Reflectance Measurements of Materials Used in the Solar Industry. Selecting the Appropriate Accessories for UV/Vis/NIR Measurements.
|
|
- Osborne Nelson
- 4 years ago
- Views:
Transcription
1 T e c h n i c a l N o t e Reflectance Measurements of Materials Used in the Solar Industry UV/Vis/NIR Author: Dr. Jeffrey L. Taylor PerkinElmer, Inc. 710 Bridgeport Avenue Shelton, CT USA Selecting the Appropriate Accessories for UV/Vis/NIR Measurements Introduction One of the most common measurements made by the solar energy industry today is quantification of a material s surface reflectance. These materials are as diverse as metal coatings, semiconductor coatings, anti-reflective coatings on window material, as well as the window material itself. While both transmission and reflectance are of interest to the industry, we will consider only reflectance measurements in this technical note. These measurements are most commonly made between 300 nm and 1500 nm which is where the solar cell is responsive to energy from the sun. Reflection comes in two varieties, specular and diffuse. This technical note will concentrate on the instrumental accessories used to measure both types of reflection and compare/contrast spectra collected on the accessories. Unfortunately many materials manifest a combination of both specular and diffuse reflectance. This can present a problem in selection of the best reflectance accessory that will yield correct intensity data (%R) with minimal spectral artifacts. The primary goal of this technical note is to guide the user through the accessory selection process for different specular/ diffuse samples. This will be achieved by measuring identical samples with varying contributions of diffuse and specular reflection, on three different reflection accessories, and then comparing the spectra generated.
2 accessory design. The most common types of absolute specular accessories are the VN, VW and Universal Reflectance Accessory (URA). The VN (single sample bounce) and VW (double sample bounce) accessories are named from the beam path geometry of the background (V) and the sample (N and W) collection modes. Mirror movement between background and sample modes is by hand. The URA is a variable angle, single sample bounce, VN style accessory where the mirror movement and incidence angle selection are totally automated by electronic stepper motors. Figure 1. Types of reflection. Specular reflection (Figure 1-A) is generated by a smooth surface. The light ray s angle of incidence is equal to the angle of reflection; therefore, specular materials frequently produce images on their surface (mirror). Specular reflectance is measured by a number of different types of accessories (VW, VN, and Universal Reflectance Accessory). General Integrating Sphere Figure 2 shows the general optical design for an integrating sphere. The transfer optics for the reference beam (M3, M4) and the sample beam (M1, M2) direct the light through open holes in the Spectralon sphere body into the sphere where they strike the sample reflectance port and reference port areas. In the interior of the sphere you can see through the center-mount port the baffles that shield the detectors from first bounce sample reflectance or transmittance. Under normal measurement conditions the sample reflectance port and the reference port are covered by either a Spectralon plate or sample material. The transmittance port and reference beam entry port are usually open during reflectance measurements and are areas where light diffusely reflected from the sample can escape from the sphere. Diffuse reflection (Figure 1-B) is generated by a rough surface. In this case, the light ray s incidence angle gives rise to a multiplicity of reflection angles; therefore, images are not produced. Diffuse reflectance is how people see the world since the vast majority of objects in the world are diffuse reflectors. Diffuse reflection is measured by integrating spheres, two sizes are available, small (60 mm diameter) and large (150 mm diameter). Definitions Relative Specular Reflectance Accessory This refers to the simplest and least expensive specular accessory. A relative specular accessory must use a calibrated reference mirror to measure the background values. When samples are measured, a mathematical calculation must be performed using the known values from the reference mirror to correct the samples to absolute reflectance. Absolute Specular Reflectance Accessory This type of specular accessory does not require a reference mirror to make an absolute reflectance measurement. The accessory is designed with moving transfer optics (mirrors) that have different configurations for background collection and sample measurement. As long as the transfer optics move in such a way that the same mirrors are used for the background and sample collection, and the total distance along the beam path is the same between background and sample collection, then the reflectance measurement is absolute by Figure 2. Basic optical layout for a double beam integrating sphere. 60 mm Integrating Sphere This is a low cost reflectance accessory that measures both diffuse and total reflectance. It consists of a hollow 60 mm sphere of highly reflective Spectralon polymer with two ports for the sample and reference beam to enter and two ports for placement of sample and reference material. Background collection is performed by placing two Spectralon plates at the sample and reference ports. Since Spectralon has a diffuse reflectance of > 99.0 %R, the reflectance of spheres can be assumed to be close to absolute %R. Because of the size of the sphere and the lack of baffling of the detectors in the sphere from first bounce sample reflectance, this sphere type is subject to several types of spectral artifact such as incorrect %R values and steps at instrumental filter and detector change points. 2
3 150 mm Integrating Sphere This larger 150 mm sphere operates in a similar fashion to its smaller 60 mm counterpart. The two notable differences are its larger sphere diameter and the baffling of the internal detectors via Spectralon coated paddles. The larger sphere size makes the port area for the sample and reference beams a smaller proportion of the total sphere area than in the smaller 60 mm sphere. The baffles prevent a first bounce reflectance ray from the sample from striking the detectors. The ideal number of bounces in a sphere is around ten. The 150 mm sphere is typically known as a standard color sphere. Its design is controlled by the color industry regulatory agencies to ensure uniformity of data between spheres manufactured by different companies. Its design also eliminates or reduces artifacts present in smaller nonregulation spheres. to enter. Light that is reflected from the sample can escape through these ports and is therefore not measured. The larger the sphere is, the smaller the area of the ports to the total surface area of the sphere. The spectra from the 150 mm sphere is higher because the relative hole to surface area is smaller than the 60 mm sphere. Therefore, more diffusely reflected light from the sample is collected. So which spectra are correct? Neither technically. The 150 mm sphere data are, however, much closer to the absolute diffuse reflectance of the sample (within 1 or 2 %R) than the 60 mm sphere. Experimental Reflectance accessory evaluation employed four samples that span the range of typical solar industry materials. Sample 1 is a diffuse material with a small specular component, Sample 2 is a clear specular coating of low intensity, Sample 3 is a colored specular coating of medium intensity, and Sample 4 is a specular semi-conductor material of high intensity. Each of the four samples was measured on a 60 mm integrating sphere, a 150 mm integrating sphere, and a URA accessory. All sphere measurements were 8 degree hemispherical in total reflectance collection mode. The URA measurements were at 8 degree angle of incidence. All other instrumental parameters were the same for all four samples. Results and Discussion Two basic characteristics of integrating spheres relate to their photometric accuracy and freedom from such artifacts as steps at filter and detector changes. These are sphere size (diameter) and the presence of internal baffles that protect the detectors from first bounce reflectance from the sample. The nature of the artifacts and inaccuracies depends on the sample s reflection intensity and properties (specular or diffuse). Figure 3 plots the spectra from Sample 1 (diffuse material with a small specular component) measured by the two types of integrating spheres. The spectra are qualitatively similar yet different quantitatively. The textured sample in Figure 3 is a diffuse sample. So why are the spectra different when measured on different size spheres? All spheres must have ports for the instrumental beam Figure 3. Spectra of Sample 1 (textured sample). What happens when you measure a totally specular sample with little or no diffuse component in a sphere? In order to answer this question we need understand what happens to the light inside the sphere. Figure 4A depicts how both diffuse and specular light reflects off the sample into the sphere. The diffuse reflected light will illuminate the entire area inside the sphere through 380 degrees. The specular reflected light will strike only an area along the midline of the sphere in the vicinity of the transmittance port. Photographs of this area, taken via a webcam inserted inside the sphere, are shown in Figures 4B, C, and D. The photograph in Figure 4B shows the even illumination of the sphere from a 100% diffuse reflectance sample. However, if a specular sample is placed at the sample port, a hot spot is formed on the wall of the sphere. This hot spot is photographed in Figures 4C and 4D for a 10% R and a 90% R specular sample respectively. Note that there is little illumination of the sphere A B C D Figure 4. 3
4 interior and only the concentrated hot spot shows up. The brightness of the hot spot is directly related to the reflectivity of the specular sample. Errors result from the fact that the background correction performed with the diffuse Spectralon plate illuminates the sphere differently from the specular sample hot spot illumination. The resulting different sphere interior images that the detector measures between background and sample causes error artifacts. Figure 5 plots the spectra from Sample 2 (clear specular coating of low intensity) measured by the two types of integrating spheres plus the URA specular accessory. Note that the 150 mm sphere (black) and URA (green) agree very closely. However, the spectra for the 60 mm sphere has a higher %R and suffers from a small step artifact at the detector change point at 860 nm. It is interesting that with specular samples the highest %R value is from the 60 mm sphere (compare with Figure 4). This is because the hot spot dominates and concentrates the light the detector measures. In addition, since there is little diffuse light in the sphere, there is no light to escape from the open ports. Figure 7 plots the spectra from Sample 4 (specular semi-conductor material of high intensity) measured by the two types of integrating spheres plus the URA. When the reflectance intensity becomes high enough there is disagreement for the same sample throughout all three reflectance accessories. There is, with this sample, a pronounced difference (5%R) between spectra from the 60 mm sphere and the URA. In addition, the 150 mm sphere and the URA spectra no longer share any overlap. The detector step at 860 nm in the 60 mm sphere spectrum is also now very pronounced. Figure 6. Spectra of Sample 3 (medium intensity specular sample). Black line measured on 150 mm sphere. Figure 5. Spectra of Sample 2 (low intensity specular sample). Figure 6 plots the spectra from Sample 3 (colored specular coating of medium intensity) measured by the two types of integrating spheres plus the URA. This sample is somewhat unusual because of the increased spectra structural detail and is a more intense specular sample. However, it follows the general pattern of Sample 3. The 60 mm sphere spectrum suffers from pronounced wavelength shift and intensity offset. There are now irregularities between the 150 mm sphere and URA spectra. The step at the detector change in the 60 mm sphere data is most likely masked by the steep slope of the spectrum at this wavelength. Figure 7. Spectra of Sample 4 (high intensity specular sample). 4
5 Conclusion 1) For accurate and artifact free data, highly or totally specular samples should be measured on a suitable absolute specular reflection accessory such as a URA, VN, or VW accessory. Integrating spheres can only provide approximate specular reflection data with the degree of error depending on the nature of the sample and the intensity of its reflection. 2) In the solar industry however, total reflection measurements must be obtained for highly specular samples. Under these circumstances integrating spheres can provide acceptable spectra for diffuse and combination diffuse/specular samples. In addition, most spheres have the ability to measure either diffuse only and total reflectance (diffuse plus specular). In diffuse-only mode the sphere is configured to allow the specular component to exit the sphere via an open port. CAUTION: It is not possible to obtain an absolute specular spectrum by measuring the total and diffuse reflection spectra and then subtract. The port that allows the escape of the specular component also permits a small amount of diffuse component to escape, thus the subtraction calculation will yield an inaccurate, higher than expected %R. The primary purpose of the diffuseonly mode is to eliminate specular glare from diffuse sample measurements. 3) The standard color 150 mm sphere is the only sphere that will give accurate and comparable spectra between different instrument/sphere models. The smaller 60 mm sphere with its larger port to surface area ratio and lack of detector baffling will cause lower %R measurements and step artifacts in the spectra respectively. 4) Some solar industry materials are highly specular but also contain small amounts of a diffuse component that make measurement on an absolute specular accessory problematic. For these types of samples, a 150 mm integrating sphere can be employed with the following procedure. A calibrated front surface aluminum mirror, rather than the Spectralon plate, is used for the background correction at the sample port. A mathematical correction using the values of the calibrated mirror is employed to correct the raw spectral data to absolute %R (the %RC mode automatically calculates this correction in UV/WinLab software). The aluminum mirror replicates the hot spot of the specular sample, thereby eliminating the hot spot artifact and yielding acceptable absolute %R data. Best results are achieved when the intensity of the sample and calibrated mirror are of similar %R values. 5) The 60 mm sphere is a lower cost alternative when the primary use is as a transmittance collection sphere or where qualitative or relative quantitative spectra are of interest. Ordering Information Part Number L L L L L Description Universal Reflectance Accessory (UV/Vis only) for L650 and L850 Universal Reflectance Accessory (UV/Vis/NIR) for L950 Universal Reflectance Accessory (UV/Vis/NIR) for L1050 Integrating Sphere Accessory 60 mm PbS Detector Integrating Sphere Accessory 150 mm PbS Detector PerkinElmer, Inc. 940 Winter Street Waltham, MA USA P: (800) or (+1) For a complete listing of our global offices, visit Copyright 2009, PerkinElmer, Inc. All rights reserved. PerkinElmer is a registered trademark of PerkinElmer, Inc. All other trademarks are the property of their respective owners _01
Measurement of Enhanced Specular Reflector (ESR) Films Using a LAMBDA 1050 UV/Vis/NIR Spectrometer and URA Accessory
FIELD APPLICATION REPORT UV/Vis/NIR Spectroscopy Author: Frank Padera Shelton, CT Contributor: Chris Lynch Shelton, CT Measurement of Enhanced Specular Reflector (ESR) Films Using a LAMBDA 1050 UV/Vis/NIR
Fiber Optic Sampling by UV/Vis and UV/Vis/NIR Spectroscopy
Fiber Optic Sampling by UV/Vis and UV/Vis/NIR Spectroscopy UV/VIS AND UV/VIS/NIR SPECTROSCOPY A P P L I C A T I O N N O T E Introduction The availability and applications of fiber optic sampling in UV/Vis
Theremino System Theremino Spectrometer Technology
Theremino System Theremino Spectrometer Technology theremino System - Theremino Spectrometer Technology - August 15, 2014 - Page 1 Operation principles By placing a digital camera with a diffraction grating
EXPERIMENT O-6. Michelson Interferometer. Abstract. References. Pre-Lab
EXPERIMENT O-6 Michelson Interferometer Abstract A Michelson interferometer, constructed by the student, is used to measure the wavelength of He-Ne laser light and the index of refraction of a flat transparent
ICC Recommendations for Color Measurement
White Paper #3 Level: Introductory Date: Dec 2004 ICC Recommendations for Color Measurement Introduction In order to prepare a useful device profile based on the International Color Consortium s Specification,
Particle Characterization of UV Blocking Sunscreens and Cosmetics Using UV/Visible Spectroscopy
TECHNICAL NOTE UV/Visible Spectroscopy Authors: Jeffrey L. Taylor, Ph.D. Chris Lynch Jillian F. Dlugos PerkinElmer, Inc. Shelton, CT Particle Characterization of UV Blocking Sunscreens and Cosmetics Using
Light Control and Efficacy using Light Guides and Diffusers
Light Control and Efficacy using Light Guides and Diffusers LEDs 2012 Michael Georgalis, LC Marketing Manager, Fusion Optix October 11, 2012 Agenda Introduction What Is Light Control? Improves Application
Synthetic Sensing: Proximity / Distance Sensors
Synthetic Sensing: Proximity / Distance Sensors MediaRobotics Lab, February 2010 Proximity detection is dependent on the object of interest. One size does not fit all For non-contact distance measurement,
Introduction to Fourier Transform Infrared Spectrometry
Introduction to Fourier Transform Infrared Spectrometry What is FT-IR? I N T R O D U C T I O N FT-IR stands for Fourier Transform InfraRed, the preferred method of infrared spectroscopy. In infrared spectroscopy,
Project 2B Building a Solar Cell (2): Solar Cell Performance
April. 15, 2010 Due April. 29, 2010 Project 2B Building a Solar Cell (2): Solar Cell Performance Objective: In this project we are going to experimentally measure the I-V characteristics, energy conversion
Spectrophotometry and the Beer-Lambert Law: An Important Analytical Technique in Chemistry
Spectrophotometry and the Beer-Lambert Law: An Important Analytical Technique in Chemistry Jon H. Hardesty, PhD and Bassam Attili, PhD Collin College Department of Chemistry Introduction: In the last lab
We bring quality to light. MAS 40 Mini-Array Spectrometer. light measurement
MAS 40 Mini-Array Spectrometer light measurement Features at a glance Cost-effective and robust CCD spectrometer technology Standard USB interface Compatible with all Instrument Systems measuring adapters
Laboratory #3 Guide: Optical and Electrical Properties of Transparent Conductors -- September 23, 2014
Laboratory #3 Guide: Optical and Electrical Properties of Transparent Conductors -- September 23, 2014 Introduction Following our previous lab exercises, you now have the skills and understanding to control
Overview. What is EMR? Electromagnetic Radiation (EMR) LA502 Special Studies Remote Sensing
LA502 Special Studies Remote Sensing Electromagnetic Radiation (EMR) Dr. Ragab Khalil Department of Landscape Architecture Faculty of Environmental Design King AbdulAziz University Room 103 Overview What
AP Physics B Ch. 23 and Ch. 24 Geometric Optics and Wave Nature of Light
AP Physics B Ch. 23 and Ch. 24 Geometric Optics and Wave Nature of Light Name: Period: Date: MULTIPLE CHOICE. Choose the one alternative that best completes the statement or answers the question. 1) Reflection,
ID Objective Requirements Description of Test Date & Examiner 15 Verify that the optics?? OMC
NAOMI OMC/NCU Acceptance Tests at the University of Durham ATC Document number AOW/GEN/RAH/15.0/06/00 OMC/NCU acceptance tests DRAFT (Version date: 2 nd June 2000) wht-naomi-44 The ID numbers are those
P R E A M B L E. Facilitated workshop problems for class discussion (1.5 hours)
INSURANCE SCAM OPTICS - LABORATORY INVESTIGATION P R E A M B L E The original form of the problem is an Experimental Group Research Project, undertaken by students organised into small groups working as
Fundamentals of modern UV-visible spectroscopy. Presentation Materials
Fundamentals of modern UV-visible spectroscopy Presentation Materials The Electromagnetic Spectrum E = hν ν = c / λ 1 Electronic Transitions in Formaldehyde 2 Electronic Transitions and Spectra of Atoms
Fiber Optics: Fiber Basics
Photonics Technical Note # 21 Fiber Optics Fiber Optics: Fiber Basics Optical fibers are circular dielectric wave-guides that can transport optical energy and information. They have a central core surrounded
UV/VIS/IR SPECTROSCOPY ANALYSIS OF NANOPARTICLES
UV/VIS/IR SPECTROSCOPY ANALYSIS OF NANOPARTICLES SEPTEMBER 2012, V 1.1 4878 RONSON CT STE K SAN DIEGO, CA 92111 858-565 - 4227 NANOCOMPOSIX.COM Note to the Reader: We at nanocomposix have published this
2 Absorbing Solar Energy
2 Absorbing Solar Energy 2.1 Air Mass and the Solar Spectrum Now that we have introduced the solar cell, it is time to introduce the source of the energy the sun. The sun has many properties that could
Measuring of optical output and attenuation
Measuring of optical output and attenuation THEORY Measuring of optical output is the fundamental part of measuring in optoelectronics. The importance of an optical power meter can be compared to an ammeter
WAVELENGTH OF LIGHT - DIFFRACTION GRATING
PURPOSE In this experiment we will use the diffraction grating and the spectrometer to measure wavelengths in the mercury spectrum. THEORY A diffraction grating is essentially a series of parallel equidistant
Helium-Neon Laser. Figure 1: Diagram of optical and electrical components used in the HeNe laser experiment.
Helium-Neon Laser Experiment objectives: assemble and align a 3-mW HeNe laser from readily available optical components, record photographically the transverse mode structure of the laser output beam,
Interferometers. OBJECTIVES To examine the operation of several kinds of interferometers. d sin = n (1)
Interferometers The true worth of an experimenter consists in his pursuing not only what he seeks in his experiment, but also what he did not seek. Claude Bernard (1813-1878) OBJECTIVES To examine the
DETECTION OF COATINGS ON PAPER USING INFRA RED SPECTROSCOPY
DETECTION OF COATINGS ON PAPER USING INFRA RED SPECTROSCOPY Eduard Gilli 1,2 and Robert Schennach 1, 2 1 Graz University of Technology, 8010 Graz, Austria 2 CD-Laboratory for Surface Chemical and Physical
Infrared Thermometry. Introduction, History, and Applications. Optical Pyrometry. Jason Mershon, Advanced Energy Industries, Inc
Infrared Thermometry Introduction, History, and Applications Jason Mershon, Advanced Energy Industries, Inc In manufacturing environments, measuring the temperature of an object without contact has proven
Different Types of Dispersions in an Optical Fiber
International Journal of Scientific and Research Publications, Volume 2, Issue 12, December 2012 1 Different Types of Dispersions in an Optical Fiber N.Ravi Teja, M.Aneesh Babu, T.R.S.Prasad, T.Ravi B.tech
University of California at Santa Cruz Electrical Engineering Department EE-145L: Properties of Materials Laboratory
University of California at Santa Cruz Electrical Engineering Department EE-145L: Properties of Materials Laboratory Lab 8: Optical Absorption Spring 2002 Yan Zhang and Ali Shakouri, 05/22/2002 (Based
Chapter 23. The Reflection of Light: Mirrors
Chapter 23 The Reflection of Light: Mirrors Wave Fronts and Rays Defining wave fronts and rays. Consider a sound wave since it is easier to visualize. Shown is a hemispherical view of a sound wave emitted
Holography 1 HOLOGRAPHY
Holography 1 HOLOGRAPHY Introduction and Background The aesthetic appeal and commercial usefulness of holography are both related to the ability of a hologram to store a three-dimensional image. Unlike
Reflectance Characteristics of Accuflect Light Reflecting Ceramic
Reflectance Characteristics of Accuflect Light Reflecting Ceramic Copyright July 1 Accuratus Corporation 35 Howard Street Phillipsburg, NJ 8865 USA +1.98.13.77 http://accuratus.com SUMMARY Accuflect is
Fig.1. The DAWN spacecraft
Introduction Optical calibration of the DAWN framing cameras G. Abraham,G. Kovacs, B. Nagy Department of Mechatronics, Optics and Engineering Informatics Budapest University of Technology and Economics
User guide for Cary 5000 absorption spectrometer with external DRA 1800 attachment.
User guide for Cary 5000 absorption spectrometer with external DRA 1800 attachment. (last updated 03/17/2016) This guide is for use of the Cary 5000 with the DRA only. For use without the DRA as a standard
We bring quality to light. ISP Series Integrating Spheres
We bring quality to light. ISP Series Integrating Spheres Theory ISP-Series ISP 75 / ISP 100 / ISP 150L ISP 250 ISP 500 ISP 1000 ISP 2000 The Integrating Sphere The working principle Using integrating
Data migration from Operetta High Content Imaging System to Columbus Image Data Storage and Analysis System
CELLULAR IMAGING AND ANALYSIS Data migration from Operetta High Content Imaging System to Columbus Image Data Storage and Analysis System Introduction Images acquired on the Operetta High Content Imaging
Optical Communications
Optical Communications Telecommunication Engineering School of Engineering University of Rome La Sapienza Rome, Italy 2005-2006 Lecture #2, May 2 2006 The Optical Communication System BLOCK DIAGRAM OF
Optical Design Tools for Backlight Displays
Optical Design Tools for Backlight Displays Introduction Backlights are used for compact, portable, electronic devices with flat panel Liquid Crystal Displays (LCDs) that require illumination from behind.
Hunting Ghosts. For the development of imaging optical STRAY LIGHT ANALYSIS IN IMAGING OPTICS
Virtual prototype of the camera lens defined in [3]. Besides the lenses we model only those mechanical parts that potentially contribute the most to stray light Hunting Ghosts STRAY LIGHT ANALYSIS IN IMAGING
WOOD WEAR TESTING USING TRIBOMETER
WOOD WEAR TESTING USING TRIBOMETER Prepared by Duanjie Li, PhD 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard for tomorrow's materials. 2015 NANOVEA INTRO
Shimadzu UV-VIS User s Guide
Shimadzu UV-VIS User s Guide 1) Push the F4 button on the UV-VIS instrument keypad. This will enable PC control. Push the F4 Button 2) Log into the UV-VIS software with your username and password. 3) After
Improved predictive modeling of white LEDs with accurate luminescence simulation and practical inputs
Improved predictive modeling of white LEDs with accurate luminescence simulation and practical inputs TracePro Opto-Mechanical Design Software s Fluorescence Property Utility TracePro s Fluorescence Property
EDXRF of Used Automotive Catalytic Converters
EDXRF of Used Automotive Catalytic Converters Energy Dispersive X-Ray Fluorescence (EDXRF) is a very powerful technique for measuring the concentration of elements in a sample. It is fast, nondestructive,
Study Guide for Exam on Light
Name: Class: Date: Study Guide for Exam on Light Multiple Choice Identify the choice that best completes the statement or answers the question. 1. Which portion of the electromagnetic spectrum is used
Hitachi U-4100 UV-vis-NIR spectrophotometer (341-F)
Hitachi U-4100 UV-vis-NIR spectrophotometer (341-F) Please contact Dr. Amanda Young for training requests and assistance: 979-862-6845, amandayoung@tamu.edu Hardware Our spectrophotometer is made up of
Eight Tips for Optimal Machine Vision Lighting
Eight Tips for Optimal Machine Vision Lighting Tips for Choosing the Right Lighting for Machine Vision Applications Eight Tips for Optimal Lighting This white paper provides tips for choosing the optimal
Dual Laser InfraRed (IR) Thermometer
User s Manual Dual Laser InfraRed (IR) Thermometer MODEL 42511 Introduction Congratulations on your purchase of the Model 42511 IR Thermometer. This Infrared thermometer measures and displays non-contact
GRID AND PRISM SPECTROMETERS
FYSA230/2 GRID AND PRISM SPECTROMETERS 1. Introduction Electromagnetic radiation (e.g. visible light) experiences reflection, refraction, interference and diffraction phenomena when entering and passing
Choosing a digital camera for your microscope John C. Russ, Materials Science and Engineering Dept., North Carolina State Univ.
Choosing a digital camera for your microscope John C. Russ, Materials Science and Engineering Dept., North Carolina State Univ., Raleigh, NC One vital step is to choose a transfer lens matched to your
High-Concentration Submicron Particle Size Distribution by Dynamic Light Scattering
High-Concentration Submicron Particle Size Distribution by Dynamic Light Scattering Power spectrum development with heterodyne technology advances biotechnology and nanotechnology measurements. M. N. Trainer
WHITE PAPER. Methods for Measuring Flat Panel Display Defects and Mura as Correlated to Human Visual Perception
Methods for Measuring Flat Panel Display Defects and Mura as Correlated to Human Visual Perception Methods for Measuring Flat Panel Display Defects and Mura as Correlated to Human Visual Perception Abstract
Any source of light can be described in terms of four unique and independently respective properties:
LIGHTING Effective lighting is the essence of cinematography. Often referred to as painting with light, the art requires technical knowledge of film stocks, lighting instruments, color, and diffusion filters,
Using the Spectrophotometer
Using the Spectrophotometer Introduction In this exercise, you will learn the basic principals of spectrophotometry and and serial dilution and their practical application. You will need these skills to
Mirror, mirror - Teacher Guide
Introduction Mirror, mirror - Teacher Guide In this activity, test the Law of Reflection based on experimental evidence. However, the back-silvered glass mirrors present a twist. As light travels from
Interference. Physics 102 Workshop #3. General Instructions
Interference Physics 102 Workshop #3 Name: Lab Partner(s): Instructor: Time of Workshop: General Instructions Workshop exercises are to be carried out in groups of three. One report per group is due by
Department of Engineering Enzo Ferrari University of Modena and Reggio Emilia
Department of Engineering Enzo Ferrari University of Modena and Reggio Emilia Object: Measurement of solar reflectance, thermal emittance and Solar Reflectance Index Report Reference person: Alberto Muscio
Refraction of Light at a Plane Surface. Object: To study the refraction of light from water into air, at a plane surface.
Refraction of Light at a Plane Surface Object: To study the refraction of light from water into air, at a plane surface. Apparatus: Refraction tank, 6.3 V power supply. Theory: The travel of light waves
3D TOPOGRAPHY & IMAGE OVERLAY OF PRINTED CIRCUIT BOARD ASSEMBLY
3D TOPOGRAPHY & IMAGE OVERLAY OF PRINTED CIRCUIT BOARD ASSEMBLY Prepared by Duanjie Li, PhD & Andrea Novitsky 6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com Today's standard
ING LA PALMA TECHNICAL NOTE No. 130. Investigation of Low Fringing Detectors on the ISIS Spectrograph.
ING LA PALMA TECHNICAL NOTE No. 130 Investigation of Low Fringing Detectors on the ISIS Spectrograph. Simon Tulloch (ING) June 2005 Investigation of Low Fringing Detectors on the ISIS Spectrograph. 1.
About Coffee and Refractometers 2008-2010 Voice Systems Technology, Inc. (VST)
About Coffee and Refractometers 2008-200 Voice Systems Technology, Inc. (VST) www.mojotogo.us.0 Coffee and Refractive Index Refractive Index measurements have been used for process control in the food
SEMIAUTOMATIC SURFACE REFLECTANCE MEASUREMENT FOR MONITORING OF MATERIAL WEATHERING
SEMIAUTOMATIC SURFACE REFLECTANCE MEASUREMENT FOR MONITORING OF MATERIAL WEATHERING V. Kocour 1, J. Valach 2 1 Motivation Summary: We present a device for measurement of surface reflectance in dependence
FRC Series 35mm Diameter Reflectors for SEOUL SEMICONDUCTOR A3 (Acriche) and P7LEDs
FRC Series 35mm Diameter Reflectors for SEOUL SEMICONDUCTOR A3 (Acriche) and P7LEDs High efficiency Faceted designs provide homogeneous focused spot and spilled/direct light 34.5 mm diameter for MR-11
Reprint (R22) Avoiding Errors in UV Radiation Measurements. By Thomas C. Larason July 2001. Reprinted from Photonics Spectra, Laurin Publishing
Reprint (R22) Avoiding Errors in UV Radiation Measurements By Thomas C. Larason July 2001 Reprinted from Photonics Spectra, Laurin Publishing Gooch & Housego 4632 36 th Street, Orlando, FL 32811 Tel: 1
Characteristic curves of a solar cell
Related Topics Semi-conductor, p-n junction, energy-band diagram, Fermi characteristic energy level, diffusion potential, internal resistance, efficiency, photo-conductive effect, acceptors, donors, valence
The Fundamentals of Infrared Spectroscopy. Joe Van Gompel, PhD
TN-100 The Fundamentals of Infrared Spectroscopy The Principles of Infrared Spectroscopy Joe Van Gompel, PhD Spectroscopy is the study of the interaction of electromagnetic radiation with matter. The electromagnetic
Hygro-Thermometer + InfraRed Thermometer Model RH101
User's Guide Hygro-Thermometer + InfraRed Thermometer Model RH101 Introduction Congratulations on your purchase of the Extech Hygro-Thermometer plus InfraRed Thermometer. This device measures relative
Surface Mount LEDs - Applications Application Note
Surface Mount LEDs - Applications Application Note Introduction SMT Replaces Through Hole Technology The use of SMT-TOPLED varies greatly from the use of traditional through hole LEDs. Historically through
8001782 Owner s Manual
8001782 Digital Infrared Thermometer Owner s Manual Introduction This instrument is a portable, easy to use compact-size digital thermometer with laser sighting designed for one hand operation. The meter
Classroom Exercise ASTR 390 Selected Topics in Astronomy: Astrobiology A Hertzsprung-Russell Potpourri
Classroom Exercise ASTR 390 Selected Topics in Astronomy: Astrobiology A Hertzsprung-Russell Potpourri Purpose: 1) To understand the H-R Diagram; 2) To understand how the H-R Diagram can be used to follow
International Year of Light 2015 Tech-Talks BREGENZ: Mehmet Arik Well-Being in Office Applications Light Measurement & Quality Parameters
www.led-professional.com ISSN 1993-890X Trends & Technologies for Future Lighting Solutions ReviewJan/Feb 2015 Issue LpR 47 International Year of Light 2015 Tech-Talks BREGENZ: Mehmet Arik Well-Being in
Hello and Welcome to this presentation on LED Basics. In this presentation we will look at a few topics in semiconductor lighting such as light
Hello and Welcome to this presentation on LED Basics. In this presentation we will look at a few topics in semiconductor lighting such as light generation from a semiconductor material, LED chip technology,
Doppler. Doppler. Doppler shift. Doppler Frequency. Doppler shift. Doppler shift. Chapter 19
Doppler Doppler Chapter 19 A moving train with a trumpet player holding the same tone for a very long time travels from your left to your right. The tone changes relative the motion of you (receiver) and
FTIR Instrumentation
FTIR Instrumentation Adopted from the FTIR lab instruction by H.-N. Hsieh, New Jersey Institute of Technology: http://www-ec.njit.edu/~hsieh/ene669/ftir.html 1. IR Instrumentation Two types of instrumentation
LED Lighting - Error Consideration for Illuminance Measurement
LED Lighting - Error Consideration for Illuminance Measurement One of the most important characteristics of a luxmeter is matching to the sensitivity of the human eye V(λ). V(λ) is the spectral luminous
RL HW / RL HW+ / RL HGW / RL HV / RL HVPW/RL HVPW-G
Auto-Levelling Rotary Laser Level RL HW / RL HW+ / RL HGW / RL HV / RL HVPW/RL HVPW-G 77-496 / 77-429 / 77-439 / 77-497 / 77-427/ 77-441 Please read these instructions before operating the product Auto-Levelling
Silicon Wafer Solar Cells
Silicon Wafer Solar Cells Armin Aberle Solar Energy Research Institute of Singapore (SERIS) National University of Singapore (NUS) April 2009 1 1. PV Some background Photovoltaics (PV): Direct conversion
Physical Science Study Guide Unit 7 Wave properties and behaviors, electromagnetic spectrum, Doppler Effect
Objectives: PS-7.1 Physical Science Study Guide Unit 7 Wave properties and behaviors, electromagnetic spectrum, Doppler Effect Illustrate ways that the energy of waves is transferred by interaction with
LBS-300 Beam Sampler for C-mount Cameras. YAG Focal Spot Analysis Adapter. User Notes
LBS-300 Beam Sampler for C-mount Cameras P/N SP90183, SP90184, SP90185 and SP90186 YAG Focal Spot Analysis Adapter P/N SP90187, SP90188, SP90189, SP90190, SP90191 User Notes Ophir-Spiricon Inc. 60 West
THE POWER OF THE SUN. Solar Energy Development Solutions Comprehensive solutions for solar energy and a brighter tomorrow.
THE POWER OF THE SUN Solar Energy Development Solutions Comprehensive solutions for solar energy and a brighter tomorrow. Anne calls it simplified technologies. WE CALL IT ECOANALYTIX Evan calls it expert
Light Transmission and Reflectance
Technical information ACRYLITE cast and extruded acrylic Light Transmission and Reflectance Light and Radiation Light or electromagnetic radiation can be divided into several bands or categories each defined
Which month has larger and smaller day time?
ACTIVITY-1 Which month has larger and smaller day time? Problem: Which month has larger and smaller day time? Aim: Finding out which month has larger and smaller duration of day in the Year 2006. Format
Amptek Application Note XRF-1: XRF Spectra and Spectra Analysis Software By R.Redus, Chief Scientist, Amptek Inc, 2008.
Amptek Application Note XRF-1: XRF Spectra and Spectra Analysis Software By R.Redus, Chief Scientist, Amptek Inc, 2008. X-Ray Fluorescence (XRF) is a very simple analytical technique: X-rays excite atoms
High Performance Visible Laser Diode Scanners
A B ALLEN-BRADLEY High Performance Visible Laser Diode Scanners (Catalog No. 27-LD4z1, -LD4z4 27-LD8z1, -LD8z4) Product Data These high performance, fixed-mount scanners use a Visible Laser Diode (VLD)
Reflection Lesson Plan
Lauren Beal Seventh Grade Science AMY-Northwest Middle School Three Days May 2006 (45 minute lessons) 1. GUIDING INFORMATION: Reflection Lesson Plan a. Student and Classroom Characteristics These lessons
SOLSPEC MEASUREMENT OF THE SOLAR ABSOLUTE SPECTRAL IRRADIANCE FROM 165 to 2900 nm ON BOARD THE INTERNATIONAL SPACE STATION
SOLSPEC MEASUREMENT OF THE SOLAR ABSOLUTE SPECTRAL IRRADIANCE FROM 165 to 2900 nm ON BOARD THE INTERNATIONAL SPACE STATION G. Thuillier1, D. Bolsee2 1 LATMOS-CNRS, France 2 Institut d Aéronomie Spatiale
The Wide Field Cassegrain: Exploring Solution Space
The Wide Field Cassegrain: Exploring Solution Space Peter Ceravolo Ceravolo Optical Systems www.ceravolo.com peter@ceravolo.com Abstract This article illustrates the use of an internal aperture stop in
THERMAL RADIATION (THERM)
UNIVERSITY OF SURREY DEPARTMENT OF PHYSICS Level 2 Classical Laboratory Experiment THERMAL RADIATION (THERM) Objectives In this experiment you will explore the basic characteristics of thermal radiation,
Applications. Blue IF 039, Green IF 062, Yellow IF 022, Orange IF 041, Red IF 090,Dark Red IF 091 IR pass IF 092, IF098, IF 093 Surface 1 5/2 0.
Color Filters Blue, Green, Yellow, Orange, Red & NIR Color Filters Blue and Green filters, transmitts wavelength in a corresponding color as seen by the human eye, while yellow, orange and red are long
Welcome to this presentation on LED System Design, part of OSRAM Opto Semiconductors LED 101 series.
Welcome to this presentation on LED System Design, part of OSRAM Opto Semiconductors LED 101 series. 1 To discuss the design challenges of LED systems we look at the individual system components. A basic
Application of Automated Data Collection to Surface-Enhanced Raman Scattering (SERS)
Application Note: 52020 Application of Automated Data Collection to Surface-Enhanced Raman Scattering (SERS) Timothy O. Deschaines, Ph.D., Thermo Fisher Scientific, Madison, WI, USA Key Words Array Automation
Coating Thickness and Composition Analysis by Micro-EDXRF
Application Note: XRF Coating Thickness and Composition Analysis by Micro-EDXRF www.edax.com Coating Thickness and Composition Analysis by Micro-EDXRF Introduction: The use of coatings in the modern manufacturing
ZEISS T-SCAN Automated / COMET Automated 3D Digitizing - Laserscanning / Fringe Projection Automated solutions for efficient 3D data capture
ZEISS T-SCAN Automated / COMET Automated 3D Digitizing - Laserscanning / Fringe Projection Automated solutions for efficient 3D data capture ZEISS 3D Digitizing Automated solutions for efficient 3D data
EXPERIMENT 11 UV/VIS Spectroscopy and Spectrophotometry: Spectrophotometric Analysis of Potassium Permanganate Solutions.
EXPERIMENT 11 UV/VIS Spectroscopy and Spectrophotometry: Spectrophotometric Analysis of Potassium Permanganate Solutions. Outcomes After completing this experiment, the student should be able to: 1. Prepare
Dual Laser InfraRed (IR) Thermometer with Color Alert
User Manual Dual Laser InfraRed (IR) Thermometer with Color Alert MODEL 42509 Introduction Congratulations on your purchase of the Model 42509 IR Thermometer with Color Alert. This Infrared thermometer
IDEAL AND NON-IDEAL GASES
2/2016 ideal gas 1/8 IDEAL AND NON-IDEAL GASES PURPOSE: To measure how the pressure of a low-density gas varies with temperature, to determine the absolute zero of temperature by making a linear fit to
Optical Standards. John Nichol BSc MSc
Optical Standards John Nichol BSc MSc The following notes are presented to explain: Spherical Aberration The Airy Disk Peak to Valley, RMS and Strehl Ratio Standards of Optics produced by Nichol Optical
High Resolution Spatial Electroluminescence Imaging of Photovoltaic Modules
High Resolution Spatial Electroluminescence Imaging of Photovoltaic Modules Abstract J.L. Crozier, E.E. van Dyk, F.J. Vorster Nelson Mandela Metropolitan University Electroluminescence (EL) is a useful
Standard Test Method for Classification of Film Systems for Industrial Radiography 1
Designation: E 1815 96 (Reapproved 2001) Standard Test Method for Classification of Film Systems for Industrial Radiography 1 This standard is issued under the fixed designation E 1815; the number immediately
Spectroscopy Using the Tracker Video Analysis Program
Spectroscopy Using the Tracker Video Analysis Program Douglas Brown Cabrillo College Aptos CA 95003 dobrown@cabrillo.edu Spectroscopy has important applications in many fields and deserves more attention