TM124BBK32H, TM124BBK32I BY 32-BIT TM248CBK32H, TM248CBK32I BY 32-BIT DYNAMIC RAM MODULES

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1 Organization TM124BBK32H/I TM248CBK32H/ I Single 5-V Power Supply (±% Tolerance) 72-Pin Single In-Line Memory Module (SIMM) for Use ith Socket TM124BBK32H/ I Uses Two 16M-Bit DRAMs in Plastic Small-Outline J-Lead (SOJ) Packages TM248CBK32H/ I Uses Four 16M-Bit DRAMs in Plastic SOJ Packages Long Refresh Period 16 ms (24 Cycles) All Inputs, Outputs, Clocks Fully TTL-Compatible 3-State Output Common CAS Control for Eight Common Data-In and Data-Out Lines in Four Blocks Enhanced Page-Mode Operation ith CAS-Before-RAS (CBR), RAS-Only, and Hidden Refresh TM124BBK32H, TM124BBK32I BY 32-BIT Presence Detect Performance Ranges: ACCESS ACCESS ACCESS READ TIME TIME TIME OR trac taa tcac RITE CYCLE (MAX) (MAX) (MAX) (MIN) 124BBK32H/ I ns 25 ns 13 ns 90 ns 124BBK32H/ I ns 30 ns 15 ns 1 ns 124BBK32H/ I ns 35 ns 18 ns 130 ns 248CBK32H/ I ns 25 ns 13 ns 90 ns 248CBK32H/ I ns 30 ns 15 ns 1 ns 248CBK32H/ I ns 35 ns 18 ns 130 ns Low Power Dissipation Operating Free-Air Temperature Range 0 C to 70 C Gold-Tabbed Versions Available: TM124BBK32H TM248CBK32H Tin-Lead (Solder) Tabbed Versions Available: TM124BBK32I TM248CBK32I description TM124BBK32H/ I The TM124BBK32H/I is a 32M-bit dynamic random-access memory (DRAM) module organized as four times in a 72-pin SIMM. The SIMM is composed of two TMS418160ADZ, bit DRAMs, each in a 42-lead plastic SOJ package mounted on a substrate with decoupling capacitors. The TMS418160ADZ is described in the TMS418160A data sheet (literature number SMKS891). The TM124BBK32H/ I SIMM is available in the single-sided BK-leadless module for use with sockets. TM248CBK32H/ I The TM248CBK32H/I is a 64M-bit DRAM organized as four times in a 72-pin SIMM. The SIMM is composed of four TMS418160ADZ, bit DRAMs, each in a 42-lead plastic SOJ package mounted on a substrate with decoupling capacitors. The TMS418160ADZ is described in the TMS418160A data sheet (literature number SMKS891). The TM248CBK32H/ I SIMM is available in the double-sided BK-leadless module for use with sockets. operation The TM124BBK32H/I operates as two TMS418160ADZ DRAMs, connected as shown in the functional block diagram and Table 1. The TM248CBK32H/ I operates as four TMS418160ADZ DRAMs connected as shown in the functional block diagram and Table 1. The common I/O feature dictates the use of early-write cycles to prevent contention on D and Q. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. Part numbers in this data sheet are for the gold-tabbed version; the information applies to both gold-tabbed and solder-tabbed versions. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright 1997, Texas Instruments Incorporated POST OFFICE BOX 1443 HOUSTON, TEXAS

2 BK SINGLE-IN-LINE MEMORY MODULE ( TOP VIE ) TM124BBK32H/I ( SIDE VIE ) TM248CBK32H/I ( SIDE VIE ) VSS DQ0 DQ16 DQ1 DQ17 DQ2 DQ18 DQ3 DQ19 VCC A0 A1 A2 A3 A4 A5 A6 DQ4 DQ20 DQ5 DQ21 DQ6 DQ22 DQ7 DQ23 A7 VCC A8 A9 RAS3 RAS VSS CAS0 CAS2 CAS3 CAS1 RAS0 RAS1 DQ8 DQ24 DQ9 DQ25 DQ DQ26 DQ11 DQ27 DQ12 DQ28 VCC DQ29 DQ13 DQ30 DQ14 DQ31 DQ15 PD1 PD2 PD3 PD4 VSS SIGNAL (PIN) PIN NOMELATURE A0 A9 Address Inputs CAS0 CAS3 Column-Address Strobe DQ0 DQ31 Data In/Data Out No Connection PD1 PD4 Presence Detects RAS0 RAS3 Row-Address Strobe VCC 5-V Supply VSS Ground rite Enable PRESEE DETECT PD1 (67) PD2 (68) PD3 (69) PD4 (70) 50 ns VSS VSS VSS VSS TM124BBK32H/I 60 ns VSS VSS 70 ns VSS VSS VSS 50 ns VSS VSS TM248CBK32H/I 60 ns 70 ns VSS 2 POST OFFICE BOX 1443 HOUSTON, TEXAS

3 operation (continued) DATA BLOCK Table 1. Connection Table RASx SIDE 1 SIDE 2 CASx DQ0 DQ7 RAS0 RAS1 CAS0 DQ8 DQ15 RAS0 RAS1 CAS1 DQ16 DQ23 RAS2 RAS3 CAS2 DQ24 DQ31 RAS2 RAS3 CAS3 Side 2 applies to the TM248CBK32H/I only. single in-line memory module and components PC substrate: 1,27 ± 0,1 mm (0.05 inch) nominal thickness; inch/ inch maximum warpage Bypass capacitors: Multilayer ceramic Contact area for TM124BBK32H and TM248CBK32H: Nickel plate and gold plate over copper Contact area for TM124BBK32I and TM248CBK32I: Nickel plate and tin/ lead over copper functional block diagram (TM124BBK32H/I and TM248CBK32H/I, side 1) A0 A9 RAS0 RAS2 CAS0 CAS1 1M 16 A0 A9 DQ0 D0 D7 RAS DQ7 LCAS DQ8 CAS2 D8 D15 UCAS DQ15 CAS3 1M 16 A0 A9 DQ0 RAS DQ7 LCAS DQ8 UCAS DQ15 D16 D23 D24 D31 functional block diagram (TM248CBK32H/I, side 2) A0 A9 RAS1 RAS3 CAS1 CAS0 1M 16 A0 A9 DQ0 D8 D15 RAS DQ7 LCAS DQ8 CAS3 D0 D7 UCAS DQ15 CAS2 1M 16 A0 A9 DQ0 RAS DQ7 LCAS DQ8 UCAS DQ15 D24 D31 D16 D23 POST OFFICE BOX 1443 HOUSTON, TEXAS

4 absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage range, V CC (see Note 1) V to 7 V Voltage range on any pin (see Note 1) V to 7 V Short-circuit output current ma Power dissipation: TM124BBK32H, TM124BBK32I TM248CBK32H, TM248CBK32I Operating free-air temperature range, T A C to 70 C Storage temperature range, T stg C to 125 C Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: All voltage values are with respect to VSS. recommended operating conditions MIN NOM MAX VCC Supply voltage V VIH High-level input voltage V VIL Low-level input voltage (see Note 2) V TA Operating free-air temperature 0 70 C NOTE 2: The algebraic convention, where the more negative (less positive) limit is designated as minimum, is used for logic-voltage levels only. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) VOH VOL II IO PARAMETER High-level output voltage Low-level output voltage Input current (leakage) Output current (leakage) TEST CONDITIONS 124BBK32H/ I BBK32H/ I BBK32H/ I - 70 IOH = 5 ma V IOL = 4.2 ma V VCC = 5.5 V, VI = 0 V to 6.5 V, All other pins = 0 V to VCC VCC = 5.5 V, VO = 0 V to VCC, CAS high ± ± ± µa ± ± ± µa ICC1 Read- or write-cycle current VCC = 5.5 V, Minimum cycle ma VIH = 2.4 V (TTL), After 1 memory cycle, ma ICC2 Standby current RAS and CAS high VIH = VCC 0.2 V (CMOS), After 1 memory cycle, ma RAS and CAS high ICC3 VCC = 5.5 V, Minimum cycle, Average refresh RAS cycling, current CAS high (RAS only); (RAS only or CBR) RAS low after CAS low (CBR) ma ICC4 Average page VCC = 5.5 V, tpc = MIN, current RAS low, CAS cycling ma For test conditions shown as MIN / MAX, use the appropriate value specified under recommended operating conditions. 4 POST OFFICE BOX 1443 HOUSTON, TEXAS

5 electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) VOH VOL II IO ICC1 ICC2 ICC3 PARAMETER High-level output voltage Low-level output voltage Input current (leakage) Output current (leakage) Read- or write-cycle current (see Note 3) Standby current Average refresh current (RAS only or CBR) (see Note 3) TEST CONDITIONS 248CBK32H/ I CBK32H/ I CBK32H/ I - 70 IOH = 5 ma V IOL = 4.2 ma V VCC = 5.5 V, VI = 0 V to 6.5 V, All other pins = 0 V to VCC VCC = 5.5 V, VO = 0 V to VCC, CAS high ± ± ± µa ± 20 ± 20 ± 20 µa VCC = 5.5 V, Minimum cycle ma VIH = 2.4 V (TTL), After 1 memory cycle, RAS and CAS high VIH = VCC 0.2 V (CMOS), After 1 memory cycle, RAS and CAS high VCC = 5.5 V, Minimum cycle, RAS cycling, CAS high (RAS only); RAS low after CAS low (CBR) ma ma ma Average page ICC4 current VCC = 5.5 V, tpc = MIN, ma RAS low, CAS cycling (see Note 4) For test conditions shown as MIN / MAX, use the appropriate value specified under recommended operating conditions. NOTES: 3. Measured with a maximum of one address change while RAS = VIL 4. Measured with a maximum of one address change while CAS = VIH capacitance over recommended ranges of supply voltage and operating free-air temperature, f = 1 MHz (see Note 5) PARAMETER 124BBK32H/ I 248CBK32H/ I MIN MAX MIN MAX Ci(A) Input capacitance, A0 A9 20 pf Ci(R) Input capacitance, RAS inputs 7 7 pf Ci(C) Input capacitance, CAS inputs 7 14 pf Ci() Input capacitance, pf Co(DQ) Output capacitance on DQ0 DQ pf NOTE 5: VCC = 5 V ± 0.5 V, and the bias on pins under test is 0 V. POST OFFICE BOX 1443 HOUSTON, TEXAS

6 switching characteristics over recommended ranges of supply voltage and operating free-air temperature PARAMETER 124BBK32H/ I CBK32H/ I BBK32H/ I CBK32H/ I BBK32H/ I CBK32H/ I - 70 taa Access time from column address ns tcac Access time from CAS low ns trac Access time from RAS low ns tcpa Access time from column precharge ns tclz CAS to output in the low-impedance state ns toh Output disable time from start of CAS high ns toff Output disable time after CAS high (see Note 6) ns NOTE 6: toff is specified when the output is no longer driven. timing requirements over recommended ranges of supply voltage and operating free-air temperature 124BBK32H/ I CBK32H/ I BBK32H/ I CBK32H/ I BBK32H/ I CBK32H/ I - 70 trc Cycle time, random read or write (see Note 7) ns trc Cycle time, read-write ns tpc Cycle time, page-mode read or write (see Notes 7 and 8) ns trasp Pulse duration, page mode, RAS low ns tras Pulse duration, nonpage mode, RAS low ns tcas Pulse duration, CAS low ns tcp Pulse duration, CAS high 8 ns trp Pulse duration, RAS high (precharge) ns tp Pulse duration, low ns tasc Setup time, column address before CAS low ns tasr Setup time, row address before RAS low ns tds Setup time, data before CAS low ns trcs Setup time, high before CAS low ns tcl Setup time, low before CAS high ns trl Setup time, low before RAS high ns tcs Setup time, low before CAS low ns tcah Hold time, column address after CAS low 15 ns trhcp Hold time, RAS high from CAS precharge ns tdh Hold time, data after CAS low 15 ns trah Hold time, row address after RAS low 8 ns trch Hold time, high after CAS high (see Note 9) ns trrh Hold time, high after RAS high (see Note 9) ns NOTES: 7. All cycles assume tt = 5 ns. 8. To assure tpc min, tasc should be tcp. 9. Either trrh or trch must be satisfied for a read cycle. 6 POST OFFICE BOX 1443 HOUSTON, TEXAS

7 timing requirements over recommended ranges of supply voltage and operating free-air temperature 124BBK32H/ I CBK32H/ I BBK32H/ I CBK32H/ I BBK32H/ I CBK32H/ I - 70 tch Hold time, low after CAS low 15 ns tchr Delay time, RAS low to CAS high (CBR refresh only) ns tcrp Delay time, CAS high to RAS low ns tcsh Delay time, RAS low to CAS high ns tcsr Delay time, CAS low to RAS low (CBR refresh only) ns trad Delay time, RAS low to column address (see Note ) ns tral Delay time, column address to RAS high ns tcal Delay time, column address to CAS high ns trcd Delay time, RAS low to CAS low (see Note ) ns trpc Delay time, RAS high to CAS low (CBR only) ns trsh Delay time, CAS low to RAS high ns tref Refresh time interval ms tt Transition time ns NOTE : The maximum value is specified only to ensure access time. device symbolization (TM124BBK32H/I illustrated) TM124BBK32H -SS YYMMT YY = MM = T = -SS = Year Code Month Code Assembly Site Code Speed Code NOTE A: Location of symbolization may vary. POST OFFICE BOX 1443 HOUSTON, TEXAS

8 MECHANICAL DATA BK (R-PSIM-N72) SINGLE-IN-LINE MEMORY MODULE (3,18) TYP (8,08) (7,82) (1,37) (1,19) (25,53) (25,27) (1,27) (1,02) TYP (3,25) (3,05) 0.0 (0,25) MAX (,16) TYP (5,28) MAX (9,14) MAX (For Double-Sided SIMM) / B 02/96 NOTES: A. All linear dimensions are in inches (millimeters). B. This drawing is subject to change without notice. 8 POST OFFICE BOX 1443 HOUSTON, TEXAS

9 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its products to the specifications applicable at the time of sale in accordance with TI s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Customers are responsible for their applications using TI components. In order to minimize risks associated with the customer s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such products or services might be or are used. TI s publication of information regarding any third party s products or services does not constitute TI s approval, license, warranty or endorsement thereof. Reproduction of information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations and notices. Representation or reproduction of this information with alteration voids all warranties provided for an associated TI product or service, is an unfair and deceptive business practice, and TI is not responsible nor liable for any such use. Resale of TI s products or services with statements different from or beyond the parameters stated by TI for that product or service voids all express and any implied warranties for the associated TI product or service, is an unfair and deceptive business practice, and TI is not responsible nor liable for any such use. Also see: Standard Terms and Conditions of Sale for Semiconductor Products. Mailing Address: Texas Instruments Post Office Box Dallas, Texas Copyright 2001, Texas Instruments Incorporated

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