in his experiment, but also what he did not seek. Claude Bernard (1813-1878) OBJECTIVES To examine the

More information

Optical Methods of Surface Measurement

Optical Methods of Surface Measurement Optical Methods of Surface Measurement Ted Vorburger, Guest Researcher National Institute of Standards and Technology (NIST) Measurement Science and Standards in Forensic Firearms Analysis 2012 NIST, Gaithersburg,

More information

SEMICONDUCTOR lasers with optical feedback have

SEMICONDUCTOR lasers with optical feedback have IEEE JOURNAL OF QUANTUM ELECTRONICS, VOL. 34, NO. 10, OCTOBER 1998 1979 Dynamics and Linear Stability Analysis in Semiconductor Lasers with Phase-Conjugate Feedback Atsushi Murakami and Junji Ohtsubo,

More information

Introduction to Optics

Introduction to Optics Second Edition Introduction to Optics FRANK L. PEDROTTI, S.J. Marquette University Milwaukee, Wisconsin Vatican Radio, Rome LENO S. PEDROTTI Center for Occupational Research and Development Waco, Texas

More information

Measuring Line Edge Roughness: Fluctuations in Uncertainty

Measuring Line Edge Roughness: Fluctuations in Uncertainty Tutor6.doc: Version 5/6/08 T h e L i t h o g r a p h y E x p e r t (August 008) Measuring Line Edge Roughness: Fluctuations in Uncertainty Line edge roughness () is the deviation of a feature edge (as

More information

S. Hartmann, C. Seiler, R. Dörner and P. Grimm

S. Hartmann, C. Seiler, R. Dörner and P. Grimm &DVH6WXG\9LVXDOL]DWLRQRI0HFKDQLFDO3URSHUWLHVDQG 'HIRUPDWLRQVRI/LYLQJ&HOOV S. Hartmann, C. Seiler, R. Dörner and P. Grimm Fraunhofer Anwendungszentrum für Computergraphik in Chemie und Pharmazie Varrentrappstraße

More information

arxiv:cond-mat/0308498v1 [cond-mat.soft] 25 Aug 2003

arxiv:cond-mat/0308498v1 [cond-mat.soft] 25 Aug 2003 1 arxiv:cond-mat/38498v1 [cond-mat.soft] 2 Aug 23 Matter-wave interference, Josephson oscillation and its disruption in a Bose-Einstein condensate on an optical lattice Sadhan K. Adhikari Instituto de

More information

Experiment 5. Lasers and laser mode structure

Experiment 5. Lasers and laser mode structure Northeastern University, PHYS5318 Spring 2014, 1 1. Introduction Experiment 5. Lasers and laser mode structure The laser is a very important optical tool that has found widespread use in science and industry,

More information

Acousto-optic modulator

Acousto-optic modulator 1 of 3 Acousto-optic modulator F An acousto-optic modulator (AOM), also called a Bragg cell, uses the acousto-optic effect to diffract and shift the frequency of light using sound waves (usually at radio-frequency).

More information

Femtosecond laser-induced silicon surface morphology in water confinement

Femtosecond laser-induced silicon surface morphology in water confinement Microsyst Technol (2009) 15:1045 1049 DOI 10.1007/s00542-009-0880-8 TECHNICAL PAPER Femtosecond laser-induced silicon surface morphology in water confinement Yukun Han Æ Cheng-Hsiang Lin Æ Hai Xiao Æ Hai-Lung

More information

STATISTICS AND DATA ANALYSIS IN GEOLOGY, 3rd ed. Clarificationof zonationprocedure described onpp. 238-239

STATISTICS AND DATA ANALYSIS IN GEOLOGY, 3rd ed. Clarificationof zonationprocedure described onpp. 238-239 STATISTICS AND DATA ANALYSIS IN GEOLOGY, 3rd ed. by John C. Davis Clarificationof zonationprocedure described onpp. 38-39 Because the notation used in this section (Eqs. 4.8 through 4.84) is inconsistent

More information

Apertureless Near-Field Optical Microscopy

Apertureless Near-Field Optical Microscopy VI Apertureless Near-Field Optical Microscopy In recent years, several types of apertureless near-field optical microscopes have been developed 1,2,3,4,5,6,7. In such instruments, light scattered from

More information

System Identification for Acoustic Comms.:

System Identification for Acoustic Comms.: System Identification for Acoustic Comms.: New Insights and Approaches for Tracking Sparse and Rapidly Fluctuating Channels Weichang Li and James Preisig Woods Hole Oceanographic Institution The demodulation

More information

Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing

Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing Metrology for Characterization of Wafer Thickness Uniformity During 3D-IC Processing Authors: Tom Dunn, Chris Lee, Mark Tronolone, Aric Shorey Corning Incorporated Corning, New York 14831 ShoreyAB@corning.com

More information

Imaging techniques with refractive beam shaping optics

Imaging techniques with refractive beam shaping optics Imaging techniques with refractive beam shaping optics Alexander Laskin, Vadim Laskin AdlOptica GmbH, Rudower Chaussee 29, 12489 Berlin, Germany ABSTRACT Applying of the refractive beam shapers in real

More information

3D Scanner using Line Laser. 1. Introduction. 2. Theory

3D Scanner using Line Laser. 1. Introduction. 2. Theory . Introduction 3D Scanner using Line Laser Di Lu Electrical, Computer, and Systems Engineering Rensselaer Polytechnic Institute The goal of 3D reconstruction is to recover the 3D properties of a geometric

More information

PUMPED Nd:YAG LASER. Last Revision: August 21, 2007

PUMPED Nd:YAG LASER. Last Revision: August 21, 2007 PUMPED Nd:YAG LASER Last Revision: August 21, 2007 QUESTION TO BE INVESTIGATED: How can an efficient atomic transition laser be constructed and characterized? INTRODUCTION: This lab exercise will allow

More information

Application Note #503 Comparing 3D Optical Microscopy Techniques for Metrology Applications

Application Note #503 Comparing 3D Optical Microscopy Techniques for Metrology Applications Screw thread image generated by WLI Steep PSS angles WLI color imaging Application Note #503 Comparing 3D Optical Microscopy Techniques for Metrology Applications 3D optical microscopy is a mainstay metrology

More information

University of Pécs in ELI

University of Pécs in ELI Dept. of Experimental Physics Institute of Physics 7624 Pécs, Ifjúság ú. 6. http://physics.ttk.pte.hu University of Pécs in ELI József Fülöp fulop@fizika.ttk.pte.hu Budapest, April 16, 2008 Outline ELI

More information

Three-dimensional vision using structured light applied to quality control in production line

Three-dimensional vision using structured light applied to quality control in production line Three-dimensional vision using structured light applied to quality control in production line L.-S. Bieri and J. Jacot Ecole Polytechnique Federale de Lausanne, STI-IPR-LPM, Lausanne, Switzerland ABSTRACT

More information

Modelling, Extraction and Description of Intrinsic Cues of High Resolution Satellite Images: Independent Component Analysis based approaches

Modelling, Extraction and Description of Intrinsic Cues of High Resolution Satellite Images: Independent Component Analysis based approaches Modelling, Extraction and Description of Intrinsic Cues of High Resolution Satellite Images: Independent Component Analysis based approaches PhD Thesis by Payam Birjandi Director: Prof. Mihai Datcu Problematic

More information

A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS

A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS Uludağ Üniversitesi Mühendislik-Mimarlık Fakültesi Dergisi, Cilt 9, Sayı, 24 A METHOD OF PRECISE CALIBRATION FOR PIEZOELECTRICAL ACTUATORS Timur CANEL * Yüksel BEKTÖRE ** Abstract: Piezoelectrical actuators

More information

Wir schaffen Wissen heute für morgen

Wir schaffen Wissen heute für morgen Diffractive optics for photon beam diagnostics at hard XFELs Wir schaffen Wissen heute für morgen PSI: SLAC: ESRF: SOLEIL: APS: SACLA: EuroXFEL C. David, S. Rutishauser, P. Karvinen, Y. Kayser, U. Flechsig,

More information

Plastic Film Texture Measurement With 3D Profilometry

Plastic Film Texture Measurement With 3D Profilometry Plastic Film Texture Measurement With 3D Profilometry Prepared by Jorge Ramirez 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials.

More information

GRID AND PRISM SPECTROMETERS

GRID AND PRISM SPECTROMETERS FYSA230/2 GRID AND PRISM SPECTROMETERS 1. Introduction Electromagnetic radiation (e.g. visible light) experiences reflection, refraction, interference and diffraction phenomena when entering and passing

More information

Holographically corrected microscope with a large working distance (as appears in Applied Optics, Vol. 37, No. 10, 1849-1853, 1 April 1998)

Holographically corrected microscope with a large working distance (as appears in Applied Optics, Vol. 37, No. 10, 1849-1853, 1 April 1998) Holographically corrected microscope with a large working distance (as appears in Applied Optics, Vol. 37, No. 10, 1849-1853, 1 April 1998) Geoff Andersen and R. J. Knize Laser and Optics Research Center

More information

Resolution for Color photography

Resolution for Color photography Resolution for Color photography Paul M. Hubel a and Markus Bautsch b a Foveon, Inc., 282 San Tomas Expressway, Santa Clara, CA, USA 955; b Stiftung Warentest, Luetzowplatz -3, D-785 Berlin-Tiergarten,

More information

Laser Based Micro and Nanoscale Manufacturing and Materials Processing

Laser Based Micro and Nanoscale Manufacturing and Materials Processing Laser Based Micro and Nanoscale Manufacturing and Materials Processing Faculty: Prof. Xianfan Xu Email: xxu@ecn.purdue.edu Phone: (765) 494-5639 http://widget.ecn.purdue.edu/~xxu Research Areas: Development

More information

The coherence length of black-body radiation

The coherence length of black-body radiation Eur. J. Phys. 19 (1998) 245 249. Printed in the UK PII: S143-87(98)86653-1 The coherence length of black-body radiation Axel Donges Fachhochschule und Berufskollegs NTA Prof. Dr Grübler, Seidenstrasse

More information

PHOTOGRAMMETRIC TECHNIQUES FOR MEASUREMENTS IN WOODWORKING INDUSTRY

PHOTOGRAMMETRIC TECHNIQUES FOR MEASUREMENTS IN WOODWORKING INDUSTRY PHOTOGRAMMETRIC TECHNIQUES FOR MEASUREMENTS IN WOODWORKING INDUSTRY V. Knyaz a, *, Yu. Visilter, S. Zheltov a State Research Institute for Aviation System (GosNIIAS), 7, Victorenko str., Moscow, Russia

More information

Tracking Moving Objects In Video Sequences Yiwei Wang, Robert E. Van Dyck, and John F. Doherty Department of Electrical Engineering The Pennsylvania State University University Park, PA16802 Abstract{Object

More information

PHYS 39a Lab 3: Microscope Optics

PHYS 39a Lab 3: Microscope Optics PHYS 39a Lab 3: Microscope Optics Trevor Kafka December 15, 2014 Abstract In this lab task, we sought to use critical illumination and Köhler illumination techniques to view the image of a 1000 lines-per-inch

More information

Modern Classical Optics

Modern Classical Optics Modern Classical Optics GEOFFREY BROOKER Department of Physics University of Oxford OXPORD UNIVERSITY PRESS Contents 1 Electromagnetism and basic optics 1 1.1 Introduction 1 1.2 The Maxwell equations 1

More information

APPLICATION OF FREE TACHEOMETRIC STATIONS IN MONITORING OF MONUMENTAL OBJECTS

APPLICATION OF FREE TACHEOMETRIC STATIONS IN MONITORING OF MONUMENTAL OBJECTS APPLICATION OF FREE TACHEOMETRIC STATIONS IN MONITORING OF MONUMENTAL OBJECTS Ryszard Malarski, Kamil Nagórski Warsaw University of Technology, Faculty of Geodesy and Cartography Department of Engineering

More information

Optical Fibres. Introduction. Safety precautions. For your safety. For the safety of the apparatus

Optical Fibres. Introduction. Safety precautions. For your safety. For the safety of the apparatus Please do not remove this manual from from the lab. It is available at www.cm.ph.bham.ac.uk/y2lab Optics Introduction Optical fibres are widely used for transmitting data at high speeds. In this experiment,

More information

ING LA PALMA TECHNICAL NOTE No. 130. Investigation of Low Fringing Detectors on the ISIS Spectrograph.

ING LA PALMA TECHNICAL NOTE No. 130. Investigation of Low Fringing Detectors on the ISIS Spectrograph. ING LA PALMA TECHNICAL NOTE No. 130 Investigation of Low Fringing Detectors on the ISIS Spectrograph. Simon Tulloch (ING) June 2005 Investigation of Low Fringing Detectors on the ISIS Spectrograph. 1.

More information

Applications to Data Smoothing and Image Processing I

Applications to Data Smoothing and Image Processing I Applications to Data Smoothing and Image Processing I MA 348 Kurt Bryan Signals and Images Let t denote time and consider a signal a(t) on some time interval, say t. We ll assume that the signal a(t) is

More information

SPATIAL-TIME PATTERN OF ELECTRICAL FIELD OF TERAHERTZ PULSE IN THE FAR FIELD

SPATIAL-TIME PATTERN OF ELECTRICAL FIELD OF TERAHERTZ PULSE IN THE FAR FIELD NANOSYSTEMS: PHYSICS, CHEMISTRY, MATHEMATICS, 2013, 4 (2), P. 206 213 SPATIAL-TIME PATTERN OF ELECTRICAL FIELD OF TERAHERTZ PULSE IN THE FAR FIELD M. S. Kulya 1, Ya. V. Grachev 1, V. G. Bespalov 1, V.

More information

A PC-BASED TIME INTERVAL COUNTER WITH 200 PS RESOLUTION

A PC-BASED TIME INTERVAL COUNTER WITH 200 PS RESOLUTION 35'th Annual Precise Time and Time Interval (PTTI) Systems and Applications Meeting San Diego, December 2-4, 2003 A PC-BASED TIME INTERVAL COUNTER WITH 200 PS RESOLUTION Józef Kalisz and Ryszard Szplet

More information

DICOM Correction Item

DICOM Correction Item Correction Number DICOM Correction Item CP-626 Log Summary: Type of Modification Clarification Rationale for Correction Name of Standard PS 3.3 2004 + Sup 83 The description of pixel spacing related attributes

More information

Incorporating Internal Gradient and Restricted Diffusion Effects in Nuclear Magnetic Resonance Log Interpretation

Incorporating Internal Gradient and Restricted Diffusion Effects in Nuclear Magnetic Resonance Log Interpretation The Open-Access Journal for the Basic Principles of Diffusion Theory, Experiment and Application Incorporating Internal Gradient and Restricted Diffusion Effects in Nuclear Magnetic Resonance Log Interpretation

More information

Advanced Signal Processing and Digital Noise Reduction

Advanced Signal Processing and Digital Noise Reduction Advanced Signal Processing and Digital Noise Reduction Saeed V. Vaseghi Queen's University of Belfast UK WILEY HTEUBNER A Partnership between John Wiley & Sons and B. G. Teubner Publishers Chichester New

More information

A NEW APPROACH TO IN-SITU FORMTEST-INTERFEROMETRY

A NEW APPROACH TO IN-SITU FORMTEST-INTERFEROMETRY XVII IMEKO World Congress Metrology in the 3rd Millennium June 22 27, 2003, Dubrovnik, Croatia A NEW APPROACH TO IN-SITU FORMTEST-INTERFEROMETRY D. Doerner, A. Bai, P. Mangalasseril, T. Pfeifer Fraunhofer-Institute

More information

Axial intensity distribution of lens axicon illuminated by Gaussian-Schell model beam

Axial intensity distribution of lens axicon illuminated by Gaussian-Schell model beam 46 1, 018003 January 2007 Axial intensity distribution of lens axicon illuminated by Gaussian-Schell model beam Yuan Chen Jixiong Pu Xiaoyun Liu Huaqiao University Department of Electronic Science and

More information

Interferometric Measurement of Dispersion in Optical Components

Interferometric Measurement of Dispersion in Optical Components Interferometric Measurement of Dispersion in Optical Components Mark Froggatt, Eric Moore, and Matthew Wolfe Luna Technologies, Incorporated, 293-A Commerce Street, Blacksburg, Virginia 246 froggattm@lunatechnologies.com.

More information

Analysis and Improvement of Mach Zehnder Modulator Linearity Performance for Chirped and Tunable Optical Carriers

Analysis and Improvement of Mach Zehnder Modulator Linearity Performance for Chirped and Tunable Optical Carriers 886 JOURNAL OF LIGHTWAVE TECHNOLOGY, VOL. 20, NO. 5, MAY 2002 Analysis and Improvement of Mach Zehnder Modulator Linearity Performance for Chirped and Tunable Optical Carriers S. Dubovitsky, Member, IEEE,

More information

Modeling Max-of-N Fluence Distribution for Optics Lifetime

Modeling Max-of-N Fluence Distribution for Optics Lifetime LLNL-JRNL-509595 Modeling Max-of-N Fluence Distribution for Optics Lifetime Z. M. Liao, J. Hubel, J. T. Trenholme, C. W. Carr October 31, 011 Proceedings of SPIE Disclaimer This document was prepared as

More information

Refractive Index Measurement Principle

Refractive Index Measurement Principle Refractive Index Measurement Principle Refractive index measurement principle Introduction Detection of liquid concentrations by optical means was already known in antiquity. The law of refraction was

More information

ENGINEERING METROLOGY

ENGINEERING METROLOGY ENGINEERING METROLOGY ACADEMIC YEAR 92-93, SEMESTER ONE COORDINATE MEASURING MACHINES OPTICAL MEASUREMENT SYSTEMS; DEPARTMENT OF MECHANICAL ENGINEERING ISFAHAN UNIVERSITY OF TECHNOLOGY Coordinate Measuring

More information

Experiment #1, Analyze Data using Excel, Calculator and Graphs.

Experiment #1, Analyze Data using Excel, Calculator and Graphs. Physics 182 - Fall 2014 - Experiment #1 1 Experiment #1, Analyze Data using Excel, Calculator and Graphs. 1 Purpose (5 Points, Including Title. Points apply to your lab report.) Before we start measuring

More information

The Characteristic Polynomial

The Characteristic Polynomial Physics 116A Winter 2011 The Characteristic Polynomial 1 Coefficients of the characteristic polynomial Consider the eigenvalue problem for an n n matrix A, A v = λ v, v 0 (1) The solution to this problem

More information

Defects Introduction. Bonding + Structure + Defects. Properties

Defects Introduction. Bonding + Structure + Defects. Properties Defects Introduction Bonding + Structure + Defects Properties The processing determines the defects Composition Bonding type Structure of Crystalline Processing factors Defects Microstructure Types of

More information

2x + y = 3. Since the second equation is precisely the same as the first equation, it is enough to find x and y satisfying the system

2x + y = 3. Since the second equation is precisely the same as the first equation, it is enough to find x and y satisfying the system 1. Systems of linear equations We are interested in the solutions to systems of linear equations. A linear equation is of the form 3x 5y + 2z + w = 3. The key thing is that we don t multiply the variables

More information

Lens refractive index measurement based on fiber point-diffraction longitudinal interferometry

Lens refractive index measurement based on fiber point-diffraction longitudinal interferometry Lens refractive index measurement based on fiber point-diffraction longitudinal interferometry Lingfeng Chen, * Xiaofei Guo, and Jinjian Hao School of Optoelectronics, Beijing Institute of Technology,

More information

Synchronization of sampling in distributed signal processing systems

Synchronization of sampling in distributed signal processing systems Synchronization of sampling in distributed signal processing systems Károly Molnár, László Sujbert, Gábor Péceli Department of Measurement and Information Systems, Budapest University of Technology and

More information

Four Wave Mixing in Closely Spaced DWDM Optical Channels

Four Wave Mixing in Closely Spaced DWDM Optical Channels 544 VOL. 1, NO. 2, AUGUST 2006 Four Wave Mixing in Closely Spaced DWDM Optical Channels Moncef Tayahi *, Sivakumar Lanka, and Banmali Rawat Advanced Photonics Research lab, Department of Electrical Engineering

More information

Accuracy of the coherent potential approximation for a onedimensional array with a Gaussian distribution of fluctuations in the on-site potential

Accuracy of the coherent potential approximation for a onedimensional array with a Gaussian distribution of fluctuations in the on-site potential Accuracy of the coherent potential approximation for a onedimensional array with a Gaussian distribution of fluctuations in the on-site potential I. Avgin Department of Electrical and Electronics Engineering,

More information

COMPUTATION OF THREE-DIMENSIONAL ELECTRIC FIELD PROBLEMS BY A BOUNDARY INTEGRAL METHOD AND ITS APPLICATION TO INSULATION DESIGN

COMPUTATION OF THREE-DIMENSIONAL ELECTRIC FIELD PROBLEMS BY A BOUNDARY INTEGRAL METHOD AND ITS APPLICATION TO INSULATION DESIGN PERIODICA POLYTECHNICA SER. EL. ENG. VOL. 38, NO. ~, PP. 381-393 (199~) COMPUTATION OF THREE-DIMENSIONAL ELECTRIC FIELD PROBLEMS BY A BOUNDARY INTEGRAL METHOD AND ITS APPLICATION TO INSULATION DESIGN H.

More information

Exploratory data analysis (Chapter 2) Fall 2011

Exploratory data analysis (Chapter 2) Fall 2011 Exploratory data analysis (Chapter 2) Fall 2011 Data Examples Example 1: Survey Data 1 Data collected from a Stat 371 class in Fall 2005 2 They answered questions about their: gender, major, year in school,

More information

5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy

5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy 5. Scanning Near-Field Optical Microscopy 5.1. Resolution of conventional optical microscopy Resolution of optical microscope is limited by diffraction. Light going through an aperture makes diffraction

More information

- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier

- particle with kinetic energy E strikes a barrier with height U 0 > E and width L. - classically the particle cannot overcome the barrier Tunnel Effect: - particle with kinetic energy E strikes a barrier with height U 0 > E and width L - classically the particle cannot overcome the barrier - quantum mechanically the particle can penetrated

More information

A PHOTOGRAMMETRIC APPRAOCH FOR AUTOMATIC TRAFFIC ASSESSMENT USING CONVENTIONAL CCTV CAMERA

A PHOTOGRAMMETRIC APPRAOCH FOR AUTOMATIC TRAFFIC ASSESSMENT USING CONVENTIONAL CCTV CAMERA A PHOTOGRAMMETRIC APPRAOCH FOR AUTOMATIC TRAFFIC ASSESSMENT USING CONVENTIONAL CCTV CAMERA N. Zarrinpanjeh a, F. Dadrassjavan b, H. Fattahi c * a Islamic Azad University of Qazvin - nzarrin@qiau.ac.ir

More information

High Resolution Spatial Electroluminescence Imaging of Photovoltaic Modules

High Resolution Spatial Electroluminescence Imaging of Photovoltaic Modules High Resolution Spatial Electroluminescence Imaging of Photovoltaic Modules Abstract J.L. Crozier, E.E. van Dyk, F.J. Vorster Nelson Mandela Metropolitan University Electroluminescence (EL) is a useful

More information

Laser-induced surface phonons and their excitation of nanostructures

Laser-induced surface phonons and their excitation of nanostructures CHINESE JOURNAL OF PHYSICS VOL. 49, NO. 1 FEBRUARY 2011 Laser-induced surface phonons and their excitation of nanostructures Markus Schmotz, 1, Dominik Gollmer, 1 Florian Habel, 1 Stephen Riedel, 1 and

More information

MODULE VII LARGE BODY WAVE DIFFRACTION

MODULE VII LARGE BODY WAVE DIFFRACTION MODULE VII LARGE BODY WAVE DIFFRACTION 1.0 INTRODUCTION In the wave-structure interaction problems, it is classical to divide into two major classification: slender body interaction and large body interaction.

More information

Raman Spectroscopy Basics

Raman Spectroscopy Basics Raman Spectroscopy Basics Introduction Raman spectroscopy is a spectroscopic technique based on inelastic scattering of monochromatic light, usually from a laser source. Inelastic scattering means that

More information

Pulsed laser deposition of organic materials

Pulsed laser deposition of organic materials Pulsed laser deposition of organic materials PhD theses Gabriella Kecskeméti Department of Optics and Quantum Electronics University of Szeged Supervisor: Dr. Béla Hopp senior research fellow Department

More information

A Reliability Point and Kalman Filter-based Vehicle Tracking Technique

A Reliability Point and Kalman Filter-based Vehicle Tracking Technique A Reliability Point and Kalman Filter-based Vehicle Tracing Technique Soo Siang Teoh and Thomas Bräunl Abstract This paper introduces a technique for tracing the movement of vehicles in consecutive video

More information

Automatic Detection of Emergency Vehicles for Hearing Impaired Drivers

Automatic Detection of Emergency Vehicles for Hearing Impaired Drivers Automatic Detection of Emergency Vehicles for Hearing Impaired Drivers Sung-won ark and Jose Trevino Texas A&M University-Kingsville, EE/CS Department, MSC 92, Kingsville, TX 78363 TEL (36) 593-2638, FAX

More information

Self-Calibration and Hybrid Mapping

Self-Calibration and Hybrid Mapping Self-Calibration and Hybrid Mapping Andrei Lobanov MPIfR Bonn European Radio Interferometry School Bonn, 11/09/2007 Lecture Outline Initial calibration and its deficiencies Visibility errors and dynamic

More information

This unit will lay the groundwork for later units where the students will extend this knowledge to quadratic and exponential functions.

This unit will lay the groundwork for later units where the students will extend this knowledge to quadratic and exponential functions. Algebra I Overview View unit yearlong overview here Many of the concepts presented in Algebra I are progressions of concepts that were introduced in grades 6 through 8. The content presented in this course

More information

E. K. A. ADVANCED PHYSICS LABORATORY PHYSICS 3081, 4051 NUCLEAR MAGNETIC RESONANCE

E. K. A. ADVANCED PHYSICS LABORATORY PHYSICS 3081, 4051 NUCLEAR MAGNETIC RESONANCE E. K. A. ADVANCED PHYSICS LABORATORY PHYSICS 3081, 4051 NUCLEAR MAGNETIC RESONANCE References for Nuclear Magnetic Resonance 1. Slichter, Principles of Magnetic Resonance, Harper and Row, 1963. chapter

More information

AN1200.04. Application Note: FCC Regulations for ISM Band Devices: 902-928 MHz. FCC Regulations for ISM Band Devices: 902-928 MHz

AN1200.04. Application Note: FCC Regulations for ISM Band Devices: 902-928 MHz. FCC Regulations for ISM Band Devices: 902-928 MHz AN1200.04 Application Note: FCC Regulations for ISM Band Devices: Copyright Semtech 2006 1 of 15 www.semtech.com 1 Table of Contents 1 Table of Contents...2 1.1 Index of Figures...2 1.2 Index of Tables...2

More information

Development of certified reference material of thin film for thermal diffusivity

Development of certified reference material of thin film for thermal diffusivity Development of certified reference material of thin film for thermal diffusivity Takashi Yagi, Thermophysical properties section, NMIJ/AIST Joshua Martin MML, National Institute of Standards and Technology

More information

RAY TRACING UNIFIED FIELD TRACING

RAY TRACING UNIFIED FIELD TRACING RAY TRACING Start to investigate the performance of your optical system using 3D ray distributions, dot diagrams of ray positions and directions, and optical path length. GEOMETRIC FIELD TRACING Switch

More information