Semiconductor SEMICONDUCTOR PROBE
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1 Semiconductor SEMICONDUCTOR PROBE ECT has a long history on supplying double ended fine pitch probes. Thanks to our large market exposure on these products at most major semiconductor producers, we are able to gain a lot of expertise from our worldwide customer base. This expertise is reflected in each new probe series to stay a head of the very technical demanding and challenging Semiconductor market. Please feel free to contact us for further requirements or more information, as we offer some special requirements like ultra-high temperature applications or none magnetic probes for the MEMS market. The ZIP Advantage ECT ZIP series probes feature a number of innovative designs that provide for superior contact capable of fitting your application needs. Utilizing ECT s patented flat technology, ZIP semiconductor spring probes present a new level of accuracy, scalability, and performance. While conventional round technology restricts longer travel and can have its reliability undermined by its small contact area, ZIP possesses a large internal contact area, resulting in low C-Res, superior bandwidth, and excellent high current behavior. The performance, economy, and application versatility provided by ZIP probes are further enhanced by the use of an external spring. Conventional spring probes rely on contact between the barrel and plunger, which allows for conductivity interference through contamination build up in dirty test environments. By having an external spring and no barrel, ZIP greatly reduces the threat of contamination, thereby reducing cost-of-test and increasing efficiency. ECT has produced flat compliant contacts since The ZIP series is the culmination of years of experience and development, and reflects the industry s finest semiconductor contacts. With its broad scope of application solutions and special options, the ZIP family of products can satisfy all of your semiconductor test needs. If your spring probes are leaving your tough, high volume challenges unmet, then you don t know ZIP. Bantam Series The Bantam probe is a high performance spring loaded compliant contact for applications requiring robust, short contact to support fine pitch and high bandwidth production needs. Unlike conventional spring probes, the Bantam has only one internal sliding / wiping contact surface, which provides consistent low resistance levels while maintaining a high level of Z-Axis compliance. CSP and SPL Series These probes are traditional but state of the art double ended probes ranging from 0.4mm to 1.27mm pitch. On the CSP Series probes we are able to offer a selection of different plating options to optimize contact challenges and maximize probe life. Various length options also provide drop-in replacement capability for most competitor probes. Mini-Mite Series The SCP or also called Mini-Mite probe features a unique single ended design, providing very low, consistent DC resistance. The uniform design allows all three product pitches to be used on the same test height. The single sliding contact cuts the failure mode in half and insures very repeatable results. shop. 105
2 Semiconductor Probe Ultra High Bandwith Z mm, 0.50 mm Z0-040 Z0-050 Ultra HIGH Bandwidth The Z0 Ultra High Bandwidth Series takes advantage of the ZIP scalable architecture to arrive at an ultra-compact design with 0.50 nh and 0.60 nh inductance tailor made for high frequency testing..008 (0.19).076 (1.94).018 (0.46).013 (0.33).010 (0.27).078 (1.98).018 (0.46).016 (0.41) Thickness.0027 (0.07) Thickness.0034 (0.09).010 (0.25).011 (0.28) Pitch:.016 (0.40) Recommended Travel:.018 (0.46) Full Travel:.020 (0.50) Test Height:.059 (1.51) Life*: 200,000 cycles Spring Force in oz. (grams) Pitch:.020 (0.50) Recommended Travel:.019 (0.48) Full Travel:.022 (0.56) Test Height:.059 (1.51) Life*: Spring Force in oz. (grams) Order Code Test Height Order Code Test Height Standard 0.66 (19) High (27) Standard 0.65 (18) High (31) Series Size Tip Style Spring Force Z0 050 RH 1 Z0 040 BH Current Rating DC: 2.5 amps Current Rating DC: 2.88 amps <90 mohms Average DC Probe Resistance** : <90 mohms 0.50 nh 0.60 nh pf 0.03 pf >30.0 GHz >40.0 GHz Plunger DUT: HyperCore Plunger DUT: HyperCore Tip Style - DUT Tip Style - DUT B L D R Y B L D R Y Tip Style - HIB Tip Style - HIB 106 shop.
3 High Bandwith Semiconductor Probe Z mm, 0.50 mm Z [3.31].007 [0.18].026 [0.67] Thickness.0028 [0.07].003 [0.07].013 [0.32] HIGH Bandwidth The Z High Bandwidth Series yields the highest and most stable bandwidth for its package size. The high performance provided by these contacts makes the Z series a perfect choice for the most demanding test applications. High Bandwidth probes are available in.4mm and.5mm pitches. The Z series is offered in two DUT-side plunger material choices: HyperCore for high volume production applications and BeCu for burn-in or low volume applications..014 [0.35] Pitch:.016 (0.40) Recommended Travel:.025 (0.64) Full Travel:.028 (0.71) Test Height:.105 (2.67) Life*: HyperCore DUT plunger: BeCu DUT plunger: 50,000 cycles Spring Force in oz. (grams): 1.20 (34) Current Rating DC: 2.0 amps Average DC Probe Resistance** : <85 mohms 1.07 nh 0.21 pf 30.0 GHz Plunger DUT: HyperCore, BeCu Gold plated Tip Style - DUT HyperCore B L D R Y Tip Style - DUT BeCu B L Tip Style - HIB Series Size DUT Tip Style Material HIB Tip Style Z 040 Y H shop. 107
4 Semiconductor Probe Ultra High Bandwith Z mm, 0.50 mm Z-050 HIGH Bandwidth The Z High Bandwidth Series yields the highest and most stable bandwidth for its package size. The high performance provided by these contacts makes the Z series a perfect choice for the most demanding test applications. High Bandwidth probes are available in.4mm and.5mm pitches. The Z series is offered in two DUT-side plunger material choices: HyperCore for high volume production applications and BeCu for burn-in or low volume applications..135 [3.44].010 [0.27].026 [0.66] Thickness.0034 [0.09].014 [0.36].003 [0.09].016 [0.41] Tip Style - DUT HyperCore B L D R Y Tip Style - DUT BeCu B L Tip Style - HIB Series Size DUT Tip Style Material HIB Tip Style Z 050 R Pitch:.020 (0.50) Recommended Travel:.025 (0.64) Full Travel:.030 (0.76) Test Height:.110 (2.79) Life*: HyperCore DUT plunger: BeCu DUT plunger: 50,000 cycles Spring Force in oz. (grams): 1.40 (40) Current Rating DC: 2.8 amps Average DC Probe Resistance** : <65 mohms 1.01 nh 0.20 pf 25.0 GHz Plunger DUT: HyperCore, BeCu Gold plated 108 shop.
![The Z series is offered in two DUT-side plunger material choices: HyperCore for high volume production applications and BeCu for burn-in or low volume applications..135 [3.44].010 [0.27].026 [0.](/docs-images/44/12627552/images/page_4.jpg "66] Thickness.0034 [0.09].014 [0.36].003 [0.09].016 [0.41] Tip Style - DUT HyperCore B L D R Y Tip Style - DUT BeCu B L Tip Style - HIB Series Size DUT Tip Style Material HIB Tip Style Z 050 R Pitch:.")
5 High Bandwith Semiconductor Probe Z mm, 0.50 mm Z [0.84].006 [0.16].004 [0.10].018 [0.46].044 [1.12].014 [0.35].022 [0.57].228 [5.80] High End Digital The Z-080YH is designed to meet the many challenges associated with testing High End Digital (HED) devices. The Z-080YH s 5.0mm test height provides a generous total compression window of 0.8mm. The probe also provides an insertion Ioss of -1dB (GSG). These factors combined make Z-080YH a perfect solution for HED applications. Low cost and high performance are hallmarks of ZIP probes. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance..015 [0.39] Pitch:.031 (0.80) Recommended Travel:.031 (0.80) Full Travel:.038 (0.97) Test Height:.197 (5.00) Life*: Spring Force in oz. (grams):.88 (25) Current Rating DC: 2.8 amps Average DC Probe Resistance** : <75 mohms 2.00 nh 0.36 pf 15.2 GHz Plunger DUT: HyperCore Tip Style - DUT HyperCore Y Tip Style - DUT BeCu shop. 109
6 Semiconductor Probe Kelvin Z - Kelvin 0.40 mm Z-040KH Z-040K Z-KELVIN ECT s ZIP Kelvin.4mm is ideal for voltage sensitive tests on array or peripheral devices requiring milliohm resistance measurements as well as high-power test applications (0.140).0262 (0.665).0028 (0.071).0262 (0.665).0055 (0.140).0028 (0.071).130 (3.30).130 (3.30).013 (0.33).013 (0.33).0074 (0.19).014 (0.35).0074 (0.19).014 (0.35) Peripheral Pitch:.016 (0.40) Recommended Travel:.025 (0.64) Full Travel:.028 (0.71) Test Height:.105 (2.67) Life*: Spring Force in oz. (grams): 1.20 (34) Pitch:.016 (0.40) Recommended Travel:.025 (0.64) Full Travel:.028 (0.71) Test Height:.105 (2.67) Life*: Spring Force in oz. (grams): 1.20 (34) Array Current Rating DC: Average DC Probe Resistance** : Plunger DUT: HyperCore 2.2 amps <70 mohms Tip Style - DUT K Tip Style - HIB 0.90 nh 0.03 pf 9.1 GHz Current Rating DC: 2.2 amps Average DC Probe Resistance** : <70 mohms 0.90 nh 0.03 pf 9.1 GHz Plunger DUT: BeCu with proprietary plating Tip Style - DUT K Tip Style - HIB 110 shop.
7 Bantam Semiconductor Probe BTM 0.50 mm, 0.75 mm, 1.00 mm BTM-050 BTM-075 BTM (0.508) (0.23).032 (0.81) (0.38) (0.508).040 (1.02).115 (2.93).073 (1.85).118 (3.00).066 (1.68).163 (4.14) (0.38) (0.23).020 (0.508) (0.56) (0.318).020 (0.51).099 (2.51) (0.762) (0.381).025 (0.64) Pitch:.019 (0.50) Recommended Travel:.015 (0.38) Full Travel:.020 (0.51) Test Height:.098 (2.49) Life*: Spring Force in oz. (grams): 1.10 (31) Pitch:.030 (0.75) Recommended Travel:.015 (0.38) Full Travel:.020 (0.51) Test Height:.103 (2.62) Life*: Spring Force in oz. (grams): 1.00 (28) Pitch:.040 (1.00) Recommended Travel:.028 (0.71) Full Travel:.030 (0.76) Test Height:.136 (3.45) Life*: Spring Force in oz. (grams): 1.40 (39) 2.4 amps <50 mohms 0.95 nh 0.28 pf GHz Plunger: BeCu, BeCu, Gold plated over hard Nickel Steel alloy, Gold plated over hard Nickel 2.9 amps <50 mohms 0.77 nh 0.25 pf GHz Plunger: BeCu, Brass, Gold plated over hard Nickel Music Wire, Gold plated over hard Nickel Tip Style - DUT Tip Style - DUT Tip Style - DUT B L U B L B L Tip Style - HIB Tip Style - HIB Tip Style - HIB B B B L 3.2 amps <50 mohms 1.30 nh 0.34 pf 9.73 GHz Plunger: BeCu, Brass, Gold plated over hard Nickel Steel alloy, Gold plated over hard Nickel shop. 111
8 Semiconductor Probe CSP CSP mm CSP (0.89) (0.13) Socket Design Considerations CSP series is captured between the socket body and retainer plate, with the barrel fixed in place. Mini-Mite series is captured between the socket body and retainer plate, with the barrel sliding freely counter bore. Counter bore should not be too deep, and enable a minimum amount of preload against interface board. Body height and device cavity should be designed to prevent probe from being compressed shorter than test height..177 (4.50).025 (0.64) (0.26).237 (6.02) (0.13) Pitch:.016 (0.40) Recommended Travel:.020 (0.51) Socket Body Full Travel:.025 (0.64) Test Height:.217 (5.51) Life*: cycles -55 C to +105 C Spring Force in oz. (grams): 0.85 (24) CSP Socket Retainer Mini-Mite Socket Tip Style - DUT / HIB B L 2.0 amps 1.71 nh 0.58 pf 6.8 GHz Plunger DUT: Steel or BeCu, Plunger HIB: Steel or BeCu, Gold plated over hard Nickel Phosphorous Bronze, Gold plated over hard Nickel Music Wire, Gold plated 112 shop.
9 CSP Semiconductor Probe CSP mm (0.23) (0.23).029 (0.74).029 (0.74) CSP5-18 CSP5-20 CSP (0.74) (0.23) (0.35) (0.35) (0.35).180 (4.57).234 (5.94).200 (5.08).254 (6.45).220 (5.59).274 (6.96).025 (0.64) (0.17).025 (0.64) (0.17).025 (0.64) (0.17) Pitch:.019 (0.50) Recommended Travel:.020 (0.51) Full Travel:.025 (0.64) Test Height:.214 (5.44) Life*: Spring Force in oz. (grams):.7 (19.8) Pitch:.019 (0.50) Recommended Travel:.020 (0.51) Full Travel:.025 (0.64) Test Height:.234 (5.94) Life*: Spring Force in oz. (grams):.7 (19.8) Pitch:.019 (0.50) Recommended Travel:.020 (0.51) Full Travel:.035 (0.89) Test Height:.254 (6.45) Life*: Spring Force in oz. (grams): 1.0 (28.4) 2 amps 1.5 nh 0.63 pf 8.13 GHz 2 amps 1.65 nh 0.69 pf 7.4 GHz Tip Style - DUT / HIB Tip Style - DUT / HIB Tip Style - DUT / HIB B L B L B L 2 amps 1.79 nh 0.75 pf 6.8 GHz shop. 113
10 Semiconductor Probe CSP CSP mm (0.36) (0.36) (0.36) CSP (1.52) CSP8-20 CSP (1.52).060 (1.52) (0.58) (0.58) (0.58).150 (3.81).242 (6.15).200 (5.08).292 (7.42).342 (8.69).250 (6.35).032 (0.81) (0.30).032 (0.81) (0.30) Pitch:.032 (0.80) Full Travel:.040 (1.02) Test Height:.212 (5.38) Life*: Spring Force in oz. (grams): 1.1 (31.2) Pitch:.032 (0.80) Full Travel:.040 (1.02) Test Height:.262 (6.65) Life*: Spring Force in oz. (grams): 1.1 (31.2) (0.30).032 (0.81) Pitch:.032 (0.80) Full Travel:.040 (1.02) Test Height:.312 (7.92) Life*: Spring Force in oz. (grams): 1.1 (31.2) 3 amps 1.23 nh 0.65 pf 9.23 GHz 3 amps 1.52 nh 0.81 pf 7.45 GHz Tip Style - DUT / HIB Tip Style - DUT / HIB Tip Style - DUT / HIB B L B L B L 3 amps 1.81 nh 0.96 pf 5.25 GHz 114 shop.
11 CSP Semiconductor Probe CSP mm CSP (0.53).035 (0.89) (0.76).350 (8.89).280 (7.11) (0.53).035 (0.89) Pitch:.039 (1.00) Full Travel:.040 (1.02) Test Height:.312 (7.92) Life*: Spring Force in oz. (grams): 1.1 (31.2) Tip Style - DUT / HIB B L 3 amps 1.81 nh 0.96 pf 5.25 GHz shop. 115
12 Semiconductor Probe Mini-Mite SCP 0.80 mm, 1.00 mm, 1.27 mm SCP-080 SCP-100 SCP (0.52).118 (3.00) (0.70).118 (3.00) (0.95).118 (3.00).153 (3.89).153 (3.89).153 (3.89).230 (5.84).230 (5.84).230 (5.84) (0.62) (0.80) (1.08) (0.25) (0.38) (0.38) Pitch:.032 (0.80) Full Travel:.035 (0.89) Test Height:.200 (5.08) Life*: 1,000,000 cycles Spring Force in oz. (grams): 1.20 (34) Pitch:.039 (1.00) Full Travel:.035 (0.89) Test Height:.200 (5.08) Life*: 1,000,000 cycles Spring Force in oz. (grams): 1.20 (34) Pitch:.050 (1.27) Full Travel:.035 (0.89) Test Height:.200 (5.08) Life*: 1,000,000 cycles Spring Force in oz. (grams): 1.20 (34) 5 amps 7 amps <50 mohms <50 mohms 1.27 nh 1.40 nh 0.12 pf 0.66 pf 6.0 GHz 6.78 GHz Plunger: BeCu, Plunger: BeCu, BeCu, BeCu, 9 amps <50 mohms 1.40 nh 0.79 pf 7.63 GHz Plunger: BeCu, BeCu, Tip Style - DUT Tip Style - DUT Tip Style - DUT B U Z B L Z Z Tip Style - HIB Tip Style - HIB Tip Style - HIB B B B 116 shop.
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