CLIMATIC Test Report
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1 CLIMATIC Test Report ONLY FOR THE INTERNAL APPLICATION No internal for KFM 21_e Test Laboratory: Applicant: Purpose of Testing: Kontron Elektronik GmbH Oskar von Miller Straße Eching Germany Kontron Embedded Computers AG To show compliance with IEC PT2-1 IEC PT2-2 IEC PT2-14 IEC PT2-30 Special Measurement: none (see section "Reference Standards" for identical national standards) Note: The test data of this report relate only to the individual item tested. This report must not be reproduced unless explicitly approved by Kontron Embedded Computers AG. E Status: Page 1 from 23
2 Table of Contents 1. Administrative Data Summary of Test Results Data of Operation Mode and Configuration of EUT Operation Mode Configuration of Cables of EUT Configuration of EUT Configuration of Peripherals of EUT Performed Tests and Results Annotations to Performed Tests and to CE certification The Test in the Climatic Chamber Basic environmental testing procedures Referenced Regulations List of Test Equipment Photographs of EUT and Test Setup Climatic conditions to IEC Temperature measurement Layout : Temperature sensors KFM21_e Temperature diagrams IEC PT2-2 Non Operating IEC PT2-1 Non Operating and IEC PT2-30 Non Operating IEC Operating IEC Operating IEC Operating IEC Non Operating Reference Standards...22 E Status: Page 2 from 23
3 Table of Pictures Picture 1: Stabilizing period... Picture 2: Test Db test cycle...9 Picture 3: Recovery at controlled conditions...9 Picture 4 : IEC Climatic Chamber...12 Picture 5: IEC PT2-2 Test Bb: Dry heat for non-heat-dissipating specimen with gradual change of temperature...13 Picture 6: IEC PT2-14 Test Nb: Change of temperature with specified rate of change...13 Picture 7: IEC PT2-1 Test Ab: Cold for non heat-dissipating specimen with gradual change of temperature...14 Picture 8: IEC PT2-30,Test Db: Hour Cycle...14 Picture 9: Mounting positions of the temperature sensors...16 Picture 10: Diagram of IEC operating measurement...18 Picture 11: Diagram of IEC operating measurement...19 Picture 12: Diagram of IEC operating measurement...20 Picture 13: Diagram of IEC non operating measurement...21 E Status: Page 3 from 23
4 1. Administrative Data Equipment under test: KFM21_e optional Equipment under test: Options/accessories: None Serial number: Version of EUT: Applicant (full address): Contract identification: Contact person: Manufacturer: Kontron Elektronik GmbH none none Kontron Elektronik GmbH Receipt of EUT: 12/07/2002 Date of test: 12/07/2002 Date of report 24/07/2002 Tested by: Test report by: Karlheinz Schiege Robert Hölzl Karlheinz Schiege Robert Hölzl Ralf J. Wagner E Status: Page 4 from 23
5 2. Summary of Test Results The tested sample fully complies with the requirements set forth in IEC PT2-1 IEC PT2-2 IEC PT2-14 IEC PT2-30 (see section "Reference Standards" for identical national standards) Ralf J. Wagner Technical Manager Ralf J. Wagner Robert Hölzl Test Engineer E Status: Page 5 from 23
6 3. Data of Operation Mode and Configuration of EUT 3.1 Operation Mode Special Susceptibility tests: Susceptibility tests: Windows Screen Saver none 3.2 Configuration of Cables of EUT 3.3 Configuration of EUT Display Samsung 21,3'' UXGA LTM213U3-L07 Backlight-Inverter Samsung SK2400H für LTM213U3-L07 Power supply Bicker SNP-Z107 Receiver Distec Prisma I (UXGA) Power filter Schaffner FN321-1/05 Operating-System 1 MS WIN Configuration of Peripherals of EUT Channel Multiplexer Keyboard: Mouse: 8 Channel Cherry none Configuration optional none E Status: Page 6 from 23
7 4. Performed Tests and Results Test Classification/Result Note IEC PT2-1 The requirements are fulfilled No degradation or loss of function or performance. IEC PT2-2 The requirements are fulfilled No degradation or loss of function or performance. IEC PT2-14 The requirements are fulfilled No degradation or loss of function or performance. IEC PT2-30 The requirements are fulfilled No degradation or loss of function or performance. E Status: Page 7 from 23
8 5. Annotations to Performed Tests and to CE certification 5.1 The Test in the Climatic Chamber Climatic chamber Chamber Control Computer Damp, Heat, Cold Cyclic Agilent 20 Channel Multiplexer (Test value recording) Powersupply E Status: Page 8 from 23
9 5.2 Basic environmental testing procedures Test Db and guidance - damp heat, cyclic HOUR CYCLE (IEC PT2-30) The object of the test is to determine the suitability of components, equipment or other articles for use and/or storage under conditions of high humidity when combined with cyclic temperature changes. This test replaces the original Test D in the Publication for future applications (the parameters takes from the page 14) Picture 1: Stabilizing period Picture 2: Test Db test cycle Picture 3: Recovery at controlled conditions E Status: Page 9 from 23
10 6. Referenced Regulations (see section "Reference Standards" for identical national standards) Regulation IEC PT2-1 :1994 IEC PT2-2 :1994 EN PT2-2 :1993 IEC PT2-14 :1984 EN :1999 Comment ENVIRONMENTAL TESTING - TESTS A: COLD Concerns cold tests on both non-heat-dissipating and heat-dissipating specimens. ENVIRONMENTAL TESTING - TESTS B: DRY HEAT Contains Test Ba: Dry heat for non-heat-dissipating specimen with sudden change of temperature; Test Bb: Dry heat for non-heatdissipating specimen with gradual change of temperature; Test Bc: Dry heat for heat-dissipating specimen with sudden change of temperature; Test Bd: Dry heat for heat-dissipating specimen with gradual change of temperature. The 1987 reprint includes IEC No A. ENVIRONMENTAL TESTING - PART TESTS - TEST N - CHANGE OF TEMPERATURE Determines the ability of components, equipment and other articles to withstand rapid changes of ambient temperature. The exposure times to accomplish this depend upon the nature of the specimen. IEC PT2-30 :1980 EN :1999 BASIC ENVIRONMENTAL TESTING PROCEDURES - TEST DB AND GUIDANCE - DAMP HEAT, CYCLIC (12+12 HOUR CYCLE) Determines the suitability of components, equipment and other articles for use and/or storage under conditions of high humidity when combined with cyclic temperature changes. Special standard E Status: Page 10 from 23
11 7. List of Test Equipment Equipment Type Model Equipment No. Calibration valid until Manufacturer Climatic Chamber VUK PM-EM Heraus-Vötsch Control computer IPLite Color PM-EM not requested Kontron Elektronik Measuring system 34970A PM-EM not requested HP/Agilent Control computer Rx7000 PM-EM not requested Kontron Elektronik (check mark in 1st column) = tested with E Status: Page 11 from 23
12 8. Photographs of EUT and Test Setup Picture 4 : IEC Climatic Chamber E Status: Page 12 from 23
13 9. Climatic conditions to IEC Temperatur C 55 C Humidity % rel. 50% 21 C rel. 20% 20 Min. 60 Min. 180 Min. 200 Min. Time (Min.) Picture 5: IEC PT2-2 Test Bb: Dry heat for non-heat-dissipating specimen with gradual change of temperature Temperatur C rel.humidity % TB=60 C 55% 21 C TA=0 C 0% Time (Min.) Picture 6: IEC PT2-14 Test Nb: Change of temperature with specified rate of change E Status: Page 13 from 23
14 Temperatur C rel.humidity % 21 C 55% T A=0 C 0% Time (Min.) Picture 7: IEC PT2-1 Test Ab: Cold for non heat-dissipating specimen with gradual change of temperature Temperatur C rel.humidity % 95% 90% Ta 55 C 60% TA= 25 C Time (h) 24h Picture 8: IEC PT2-30,Test Db: Hour Cycle E Status: Page 14 from 23
15 10. Temperature measurement Inquiry of the temperature limits at temperature critical components. Chosen critical components: Display Backside Controllerchip Power supply Backlight inverter System Ambient E Status: Page 15 from 23
16 10.1 Layout : Temperature sensors KFM21_e Ambient Power Supply Unit Powersupply System Controllerchip Controllerchip Backlightinverter Display Backside Display Backside Picture 9: Mounting positions of the temperature sensors E Status: Page 16 from 23
17 11. Temperature diagrams into dependence of the surroundings to IEC (temperature, atmospheric humidity) 11.1 IEC PT2-2 Non Operating have been done, but without recording 11.2 IEC PT2-1 Non Operating and have been done, but without recording 11.3 IEC PT2-30 Non Operating have been done, but without recording E Status: Page 17 from 23
18 11.4 IEC Operating 50,00 40,00 30,00 C 20,00 10,00 0,00-10, Time (Min) PSU Backlight Display Controllerchip System Ambient Picture 10: Diagram of IEC operating measurement E Status: Page 18 from 23
19 11.5 IEC Operating 90,00 80,00 70,00 60,00 50,00 C 40,00 30,00 20,00 10,00 0, Time (Min) PSU Backlight Display Controllerchip System Ambient Picture 11: Diagram of IEC operating measurement E Status: Page 19 from 23
20 11.6 IEC Operating 75,00 65,00 55,00 45,00 C 35,00 25,00 15,00 5,00-5, Time (Min) PSU Backlight Display Controllerchip System Ambient Picture 12: Diagram of IEC operating measurement E Status: Page 20 from 23
21 11.7 IEC Non Operating 65,00 55,00 45,00 35,00 C 25,00 15,00 5,00-5,00-15,00-25, Time (Min) PSU Backlight Display Backside Controllerchip System Ambient Picture 13: Diagram of IEC non operating measurement E Status: Page 21 from 23
22 12. Reference Standards Tested standard IEC PT2-1 IEC PT2-2 IEC PT2-14 Reference Standard (identical/similar to) Identical with: BS EN PT2-1 DIN EN PT2-1 DIN IEC 68 PT2-1 EN PT2-1 HD JIS-C0020 NEN NFC NF EN SEN SS EN Technical Equivalent to: AS 1099:PT2BA AS 1099:PT2BB AS 1099:PT2BC AS 1099:PT2BD JIS-C8938 Identical with: BS EN PT2-2 DIN EN PT2-2 DIN IEC 68 PT2-2 EN PT2-2 HD JIS-C0021 JIS C0039 NEN NFC NF EN SEN SS EN Technical Equivalent to: AS 1099:PT2N AS 1099:PT2NA AS 1099:PT2NB AS 1099:PT2NC DIN EN JIS-C0025 Identical with: BS 2011:PT2.1N(1985) BS EN DIN IEC DIN IEC 68 PT2-14 EN HD NEN NEN EN IEC NFC NF EN SEN SS EN E Status: Page 22 from 23
23 Tested standard IEC PT2-30 Reference Standard (identical/similar to) Technical Equivalent to: AS 1099:PT2D JIS-C0027 Identical with: BS 2011:PT2.1DB(1981) BS EN DIN EN DIN IEC DIN IEC 68 PT2-30 EN HD NEN NEN EN IEC NFC SS EN E Status: Page 23 from 23
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