CD4511BC BCD-to-7 Segment Latch/Decoder/Driver

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1 CD4511BC BCD-to-7 Segment Latch/Decoder/Driver General Description The CD4511BC BCD-to-seven segment latch/decoder/ driver is cotructed with complementary MOS (CMOS) enhancement mode devices and NPN bipolar output drivers in a single monolithic structure. The circuit provides the functio of a 4-bit storage latch, an 8421 BCD-to-seven segment decoder, and an output drive capability. Lamp test (LT), blanking (BI), and latch enable (LE) inputs are used to test the display, to turn-off or pulse modulate the brightness of the display, and to store a BCD code, respectively. It can be used with seven-segment light emitting diodes (LED), incandescent, fluorescent, gas discharge, or liquid crystal readouts either directly or indirectly. Applicatio include itrument (e.g., counter, DM, etc.) display driver, computer/calculator display driver, cockpit display driver, and various clock, watch, and timer uses. Ordering Code: Features October 1987 Revised April 2002 Low logic circuit power dissipation High current sourcing outputs (up to 25 ma) Latch storage of code Blanking input Lamp test provision Readout blanking on all illegal input combinatio Lamp inteity modulation capability Time share (multiplexing) facility Equivalent to Motorola MC14511 CD4511BC BCD-to-7 Segment Latch/Decoder/Driver Order Number Package Number Package Description CD4511BCWM M16B 16-Lead Small Outline Intergrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide CD4511BCN N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide Devices also available in Tape and Reel. Specify by appending suffix letter X to the ordering code. Connection Diagrams Segment Identification Top iew 2002 Fairchild Semiconductor Corporation DS

2 CD4511BC Truth Table X = Don t Care *Depends upon the BCD code applied during the 0 to 1 traition of LE. Display Inputs Outputs LE BI LT D C B A a b c d e f g Display X X 0 X X X X B X 0 1 X X X X X X X X * * 2

3 Absolute Maximum Ratings(Note 1) DC Supply oltage ( DD ) 0.5 to +18 Input oltage ( IN ) 0.5 to DD +0.5 Storage Temperature Range (T S ) 65 C to +150 C Power Dissipation (P D ) Dual-In-Line 700 mw Small Outline 500 mw Lead Temperature (T L ) (Soldering, 10 seconds) 260 C Recommended Operating Conditio DC Supply oltage ( DD ) Input oltage ( IN ) Operating Temperature Range (T A ) Note 1: Devices should not be connected with power on. 3 to 15 0 to DD 55 C to +125 C CD4511BC DC Electrical Characteristics 55 C +25 C +125 C Symbol Parameter Conditio Min Max Min Typ Max Min Max I DD Quiescent DD = Supply Current DD = DD = OL Output oltage DD = Logical 0 DD = Level DD = OH Output oltage DD = Logical 1 DD = Level DD = IL LOW Level DD = 5, OUT = 3.8 or Input oltage DD = 10, OUT = 8.8 or DD = 15, OUT = 13.8 or IH HIGH Level DD = 5, OUT = 0.5 or Input oltage DD = 10, OUT = 1.0 or DD = 15, OUT = 1.5 or OH Output DD = 5, I OH = 0 ma (Source) Drive DD = 5, I OH = 5 ma 4.24 oltage DD = 5, I OH = 10 ma DD = 5, I OH = 15 ma 3.94 DD = 5, I OH = 20 ma DD = 5, I OH = 25 ma 3.54 DD = 10, I OH = 0 ma DD = 10, I OH = 5 ma 9.26 DD = 10, I OH = 10 ma DD = 10, I OH = 15 ma 9.04 DD = 10, I OH = 20 ma DD = 10, I OH = 25 ma 8.75 DD = 15, I OH = 0 ma DD = 15, I OH = 5 ma DD = 15, I OH = 10 ma DD = 15, I OH = 15 ma DD = 15, I OH = 20 ma DD = 15, I OH = 25 ma I OL LOW Level DD = 5, OL = Output Current DD = 10, OL = DD = 15, OL = I IN Input Current DD = 15, IN = DD = 15, IN = Units µa ma µa 3

4 CD4511BC AC Electrical Characteristics (Note 2) T A = 25 C and C L = 50 pf, typical temperature coefficient for all values of DD = 0.3%/ C Symbol Parameter Conditio Min Typ Max Units C IN Input Capacitance IN = pf t r Output Rise Time DD = (Figure 1a) DD = DD = t f Output Fall Time DD = (Figure 1a) DD = DD = t PLH Turn-Off Delay Time DD = (Data) (Figure 1a) DD = DD = t PHL Turn-On Delay Time DD = (Data) (Figure 1a) DD = DD = t PLH Turn-Off Delay Time DD = (Blank) (Figure 1a) DD = DD = t PHL Turn-On Delay Time DD = (Blank) (Figure 1a) DD = DD = t PLH Turn-Off Delay Time DD = (Lamp Test) (Figure 1a) DD = DD = t PHL Turn-On Delay Time DD = (Lamp Test) (Figure 1 a) DD = DD = t SETUP Setup Time DD = (Figure 1b) DD = DD = t HOLD Hold Time DD = (Figure 1b) DD = DD = PW LE Minimum Latch Enable DD = Pulse Width (Figure 1 c) DD = DD = Note 2: AC Parameters are guaranteed by DC correlated testing. 4

5 Switching Time Waveforms CD4511BC FIGURE

6 CD4511BC Typical Applicatio Light Emitting Diode (LED) Readout Gas Discharge Readout Liquid Crystal (LC) Readout Direct DC drive of LC s not recommended for life of LC readouts. Incandescent Readout Fluorescent Readout **A filament pre-warm resistor is recommended to reduce filament thermal shock and increase the effective cold resistance of the filament. 6

7 Physical Dimeio inches (millimeters) unless otherwise noted CD4511BC 16-Lead Small Outline Intergrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Package Number M16B 7

8 CD4511BC BCD-to-7 Segment Latch/Decoder/Driver Physical Dimeio inches (millimeters) unless otherwise noted (Continued) 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide Package Number N16E Fairchild does not assume any respoibility for use of any circuitry described, no circuit patent licees are implied and Fairchild reserves the right at any time without notice to change said circuitry and specificatio. LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with itructio for use provided in the labeling, can be reasonably expected to result in a significant injury to the user A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.

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